Electronic thermometer with flex circuit location
View Patent ↗A method of making a probe for an electronic thermometer includes positioning a flex circuit together with a probe shaft. Connecting a locating member to the probe shaft. The locating member comprises a resilient locator that is resiliently deformed by engagement with the flex circuit thereby to bias the flex circuit to a selected position. The biasing of the flex circuit by the resilient locator is independent of movement of the probe shaft.
1. A method of making a probe for an electronic thermometer comprising:
positioning a flex circuit together with a probe shaft;
connecting a locating member to the probe shaft, said locating member comprising a resilient locator; and
resiliently deforming the resilient locator by engagement with the flex circuit thereby to bias the flex circuit to a selected position, the biasing of the flex circuit by the resilient locator being independent of movement of the probe shaft.
2. A method as set forth in claim 1 wherein the probe shaft comprises a central longitudinal axis and wherein resiliently deforming the resilient locator includes biasing the flex circuit in a direction radially outward from the central longitudinal axis.
3. A method as set forth in claim 2 wherein connecting the locating member to the probe shaft comprises locating the resilient locator on the central longitudinal axis of the probe shaft.
4. A method as set forth in claim 1 further comprising connecting a separator to the probe shaft.
5. A method as set forth in claim 4 wherein resiliently deforming the resilient locator comprises biasing the flex circuit against an interior wall of the separator for achieving and maintaining contact with the separator.
6. A method as set forth in claim 1 further comprising bending arms of the flex circuit.
7. A method as set forth in claim 5 wherein resiliently deforming the resilient locator comprises bringing the resilient locator into contact with the bent arms of the flex circuit.