Data storage device evaluating frequency range of supply voltage to detect power failure
View Patent ↗A data storage device (DSD) is disclosed comprising a non-volatile memory (NVM), such as a disk or non-volatile semiconductor memory, and control circuitry for detecting a power failure condition. A frequency range of a supply voltage from a first frequency to a second frequency is extracted, wherein the first frequency is greater than ten hertz, the second frequency is higher than the first frequency, and the second frequency is less than one megahertz. The power failure condition is detected in response to the extracted frequency range of the supply voltage.
1. A data storage device (DSD) comprising:
a non-volatile memory (NVM); and
control circuitry operable to:
receive a supply voltage;
extract a frequency range of the supply voltage from a first frequency to a second frequency, wherein:
the first frequency is greater than ten hertz;
the second frequency is higher than the first frequency; and
the second frequency is less than one megahertz; and
detect a power failure condition in response to the extracted frequency range of the supply voltage.
2. The data storage device as recited in claim 1 , wherein:
the control circuitry comprises a first resistor/capacitor network and a second resistor/capacitor network; and
the first and second resistor/capacitor networks determine the frequency range.
3. The data storage device as recited in claim 2 , wherein the control circuitry further comprises a voltage divider for dividing the supply voltage.
4. The data storage device as recited in claim 2 , wherein the control circuitry further comprises a comparator for comparing a first voltage generated by the first resistor/capacitor network to a second voltage generated by the second resistor/capacitor network.
5. The data storage device as recited in claim 4 , wherein the power fail condition is detected when the first voltage exceeds the second voltage.
6. The data storage device as recited in claim 1 , wherein the control circuitry further comprises a direct current (DC) level detector for detecting the power failure condition in response to a substantially DC component of the supply voltage.
7. The data storage device as recited in claim 6 , wherein the DC level detector comprises:
a low pass filter for extracting a low frequency component of the supply voltage; and
a comparator for comparing the low frequency component to a threshold.
8. The data storage device as recited in claim 1 , wherein the NVM comprises a disk.
9. The data storage device as recited in claim 1 , wherein the NVM comprises a non-volatile semiconductor memory.
10. A method of operating a data storage device (DSD), the DSD comprising a non-volatile memory (NVM), the method comprising:
receiving a supply voltage;
extracting a frequency range of the supply voltage from a first frequency to a second frequency, wherein:
the first frequency is greater than ten hertz;
the second frequency is higher than the first frequency; and
the second frequency is less than one megahertz; and
detecting a power failure condition in response to the extracted frequency range of the supply voltage.
11. The method as recited in claim 10 , further comprising detecting the power failure condition by filtering the supply voltage with a first and second resistor/capacitor networks that determine the frequency range.
12. The method as recited in claim 11 , further comprising detecting the power failure condition by dividing the supply voltage.
13. The method as recited in claim 11 , further comprising comparing a first voltage generated by the first resistor/capacitor network to a second voltage generated by the second resistor/capacitor network.
14. The method as recited in claim 13 , further comprising detecting the power fail condition when the first voltage exceeds the second voltage.
15. The method as recited in claim 10 , further comprising detecting the power failure condition in response to a substantially DC component of the supply voltage.
16. The method as recited in claim 15 , further comprising detecting the power failure condition by:
extracting a low frequency component of the supply voltage; and
comparing the low frequency component to a threshold.
17. The method as recited in claim 10 , wherein the NVM comprises a disk.
18. The method as recited in claim 10 , wherein the NVM comprises a non-volatile semiconductor memory.
19. A power circuit operable to:
receive a supply voltage;
extract a frequency range of the supply voltage from a first frequency to a second frequency, wherein:
the first frequency is greater than ten hertz;
the second frequency is higher than the first frequency; and
the second frequency is less than one megahertz; and
detect a power failure condition in response to the extracted frequency range of the supply voltage.
20. The power circuit as recited in claim 19 , wherein:
the power circuit comprises a first resistor/capacitor network and a second resistor/capacitor network; and
the first and second resistor/capacitor networks determine the frequency range.
21. The power circuit as recited in claim 20 , further comprising a voltage divider for dividing the supply voltage.
22. The power circuit as recited in claim 20 , further comprising a comparator for comparing a first voltage generated by the first resistor/capacitor network to a second voltage generated by the second resistor/capacitor network.
23. The power circuit as recited in claim 22 , wherein the power fail condition is detected when the first voltage exceeds the second voltage.
24. The power circuit as recited in claim 19 , further comprising a direct current (DC) level detector for detecting the power failure condition in response to a substantially DC component of the supply voltage.
25. The power circuit as recited in claim 24 , wherein the DC level detector comprises:
a low pass filter for extracting a low frequency component of the supply voltage; and
a comparator for comparing the low frequency component to a threshold.