IP Library Granted Patent US 9,118,412
Granted Patent B2
US 9,118,412 · App. 13/246,161 · Granted Aug 25, 2015

System and method for performing in-band reflection analysis in a passive optical network

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,118,412
App. No.
13/246,161
Granted
Aug 25, 2015
Kind
B2
Abstract

A system for performing in-band reflection analysis in a passive optical network. The system comprises an optical line terminal (OLT) that includes a transceiver for transmitting continuous downstream data modulated on a first wavelength and receiving upstream burst data modulated on a second wavelength, the OLT further includes a receiver for receiving signals reflected from the PON that are modulated on the first wavelength, wherein the continuous downstream data comprises user data and a test data pattern; and a reflection analysis unit for cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relatively for an optical location to be tested.

Claims (52)

1. A system for performing in-band reflection analysis in a passive optical network (PON), comprising:

an optical line terminal (OLT) that includes a transceiver configured to transmit continuous downstream data modulated on a first wavelength and receiving upstream burst data modulated on a second wavelength, wherein the OLT further includes a receiver for receiving signals reflected from the PON that are modulated on the first wavelength, wherein the continuous downstream data comprises user data and a test data pattern; and

a reflection analysis unit for cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relatively for an optical location to be tested,

wherein the reflection analysis unit comprises a data scanner configured to identify a data pattern that should not be cross-correlated by the reflection analysis unit based on whether a density of high frequency components in the transmitted downstream data is above a predefined threshold.

2. The system of claim 1 , further comprising:

an optical time-domain reflectometer (OTDR) processor for detecting optical faults in the tested optical location based on results of the reflection analysis.

3. The system of claim 1 , wherein the reflection analysis unit further comprises:

a low pass filter for filtering out high frequency components from the transmitted continuous downstream data;

a delay line with a scaling constant for delaying the filtered data pattern in a time relative to the optical location to be tested, wherein the scaling constant is a predefined value;

an analog-to-digital converter (ADC) coupled to the output of the receiver that converts the reflected optical signals to digital signals;

a multiplier for multiplying the time delayed signal with a digital signal output by the ADC; and

an accumulator for accumulating a current multiplication result with previous multiplication results.

4. The system of claim 3 , wherein a number of accumulations is a function of a length of the test data pattern.

5. The system of claim 3 , wherein the data scanner is configured to generate a skip indication indicating that the current multiplication result should not be accumulated.

6. The system of claim 5 , wherein the skip indication is generated based on a value of an optical network unit (ONU) identifier in a downstream frame that is not associated with any ONU of the PON.

7. The system of claim 1 , wherein the OLT is an OLT of the PON.

8. The system of claim 7 , wherein the first wavelength and the second wavelength are the wavelengths defined in standard specifications of the PON.

9. The system of claim 8 , wherein the PON is any one of: an Ethernet PON (EPON), a Gigabit (PON), and a 10-Gigabit (XG-PON).

10. The system of claim 2 , wherein a detected optical fault includes at least one of: a damaged optical fiber, a bend in an optical fiber, a bad splice, a dirty connector, and a fiber cut.

11. A method for performing in-band reflection analysis in a passive optical network (PON), comprising:

establishing a dedicated receive path at an optical line terminal (OLT) of the PON to receive signals reflected from the PON, wherein the reflected signals are modulated on a downstream wavelength of the OLT;

transmitting continuous downstream data modulated on the downstream wavelength, wherein the downstream data includes user data and a test data pattern;

cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relative to an optical location to be tested; and

identifying a data pattern that should not be cross-correlated when a density of high frequency components in the transmitted downstream data is above a predefined threshold.

12. The method of claim 11 , further comprising:

performing an optical time-domain reflectometer (OTDR) process for detecting optical faults in the tested optical location based on results of the cross-correlating.

13. The method of claim 11 , further comprising:

filtering out high frequency components from the transmitted continuous downstream data;

time delaying the filtered downstream data in a time relative to the optical location to be tested;

scaling the delayed signal by a predefined scale constant;

converting the reflected signals received at the dedicated receive path to digital signals;

multiplying the time delayed and scaled signal with a converted digital signal; and

accumulating a current multiplication result with previous multiplication results.

14. The method of claim 13 , wherein a number of accumulations is a function of a length of the test data pattern.

15. The method of claim 13 , further comprising:

generating a skip indication indicating that the current multiplication result should not be accumulated.

16. The method of claim 15 , wherein the skip indication is generated based on a value of an optical network unit (ONU) identifier in a downstream frame that is not associated with any ONU of the PON.

17. The method of claim 16 , wherein the first wavelength is defined by standard specifications of the PON.

18. The method of claim 12 , wherein a detected optical fault includes at least one of:

a damaged optical fiber, a bend in an optical fiber, a bad splice, a dirty connector, and a fiber cut.

19. An optical line terminal (OLT) operative in a passive optical network (PON) and configured to perform in-band reflection analysis, comprising:

a transceiver for transmitting continuous downstream data modulated on a first wavelength and receiving burst upstream data modulated on a second wavelength;

a receiver for receiving signals reflected from the PON and being modulated on the first wavelength;

a MAC module for generating the continuous downstream data, wherein the continuous downstream data includes user data and a test data pattern; and

a reflection analysis unit for cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relatively for an optical location to be tested,

wherein the reflection analysis unit comprises a data scanner configured to identify a data pattern that should not be cross-correlated by the reflection analysis unit based on whether a density of high frequency components in the transmitted downstream data is above a predefined threshold.

20. The OLT of claim 19 , further comprising:

an optical time-domain reflectometer (OTDR) processor for detecting optical faults in the tested optical location based on results provided by the reflection analysis unit.

21. The OLT of claim 19 , wherein the PON is any one of: an Ethernet PON (EPON), a Gigabit (PON), and a 10-Gigabit (XG-PON).

22. The system of claim 1 , wherein the test data pattern is a continuous high rate data pattern that includes low rate components and is compliant with transmission specifications of the PON.

23. The method of claim 11 , wherein the test data pattern is a continuous high rate data pattern that includes low rate components and is compliant with transmission specifications of the PON.

24. The OLT of claim 19 , wherein the test data pattern is a continuous high rate data pattern that includes low rate components and is compliant with transmission specifications of the PON.

Assignments (10)
CORRECTIVE ASSIGNMENT TO CORRECT THE PATENT NUMBER 9,385,856 TO 9,385,756 PREVIOUSLY RECORDED AT REEL: 47349 FRAME: 001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 22, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 051144/0648 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE PREVIOUSLY RECORDED ON REEL 047229 FRAME 0408. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047349/0001 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047229/0408 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2017
From: BROADCOM CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041706/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2012
From: BROADCOM BROADBAND ACESS LTD.
To: BROADCOM INTERNATIONAL LIMITED
Reel/Frame 029256/0895 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2012
From: BROADCOM INTERNATIONAL LIMITED
To: BROADCOM CORPORATION
Reel/Frame 029256/0939 →
CHANGE OF NAME Recorded Nov 7, 2012
From: BROADLIGHT LTD.
To: BROADCOM BROADBAND ACCESS LTD.
Reel/Frame 029259/0975 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2011
From: DVIR, AMIAD; NAOR, ASSAF
To: BROADLIGHT, LTD.
Reel/Frame 026975/0163 →