IP Library Granted Patent US 9,013,195
Granted Patent B2
US 9,013,195 · App. 13/191,708 · Granted Apr 21, 2015

Mutual capacitance sensing circuits, methods and systems

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,013,195
App. No.
13/191,708
Granted
Apr 21, 2015
Kind
B2
Abstract

A capacitance sensing system may include a first selection circuit that couples N electrodes of a first electrode set to a capacitance sense circuit; and a second selection circuit that couples M electrodes of a second electrode set, substantially simultaneously, to a signal generator circuit as a group to induce current in the N electrodes by mutual capacitance between the M and N electrodes; wherein N is at least one, and M>N.

Claims (31)

1. A capacitance sensing system, comprising:

a first selection circuit that couples N electrodes of a first electrode set to a capacitance sense circuit, wherein the first selection circuit couples the N electrodes to the capacitance sense circuit in a first sense portion of a sensing operation, and further couples L electrodes of the first electrode set to a signal generator circuit in a second sense portion of the sensing operation; and

a second selection circuit that couples M electrodes of a second electrode set, substantially simultaneously, to the signal generator circuit as a group to induce current in the N electrodes by mutual capacitance between the M and N electrodes; wherein N is at least one, and M>N, wherein the second selection circuit couples the M electrodes of the second electrode to the signal generator circuit in the first sense portion, and further couples K electrodes of the second electrode set to the capacitance sense circuit in the second sense portion, and wherein K is at least one, and L>K.

2. The capacitance sensing system of claim 1 , wherein:

N is one and M is all electrodes of the second set.

3. The capacitance sensing system of claim 1 , wherein:

the first selection circuit sequentially couples different groups of N electrodes of the first electrode set to the capacitance sense circuit while the second selection circuit couples the M electrodes to the signal generator circuit.

4. The capacitance sensing system of claim 1 , wherein:

K is one and L is all electrodes of the first set.

5. The capacitance sensing system of claim 1 , wherein:

the first set of electrodes are disposed substantially parallel to one another in a first direction; and

the second set of electrodes is disposed substantially parallel to one another in a second direction different from the first direction.

6. The capacitance sensing system of claim 1 , wherein:

the sense circuit includes a current sense circuit that generates a read current that varies according to a sensed capacitance, and an ADC that converts the read current into a digital value.

7. A method, comprising:

in a first sense portion of a sensing operation,

coupling a subset of N electrodes of a first electrode set to a capacitance sense circuit, and

coupling a subset of M electrodes of a second electrode set, substantially simultaneously, to a signal generator circuit as a group to induce current in the N electrodes by mutual capacitance between the M and N electrodes;

in a second sense portion of the sensing operation,

coupling L electrodes of the first electrode set to the signal generator circuit, and

coupling K electrodes of the second electrode set to the capacitance sense circuit in the second sense portion, and wherein K is at least one, and L >K, wherein N is at least one, and M >N; and

generating first object position data by detecting change in mutual capacitance between the N electrodes and the M electrodes by sensing electrical changes induced in the N electrodes in response to electrical signals driven on the M electrodes substantially simultaneously.

8. The method of claim 7 , further including:

generating second object position data by detecting change in mutual capacitance between subsets of second electrodes and a larger group of first electrodes.

9. The method of claim 7 , wherein:

generating first object position data includes sequentially measuring mutual capacitance between each first electrode and all second electrodes.

10. The method of claim 7 , wherein driving at least one first set of the second electrodes with a first time varying signal while driving a second group of the second electrodes with a second time varying signal that is different than the first periodic signal.

11. The method of claim 10 , wherein:

detecting change in mutual capacitance further includes converting induced current into a digital value.

12. The method of claim 7 , further including:

generating calibration values for multiple subsets of first electrodes by measuring a mutual capacitance between each of the multiple subsets of first electrodes and larger group of second electrodes while an object is not within a predetermined proximity of the electrodes.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION
To: PARADE TECHNOLOGIES, LTD.
Reel/Frame 036508/0284 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS AND TRADEMARKS Recorded Aug 4, 2015
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT FOR THE SECURED PARTIES
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036264/0114 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2015
From: MAHARYTA, ANDRIY; PRENDERGAST, PATRICK; KREMIN, VICTOR
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 035189/0971 →
PATENT SECURITY AGREEMENT Recorded Aug 28, 2012
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 028863/0870 →