IP Library Granted Patent US 8,531,234
Granted Patent B2
US 8,531,234 · App. 13/236,043 · Granted Sep 10, 2013

Temperature detection device

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Quick Facts
Patent No.
US 8,531,234
App. No.
13/236,043
Granted
Sep 10, 2013
Kind
B2
Abstract

Provided is a temperature detection device capable of attaining low current consumption at no expense of detection speed at around a temperature to be detected. The temperature detection device includes a control circuit for outputting a control signal for controlling ON/OFF of such internal circuits as a reference voltage circuit and a comparator. In the control circuit, in order to increase the detection speed at around the temperature to be detected, an oscillation frequency of an oscillation circuit has positive temperature characteristics. Further, the control circuit includes a waveform shaping circuit so as to optimize the waveform of the control signal for controlling ON of the internal circuits, to thereby attain low current consumption.

Claims (28)

1. A temperature detection device for detecting temperature, comprising:

internal circuits including a temperature sensor for outputting a voltage corresponding to temperature, and a comparator for comparing and determining a magnitude relation between an output voltage of the temperature sensor and a reference voltage;

a control circuit; and

a sample and hold circuit connected to an output of the comparator,

wherein the control circuit outputs a control signal for controlling ON/OFF of the internal circuits based on the temperature such that a frequency of the control signal increases as the temperature approaches a predetermined temperature, and

wherein the sample and hold circuit is configured to hold and output a last output of the comparator output during an ON state of the internal circuits during at least part of an OFF state of the internal circuits.

2. A temperature detection device according to claim 1 , wherein:

the control circuit comprises an oscillation circuit for generating the control signal; and

the oscillation circuit has a frequency having positive temperature characteristics.

3. A temperature detection device according to claim 2 , wherein:

the oscillation circuit comprises a current source and a capacitor to be charged by the current source; and

the current source has positive temperature characteristics.

4. A temperature detection device according to claim 3 , wherein the current source comprises:

a reference voltage circuit;

a resistor having negative temperature characteristics;

an error amplification circuit for receiving a voltage of the reference voltage circuit and a voltage across the resistor as inputs; and

a transistor for allowing a current corresponding to an output of the error amplification circuit to flow.

5. A temperature detection device according to claim 1 , wherein:

the control circuit comprises an oscillation circuit for generating the control signal; and

the oscillation circuit has a frequency having negative temperature characteristics.

6. A temperature detection device according to claim 5 , wherein:

the oscillation circuit comprises a current source and a capacitor to be charged by the current source; and

the current source has negative temperature characteristics.

7. A temperature detection device according to claim 6 , wherein the current source comprises:

a reference voltage circuit;

a resistor having positive temperature characteristics;

an error amplification circuit for receiving a voltage of the reference voltage circuit and a voltage across the resistor as inputs; and

a transistor for allowing a current corresponding to an output of the error amplification circuit to flow.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2011
From: SUGIURA, MASAKAZU; IGARASHI, ATSUSHI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 026929/0266 →