System and method for inspection of electrical circuits

1. A system for inspection of electrical circuits comprising:

a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein;

a modulator having a calibration mode and a defect detection mode and being operative in said defect detection mode when a desired time varying voltage is being applied to the electrical circuit being inspected; and

a defect detection subsystem, employing an output of said calibration subsystem,

said calibration subsystem being operative to apply a voltage to plural locations of said electrical circuit being inspected during calibration operation thereof.

2. A system for inspection of electrical circuits according to claim 1 and wherein said defect detection subsystem includes a camera and is operative to sense light intensity at different locations on said modulator corresponding to said various different locations in the electrical circuit being inspected.

3. A system for inspection of electrical circuits according to claim 2 and wherein said calibration subsystem is operative to establish a relationship between voltage outputs of said camera and sensed light intensity at said different locations on said modulator.

4. A system for inspection of electrical circuits according to claim 1 and wherein said calibration subsystem is operative to provide an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on the modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

5. A system for inspection of electrical circuits comprising:

a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein;

a modulator having a calibration mode and a defect detection mode and being operative in said defect detection mode when a desired time varying voltage is being applied to the electrical circuit being inspected; and

a defect detection subsystem, employing an output of said calibration subsystem,

said defect detection subsystem including a camera and being operative to sense light intensity at different locations on said modulator corresponding to said various different locations in the electrical circuit being inspected.

6. A system for inspection of electrical circuits according to claim 5 and wherein said calibration subsystem is operative to establish a relationship between voltage outputs of said camera and sensed light intensity at said different locations on said modulator.

7. A system for inspection of electrical circuits according to claim 5 and wherein said calibration subsystem is operative to provide an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on the modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

8. A system for inspection of electrical circuits comprising:

a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein;

a modulator having a calibration mode and a defect detection mode and being operative in said defect detection mode when a desired time varying voltage is being applied to the electrical circuit being inspected; and

a defect detection subsystem, employing an output of said calibration subsystem,

said calibration subsystem being operative to provide an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on the modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

9. A system for inspection of electrical circuits comprising:

a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein;

said calibration subsystem being operative to apply a voltage to plural locations of said electrical circuit being inspected during calibration operation thereof, and said calibration subsystem being operative to provide an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on a modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

10. A method for inspection of electrical circuits, the method comprising:

a calibration step including:

applying a time varying voltage to an electrical circuit being inspected; and

applying a voltage to plural locations of said electrical circuit being inspected; and

an inspection step including:

sensing differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein: and

said inspection step also comprises sensing light intensity at different locations on a modulator, said different locations corresponding to said various different locations in the electrical circuit being inspected.

11. A method for inspection of electrical circuits according to claim 10 , and wherein said inspection step also comprises applying a desired time varying voltage to the electrical circuit being inspected.

12. A method for inspection of electrical circuits according to claim 10 and wherein said calibration step comprises establishing a relationship between voltage outputs of a camera and sensed light intensity at said different locations on said modulator.

13. A method for inspection of electrical circuits according to claim 10 and wherein said calibration step comprises providing an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on the modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

14. A method for inspection of electrical circuits, the method comprising:

a calibration step including applying a time varying voltage to an electrical circuit being inspected; and

an inspection step including:

sensing differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein;

applying a desired time varying voltage to the electrical circuit being inspected; and

sensing light intensity at different locations on a modulator, said different locations corresponding to said various different locations in the electrical circuit being inspected.

15. A method for inspection of electrical circuits according to claim 14 and wherein said calibration step comprises establishing a relationship between voltage outputs of a camera and sensed light intensity at said different locations on said modulator.

16. A method for inspection of electrical circuits according to claim 14 and wherein said calibration step comprises providing an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on the modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.

17. A method for inspection of electrical circuits, the method comprising:

a calibration step including:

applying a time varying voltage to an electrical circuit being inspected; and

providing an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on a modulator, said different locations on a modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator; and

an inspection step including:

sensing differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein; and

applying a desired time varying voltage to the electrical circuit being inspected.

18. A method for inspection of electrical circuits, the method comprising:

a calibration step including:

applying a time varying voltage to an electrical circuit being inspected; and

applying a voltage to plural locations of said electrical circuit being inspected; and

an inspection step including:

sensing differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein; and

providing an indication of location of defects at said different locations on said electrical circuit to be inspected by sensing the light intensities at different locations on a modulator, said different location on a modulator corresponding to said different locations on said electrical circuit when said voltage is applied thereto and by comparing the sensed light intensity at said different locations on said modulator.