IP Library Patent Application 13240082
Patent Application
App. No. 13/240,082

CdZnO OR SnZnO BUFFER LAYER FOR SOLAR CELL

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Quick Facts
Patent No.
US None
App. No.
13/240,082
Abstract

A structure for use in a photovoltaic device is disclosed, the structure includes a substrate, a buffer material, a barrier material in contact with the substrate; and a transparent conductive oxide between the buffer material and the barrier material. The buffer material comprises at least one of CdZnO and SnZnO. The structure can be included in a photovoltaic device. Methods for forming the structure are also disclosed.

Claims (47)

1 . A structure for use in a photovoltaic device, the structure comprising:

a substrate;

a buffer material, wherein the buffer material comprises at least one of CdZnO and SnZnO.

a barrier material in contact with the substrate; and

a transparent conductive oxide between the buffer material and the barrier material.

2 . The structure of claim 1 , wherein buffer material further comprises a dopant.

3 . The structure of claim 2 , wherein the dopant comprises a p-type dopant.

4 . The structure of claim 3 , wherein the dopant is selected from the group consisting of: Li, Na, K, N, P, As, Sb, and Bi.

5 . The structure of claim 2 , wherein the dopant comprises an n-type dopant.

6 . The structure of claim 5 , wherein the dopant is selected from the group consisting of: B, Al, Ga, In, T, F, Cl, Br, I, and At.

7 . The structure of claim 2 , wherein the concentration of the dopant is from about 1×10 14 atoms/cm 3 to about 1×10 20 atoms/cm 3 .

8 . The structure of claim 1 , wherein the buffer material has a thickness from about 0.1 nm to about 1000 nm.

9 . The structure of claim 1 , wherein the buffer material has a thickness from about 0.1 nm to about 300 nm.

10 . The structure of claim 1 , wherein the buffer material further comprises at least one other transparent material.

11 . The structure of claim 1 , wherein the buffer material further comprises SnO x .

12 . The structure of claim 1 , wherein the buffer material comprises CdZnO and wherein the atomic ratio of Cd to Zn is from about 1:100 to about 100:1.

13 . The structure of claim 1 , wherein the buffer material comprises SnZnO and wherein the atomic ratio of Sn to Zn is from about 1:100 to about 100:1.

14 . The structure of claim 1 , wherein the substrate is a glass selected from the group consisting of: soda lime glass, low Fe glass and solar float glass.

15 . A photovoltaic device comprising:

a substrate;

a semiconductor material;

a barrier material between the substrate and the semiconductor material;

a transparent conductive oxide between the barrier material and the semiconductor material;

a buffer material between the transparent conductive oxide and the semiconductor material, wherein the buffer material comprises at least one of CdZnO and SnZnO; and

a window material between the buffer material and the semiconductor material.

16 . The device of claim 15 , wherein buffer material further comprises a dopant.

17 . The device of claim 16 , wherein the concentration of the dopant is from about 1×10 14 atoms/cm 3 to about 1×10 20 atoms/cm 3 .

18 . The device of claim 15 , wherein the buffer material has a thickness from about 0.1 nm to about 1000 nm.

19 . The device of claim 15 , wherein the buffer material further comprises at least one other transparent material.

20 . The device of claim 15 , wherein the buffer material comprises CdZnO and wherein the atomic ratio of Cd to Zn is from about 1:100 to about 100:1.

21 . The device of claim 15 , wherein the buffer material comprises SnZnO and wherein the atomic ratio of Sn to Zn is from about 1:100 to about 100:1.

22 . The device of claim 1 , further comprising a contact adjacent the semiconductor material.

23 . The device of claim 15 , wherein the semiconductor material is selected from the group consisting of: CdTe, CIGS and amorphous silicon.

24 . The device of claim 15 , wherein the substrate comprises a glass, the barrier material comprises SiAlO x , the TCO material comprises CdSt, the window material comprises CdS, and the semiconductor material comprises CdTe.

25 . The device of claim 15 , wherein the substrate comprises a glass, the barrier material comprises SnO x and SiAlO x , the TCO material comprises flouring doped SnO 2 , the window material comprises CdS, and the semiconductor material comprises CdTe.

26 . The device of claim 15 , wherein a portion of the buffer material is in direct contact with a portion of the semiconductor material.

27 . A method of making a photovoltaic structure, the method comprising:

providing a substrate;

forming a barrier material on a first side of the substrate;

forming a transparent conductive oxide on the first side of the substrate; and

forming a buffer material on the first side of the substrate, wherein the buffer material comprises at least one of CdZnO and SnZnO; and wherein the barrier material is between the transparent conductive oxide and the substrate; and the transparent conductive oxide is between the buffer material and the barrier material.

28 . The method of claim 27 , further comprising doping the barrier material with a dopant.

29 . The method of claim 28 , wherein the buffer material is formed by a sputtering process, and wherein doping the buffer material comprises using a target having the dopant in a concentration from about 1×10 17 atoms/cm 3 to about 1×10 18 atoms/cm 3 .

30 . The method of claim 27 , wherein at least one of the barrier material, transparent conductive oxide and buffer material are formed by atmospheric physical vapor deposition.

31 . The method of claim 27 , further comprising subjecting the barrier material to a thermal annealing process.

32 . The method of claim 27 , wherein forming the buffer material comprises forming the buffer material in an oxygen deficient environment.

33 . The method of claim 27 , wherein the buffer material is formed in an amorphous state and further comprising processing the buffer material to change at least a portion of the buffer material to a crystalline state.

Assignments (3)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 15, 2021
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 058132/0261 →
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT APPLICATION 13/895113 ERRONEOUSLY ASSIGNED BY FIRST SOLAR, INC. TO JPMORGAN CHASE BANK, N.A. ON JULY 19, 2013 PREVIOUSLY RECORDED ON REEL 030832 FRAME 0088. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT PATENT APPLICATION TO BE ASSIGNED IS 13/633664. Recorded Sep 19, 2014
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 033779/0081 →
SECURITY AGREEMENT Recorded Jul 19, 2013
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 030832/0088 →