IP Library Granted Patent US 8,624,265
Granted Patent B2
US 8,624,265 · App. 13/234,943 · Granted Jan 7, 2014

Semiconductor element

Inventor: Wataru Saito (Kanagawa-ken, JP)
Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 8,624,265
App. No.
13/234,943
Granted
Jan 7, 2014
Kind
B2
Abstract

According to one embodiment, the semiconductor element includes a semi-insulating substrate which has a first first-conductivity-type layer. The semiconductor element includes a first semiconductor layer. The first semiconductor layer contains non-doped Al X Ga 1-X N (0≦X<1). The semiconductor element includes a second semiconductor layer. The second semiconductor layer contains non-doped or second-conductivity-type Al Y Ga 1-Y N (0<Y≦1 and X<Y)). The semiconductor element includes a first major electrode and a second major electrode. The semiconductor element includes a control electrode provided on the second semiconductor layer between the major electrodes. And the first first-conductivity-type layer is provided under the control electrode.

Claims (20)

1. A semiconductor element, comprising:

a semi-insulating substrate;

a first first-conductivity-type layer of a first conductivity type provided selectively on a surface of the semi-insulating substrate;

a first semiconductor layer provided on the semi-insulating substrate and the first first-conductivity-type layer, the first semiconductor layer containing Al x Ga 1-x N (0≦X<1);

a second semiconductor layer provided on the first semiconductor layer, the second semiconductor layer containing Al y Ga 1-y N (0<Y≦1 and X<Y)) that is not of the first conductivity type;

a first major electrode connected to the second semiconductor layer;

a second major electrode connected to the second semiconductor layer; and

a control electrode provided on the second semiconductor layer between the first major electrode and the second major electrode,

the first first-conductivity-type layer being disposed under the control electrode such that a side edge of the first first-conductivity-type layer and a side of the control electrode that is facing the second major electrode are substantially aligned in a vertical direction.

2. The element according to claim 1 , wherein the first first-conductivity-type layer is electrically connected to the first major electrode.

3. The element according to claim 1 , further comprising:

a first insulating film provided on a first portion of a surface of the second semiconductor layer that is between the control electrode and the first major electrode and a second portion of the surface that is between the control electrode and the second major electrode; and

a first field plate electrode provided on the first insulating film, wherein

the first field plate electrode is connected to the control electrode.

4. The element according to claim 3 , further comprising:

a second insulating film covering the first field plate electrode; and

a second field plate electrode provided on the second insulating film, wherein

the second field plate electrode is connected to the first major electrode.

5. The element according to claim 1 , further comprising a gate insulating film provided between the second semiconductor layer and the control electrode.

6. The element according to claim 1 , wherein the semi-insulating substrate is made of silicon carbide.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2011
From: SAITO, WATARU
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 026922/0175 →
Priority Claims (1)
JP 2011-014279 · Jan 26, 2011 · national
Continuity (1)
Related Publication 20120187451A1 · Jul 26, 2012