Microstructured device with embossed layer
A security device has a support substrate of a first material having a softening temperature t1 and an embossed layer of a second different material supported by the support substrate having a softening temperature t2, wherein t2<t1. A thin film coating deposited directly upon the embossed layer, wherein the embossed layer is capable of being dissolved in a dissolving agent and wherein the thin film coating is not dissolvable by said dissolving agent. There is not need for an additional release layer as the second different material is dissolvable and allows flakes to be formed by dissolving the second layer.
1. A multilayer device comprising:
a substrate layer comprising a first material having a first softening temperature;
an embossed layer comprising a second material having a second softening temperature,
the second softening temperature being less than the first softening temperature,
the second softening temperature being at least 10 degrees Celsius less than the first softening temperature, and
a glass transition temperature of the embossed layer being between 70 and 200 degrees Celsius; and
a thin film coating that is deposited directly upon the embossed layer,
the thin film coating comprising a first absorber layer, a second absorber layer, and a dielectric layer,
the dielectric layer being between the first absorber layer and the second absorber layer, and
the embossed layer being capable of being completely dissolved in a dissolving agent while the thin film coating is not dissolvable by the dissolving agent.
2. The multilayer device of claim 1 , wherein regions of the embossed layer are at least 500 nm thick.
3. The multilayer device of claim 1 , wherein the first material is a polymeric foil.
4. The multilayer device of claim 1 , wherein the thin film coating has a plurality of dielectric layers that include the dielectric layer.
5. The multilayer device of claim 1 , wherein the thin film coating is a color shifting coating.
6. The multilayer device of claim 1 , wherein the embossed layer comprises a plurality of structures that define edges or frames which facilitate breakage for forming flakes.
7. The multilayer device of claim 1 , wherein the embossed layer is in contact with the substrate layer.
8. The multilayer device of claim 1 , wherein the embossed layer comprises holograms.
9. The multilayer device of claim 1 , wherein the embossed layer provides a microstructure having a depth of approximately 400 nm.
10. The multilayer device of claim 1 , wherein the thin film coating further comprises a reflector layer.
11. The multilayer device of claim 10 , wherein the reflector layer is between the first absorber layer and the second absorber layer.
12. A device comprising:
a first layer comprising a first material having a first softening temperature;
a second layer comprising a second material having a second softening temperature,
the second softening temperature being less than the first softening temperature,
the second softening temperature being at least 10 degrees Celsius less than the first softening temperature,
a glass transition temperature of the second layer being between 70 and 200 degrees Celsius, and the second layer being an embossed layer of having a microstructure; and
a thin film coating that is deposited directly upon the second layer,
the second layer being capable of being completely dissolved in a dissolving agent while the thin film coating is not dissolvable by the dissolving agent.
13. The device of claim 12 , wherein the thin film coating is released from the second layer that is dissolved.
14. The device of claim 13 , wherein the thin film coating comprises a plurality of dielectric layers.
15. The device of claim 12 , wherein the second layer comprises a thickness between 500 nm and 1500 nm.
16. The device of claim 12 , wherein the second layer is embossed using a temperature between 280-320 degrees Fahrenheit.
17. The device of claim 12 ,
wherein the second layer is applied directly over the first layer without any additional layer between the second layer and the first layer,
wherein the first layer is a substrate layer, and
wherein the second layer is the embossed layer.
18. The device of claim 12 , wherein the second layer has the microstructure, and wherein the microstructure has a depth of approximately 400 nm.
19. The device of claim 12 , wherein the thin film coating comprises a first absorber layer, a second absorber layer, a reflector layer, and a dielectric layer.
20. The device of claim 19 , wherein the reflector layer is between the first absorber layer and the second absorber layer.