IP Library Granted Patent US 8,270,779
Granted Patent B2
US 8,270,779 · App. 13/230,962 · Granted Sep 18, 2012

Multithickness layered electronic-photonic devices

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Quick Facts
Patent No.
US 8,270,779
App. No.
13/230,962
Granted
Sep 18, 2012
Kind
B2
Abstract

An apparatus comprising an electronic-photonic device. The device includes a planar substrate having a top layer on a middle layer, active electronic components and active photonic waveguide components. The active electronic components are located on first lateral regions of the top layer, and the active photonic waveguide components are located on second lateral regions of the top layer. The second-region thickness is greater than the first-region thickness. The top layer has a higher refractive index than the middle layer.

Claims (64)

1. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein one or more of said active electronic components include said top layer as a structural component.

2. The method of claim 1 , wherein said substrate includes a silicon-on-insulator substrate, and, said top layer is a silicon layer located on said middle layer that is a silicon oxide layer.

3. The method of claim 1 , wherein forming said active electronic components includes forming MOS transistors, wherein carrier structures of said transistors are located in said first lateral region.

4. The method of claim 1 , wherein forming said active photonic waveguide components includes forming light-guiding structures in said second lateral region.

5. The method of claim 1 , wherein said electronic-photonic device is part of a telecommunication transceiver in said apparatus configured as a telecommunications system.

6. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said substrate includes a silicon-on-insulator substrate, and, said top layer is a silicon layer located on said middle layer that is a silicon oxide layer, and wherein forming said first lateral regions and said second lateral regions includes:

covering said first lateral region with a material layer;

selectively growing a silicon layer on said second lateral region; and

removing said material layer.

7. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said substrate includes a silicon-on-insulator substrate, and, said top layer is a silicon layer located on said middle layer that is a silicon oxide layer, and wherein forming said first lateral regions and said second lateral regions includes:

selectively implanting oxygen atoms into said first lateral region of said top silicon layer; and

thermally annealing said top silicon layer to form an implanted silicon oxide region in said top silicon layer.

8. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said substrate includes a silicon-on-insulator substrate, and, said top layer is a silicon layer located on said middle layer that is a silicon oxide layer, and wherein forming said first lateral regions and said second lateral regions includes:

forming oxygen barrier layers to cover said top silicon layer corresponding to said second lateral regions;

oxidizing an uncovered portion of said top silicon layer corresponding to said first lateral regions to form silicon oxide layers; and

removing said barrier layer and said silicon oxide layer.

9. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said at least some of said active electronic components are electrically coupled to at least some of said active photonic waveguide components.

10. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said substrate includes a silicon-on-insulator substrate, and, said top layer is a silicon layer located on said middle layer that is a silicon oxide layer, and wherein forming said first lateral regions and said second lateral regions includes:

oxidizing an uppermost portion of said top silicon layer in both of said first lateral regions and said second lateral regions to form a first silicon oxide layer on said silicon layer;

removing said first silicon oxide layer located directly over said first lateral regions to expose portions of said top silicon layer there-under;

oxidizing a topmost part of said exposed portions to form a second silicon oxide layer; and

removing said first and second silicon oxide layers.

11. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and wherein said top layer includes one or more of a well region, source region, drain region or channel region of said active electronic components.

12. A method for manufacturing an apparatus, comprising:

fabricating an electronic-photonic device, including:

providing a planar substrate having a top layer on a middle layer, wherein said top layer has a higher refractive index than said middle layer;

forming first lateral regions and second lateral regions from said top layer such that a first-region thickness of said first lateral regions is less than a second region-thickness of said second lateral regions;

forming active electronic components on said first lateral regions; and

forming active photonic waveguide components on said second lateral regions, and further including a transition region between said first-region thickness and said second-region thickness, wherein said transition region has a gradual increase in thickness from said first lateral region to said second lateral region.

Assignments (11)
PATENT SECURITY AGREEMENT Recorded Aug 6, 2024
From: RPX CORPORATION; RPX CLEARINGHOUSE LLC
To: BARINGS FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 068328/0674 →
RELEASE OF LIEN ON PATENTS Recorded Aug 5, 2024
From: BARINGS FINANCE LLC
To: RPX CORPORATION
Reel/Frame 068328/0278 →
PATENT SECURITY AGREEMENT Recorded Apr 22, 2023
From: RPX CORPORATION
To: BARINGS FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 063429/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2021
From: PROVENANCE ASSET GROUP LLC
To: RPX CORPORATION
Reel/Frame 059352/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: CORTLAND CAPITAL MARKETS SERVICES LLC
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058983/0104 →
RELEASE OF SECURITY INTEREST Recorded Nov 30, 2021
From: NOKIA US HOLDINGS INC.
To: PROVENANCE ASSET GROUP HOLDINGS LLC; PROVENANCE ASSET GROUP LLC
Reel/Frame 058363/0723 →
ASSIGNMENT AND ASSUMPTION AGREEMENT Recorded Feb 14, 2019
From: NOKIA USA INC.
To: NOKIA US HOLDINGS INC.
Reel/Frame 048370/0682 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2017
From: NOKIA TECHNOLOGIES OY; NOKIA SOLUTIONS AND NETWORKS BV; ALCATEL LUCENT SAS
To: PROVENANCE ASSET GROUP LLC
Reel/Frame 043877/0001 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP LLC
To: NOKIA USA INC.
Reel/Frame 043879/0001 →
SECURITY INTEREST Recorded Sep 13, 2017
From: PROVENANCE ASSET GROUP HOLDINGS, LLC; PROVENANCE ASSET GROUP, LLC
To: CORTLAND CAPITAL MARKET SERVICES, LLC
Reel/Frame 043967/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2012
From: ALCATEL-LUCENT USA INC.
To: ALCATEL LUCENT
Reel/Frame 028573/0432 →