IP Library Granted Patent US 8,321,597
Granted Patent B2
US 8,321,597 · App. 13/197,721 · Granted Nov 27, 2012

Flash-memory device with RAID-type controller

Assignee: Super Talent Electronics, Inc.
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Quick Facts
Patent No.
US 8,321,597
App. No.
13/197,721
Granted
Nov 27, 2012
Kind
B2
Abstract

A smart flash drive has one or more levels of smart storage switches and a lower level of single-chip flash devices (SCFD's). A SCFD contains flash memory and controllers that perform low-level bad-block mapping and wear-leveling and logical-to-physical block mapping. The SCFD report their capacity, arrangement, and maximum wear-level count (WLC) and bad block number (BBN) to the upstream smart storage switch, which stores this information in a structure register. The smart storage switch selects the SCFD with the maximum BBN as the target and the SCFD with the lowest maximum WLC as the source of a swap for wear leveling when a WLC exceeds a threshold that rises over time. A top-level smart storage switch receives consolidated capacity, arrangement, WLC, and BBN information from lower-level smart storage switch. Data is striped and optionally scrambled by Redundant Array of Individual Disks (RAID) controllers in all levels of smart storage switches.

Claims (11)

1. A Smart Storage Switch flash device comprising:

a smart storage switch connected upstream to an upstream device and downstream to a plurality of endpoint flash memories;

a flash memory which comprises a plurality of multiple Input/Outputs (I/Os) and a plurality of chip enables;

wherein the smart storage switch comprises:

downstream means for connecting to a plurality of downstream flash memories;

upstream means for connecting to an upstream device;

controller means for dividing upstream data received from the upstream device into a plurality of stripes, each stripe being sent to a different downstream flash memory;

structure register means for storing wear-level counts and bad-block counts of downstream flash memories;

upstream reporting means for reporting a maximum of the wear-level counts to the upstream device and for reporting a maximum of the bad-block counts to the upstream device; and

wear leveling means for using a direct-memory access (DMA) engine to swap physical blocks of two downstream flash memory blocks in two different ones of the downstream flash memories selected using the wear-level counts and bad-block counts stored in the structure register means.

2. The Smart Storage Switch flash device of claim 1 further comprising an upstream interface having a protocol selected from the group consisting of Serial AT-Attachment (SATA), a Peripheral Components Interconnect Express (PCIe) bus, Compact Flash (CF) bus, Universal-Serial-Bus (USB), Secure Digital (SD), e-Multi-Media Card (eMMC) bus, Serial-Attached Small-computer system interface (SAS), and Micro-SD.

Assignments (2)
CHANGE OF NAME Recorded Mar 24, 2014
From: SUPER TALENT ELECTRONIC, INC.
To: SUPER TALENT TECHNOLOGY, CORP.
Reel/Frame 032513/0502 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2011
From: YU, FRANK; MA, ABRAHAM C.; CHEN, SHIMON
To: SUPER TALENT ELECTRONICS, INC.
Reel/Frame 027004/0463 →
Continuity (10)
Continuation In Part 12950533 · Nov 19, 2010
Continuation In Part 12128916 · May 29, 2008
Continuation In Part 12252155 · Oct 15, 2008
Continuation In Part 12418550 · Apr 3, 2009
Continuation In Part 12475457 · May 29, 2009
Continuation In Part 12576216 · Oct 8, 2009
Continuation In Part 11924448 · Oct 25, 2007
Continuation In Part 11677658 · Feb 22, 2007
Continuation In Part 12186471 · Aug 5, 2008
Related Publication 20110302358A1 · Dec 8, 2011