IP Library Patent Application 13220061
Patent Application
App. No. 13/220,061

PHOTOVOLTAIC DEVICE INTERCONNECT

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Patent No.
US None
App. No.
13/220,061
Abstract

Scribing and deposition processes can be used to interconnect cells within photovoltaic modules.

Claims (57)

1 . A method for manufacturing a photovoltaic module, the method comprising:

forming a transparent conductive oxide layer adjacent to a substrate layer;

forming a first semiconductor layer adjacent to the transparent conductive oxide layer;

forming a second semiconductor layer adjacent to the first semiconductor layer; and

forming a sacrificial layer adjacent to the second semiconductor layer.

2 . The method of claim 1 , further comprising:

scribing a first trench extending from the sacrificial layer to the substrate layer.

3 . The method of claim 2 , further comprising:

depositing an insulating material in the first trench, wherein the insulating material extends from the substrate layer beyond the transparent conductive oxide layer.

4 . The method of claim 3 , further comprising:

scribing a second trench extending from the sacrificial layer to the transparent conductive oxide layer.

5 . The method of claim 4 , further comprising:

depositing a first conductive material in the second trench, wherein the first conductive material extends from the transparent conductive oxide layer toward the sacrificial layer.

6 . The method of claim 5 , further comprising:

removing the sacrificial layer thereby exposing the second semiconductor layer.

7 . The method of claim 6 , further comprising:

forming a back contact layer adjacent to the second semiconductor layer, wherein the back contact layer comprises a second conductive material.

8 . The method of claim 7 , further comprising:

scribing a third trench extending from the back contact layer to the second semiconductor layer.

9 . The method of claim 4 , further comprising:

removing the sacrificial layer thereby exposing the second semiconductor layer.

10 . The method of claim 9 , further comprising:

forming a lower conductive layer adjacent to the second semiconductor layer, wherein the lower conductive layer comprises a second conductive material.

11 . The method of claim 10 , further comprising:

forming an upper conductive layer adjacent to the lower conductive layer, wherein the upper conductive layer fills the second trench and comprises a first conductive material.

12 . The method of claim 1 , wherein the sacrificial layer comprises a material selected from the group consisting of aluminum, zinc, cadmium, cadmium oxide, tellurium oxide, and cadmium telluride.

13 . The method of claim 1 , wherein the transparent conductive oxide layer comprises a material selected from the group consisting of tin oxide and cadmium stannate.

14 . The method of claim 1 , wherein the first semiconductor layer comprises cadmium sulfide.

15 . The method of claim 1 , wherein the second semiconductor comprises a material selected from the group consisting of cadmium telluride and copper indium gallium (di)selenide.

16 . The method of claim 5 or 11 , wherein the first conductive material comprises a material selected from the group consisting of molybdenum nitride, copper, aluminum, and chromium.

17 . The method of claim 7 or 10 , wherein the second conductive material comprises a material selected from a group consisting of molybdenum nitride, copper, aluminum, and chromium.

18 . A multilayer structure comprising:

a transparent conductive oxide layer adjacent to a substrate layer;

a first semiconductor layer adjacent to the transparent conductive oxide layer;

a second semiconductor layer adjacent to the first semiconductor layer; and

a sacrificial layer adjacent to the second semiconductor layer.

19 . The multilayer structure of claim 18 , wherein the sacrificial layer comprises a material selected from the group consisting of aluminum, zinc, cadmium, cadmium oxide, tellurium oxide, and cadmium telluride.

20 . The multilayer structure of claim 18 , wherein the transparent conductive oxide layer comprises a material selected from the group consisting of tin oxide and cadmium stannate.

21 . The multilayer structure of claim 18 , wherein the first semiconductor layer comprises cadmium sulfide.

22 . The multilayer structure of claim 18 , wherein the second semiconductor comprises a material selected from the group consisting of cadmium telluride and copper indium gallium (di)selenide.

23 . A photovoltaic module comprising

a transparent conductive oxide layer adjacent to a substrate layer;

a first semiconductor layer adjacent to the transparent conductive oxide layer;

a second semiconductor layer adjacent to the first semiconductor layer;

a back contact layer adjacent to the second semiconductor layer, wherein the back contact layer comprises a second conductive material; and

a trench extending from the transparent conductive oxide layer to the back contact layer, wherein the trench is filled with a first conductive material.

24 . The photovoltaic module of claim 23 , wherein the first conductive material comprises a material selected from the group consisting of molybdenum nitride, copper, aluminum, and chromium.

25 . The photovoltaic module of claim 23 , wherein the second conductive material comprises a material selected from a group consisting of molybdenum nitride, copper, aluminum, and chromium.

26 . A photovoltaic module comprising

a transparent conductive oxide layer adjacent to a substrate layer;

a first semiconductor layer adjacent to the transparent conductive oxide layer;

a second semiconductor layer adjacent to the first semiconductor layer;

a lower conductive layer adjacent to the second semiconductor layer, wherein the lower conductive layer comprises a second conductive material;

an upper conductive layer adjacent to the lower conductive layer, wherein the upper conductive layer comprises a first conductive material; and

a trench extending from the transparent conductive oxide layer to the upper conductive layer, wherein the trench is filled with a first conductive material.

27 . The photovoltaic module of claim 26 , wherein the first conductive material comprises a material selected from the group consisting of molybdenum nitride, copper, aluminum, and chromium.

28 . The photovoltaic module of claim 26 , wherein the second conductive material comprises a material selected from a group consisting of molybdenum nitride, copper, aluminum, and chromium.

Assignments (3)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 15, 2021
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 058132/0261 →
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT APPLICATION 13/895113 ERRONEOUSLY ASSIGNED BY FIRST SOLAR, INC. TO JPMORGAN CHASE BANK, N.A. ON JULY 19, 2013 PREVIOUSLY RECORDED ON REEL 030832 FRAME 0088. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT PATENT APPLICATION TO BE ASSIGNED IS 13/633664. Recorded Sep 19, 2014
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 033779/0081 →
SECURITY AGREEMENT Recorded Jul 19, 2013
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 030832/0088 →