IP Library Patent Application 13248361
Patent Application
App. No. 13/248,361

MAGNETIC STACK WITH LAMINATED LAYER

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Quick Facts
Patent No.
US None
App. No.
13/248,361
Abstract

A magnetic stack with a multilayer free layer having a switchable magnetization orientation, the free layer comprising a first ferromagnetic portion and a second ferromagnetic portion with an electrically conducting non-magnetic intermediate layer between the first portion and the second portion. The magnetic stack also includes a first ferromagnetic reference layer having a pinned magnetization orientation, a first non-magnetic spacer layer between the free layer and the first reference layer, a second ferromagnetic reference layer having a pinned magnetization orientation, and a second non-magnetic spacer layer between the free layer and the second reference layer.

Claims (49)

1 . A magnetic stack comprising:

a first ferromagnetic reference layer having a pinned magnetization orientation;

a free layer having a switchable magnetization orientation;

a first non-magnetic, electrically insulating barrier layer;

a second non-magnetic, electrically insulating barrier layer; and

a second ferromagnetic reference layer having a pinned magnetization orientation,

wherein the first non-magnetic spacer layer is positioned between the first ferromagnetic reference layer and the free layer, the free layer is positioned between the first non-magnetic spacer layer and the second non-magnetic spacer layer, and the second non-magnetic spacer layer is positioned between the free layer and the second ferromagnetic reference layer.

2 . The magnetic stack of claim 1 , wherein the first and second barrier layers independently comprise a crystalline material.

3 . The magnetic stack of claim 2 , wherein both the first barrier layer and the second barrier layer comprise crystalline MgO.

4 . The magnetic stack of claim 1 , wherein the first and second barrier layers have a thickness of from about 0.5 nm to about 1.5 nm.

5 . The magnetic stack of claim 1 , wherein the material of the free layer has a saturation moment (Ms) that is at least 1000 emu/cc.

6 . The magnetic stack of claim 1 , wherein the material of the free layer has a saturation moment (Ms) that is at least 1500 emu/cc.

7 . The magnetic stack of claim 1 , wherein the free layer comprises Co 100-x-y Fe x B y , wherein x is greater than 30 and y is greater than 15.

8 . The magnetic stack of claim 1 , wherein the magnetization orientations of the first ferromagnetic reference layer and the second ferromagnetic reference layer are opposite to one another.

9 . The magnetic stack of claim 1 , wherein the first reference layer comprises an unbalanced synthetic antiferromagnetic coupled structure.

10 . The magnetic stack of claim 1 , wherein the second reference layer comprises an unbalanced synthetic antiferromagnetic coupled structure.

11 . The magnetic stack of claim 1 , wherein the magnetic stack is a magnetic tunnel junction memory cell.

12 . The magnetic stack of claim 1 , wherein the magnetic stack is a magnetic read sensor in a recording head.

13 . A magnetic memory device comprising:

a substrate having a source region and a drain region with a channel region therebetween;

a gate electrically between the channel region and a word line;

a magnetic memory cell electrically connected to one of the source region and the drain region, the magnetic cell comprising:

a first ferromagnetic reference layer having a pinned magnetization orientation;

a free layer having a switchable magnetization orientation;

a first non-magnetic, electrically insulating barrier layer;

a second non-magnetic, electrically insulating barrier layer; and

a second ferromagnetic reference layer having a pinned magnetization orientation,

wherein the first non-magnetic spacer layer is positioned between the first ferromagnetic reference layer and the free layer, the free layer is positioned between the first non-magnetic spacer layer and the second non-magnetic spacer layer, and the second non-magnetic spacer layer is positioned between the free layer and the second ferromagnetic reference layer;

a first line electrically connected to the magnetic memory cell; and

a second line electrically connected to the other of the source region and the drain region.

14 . The magnetic stack of claim 13 , wherein the first and second barrier layers independently comprise a crystalline material.

15 . The magnetic stack of claim 13 , wherein both the first barrier layer and the second barrier layer comprise crystalline MgO.

16 . The magnetic stack of claim 13 , wherein the first and second barrier layers have a thickness of from about 0.5 nm to about 1.5 nm.

17 . The magnetic stack of claim 13 , wherein the material of the free layer has a saturation moment (Ms) that is at least 1500 emu/cc.

18 . The magnetic stack of claim 13 , wherein the free layer comprises CO 100-x-y Fe x B y , wherein x is greater than 30 and y is greater than 15.

19 . The magnetic stack of claim 1 , wherein the magnetization orientations of the first ferromagnetic reference layer and the second ferromagnetic reference layer are opposite to one another.

20 . A spin-torque magnetic memory device comprising:

a substrate having a source region and a drain region with a channel region therebetween;

a gate electrically between the channel region and a word line;

a magnetic memory cell electrically connected to one of the source region and the drain region, the magnetic cell comprising:

a first ferromagnetic reference layer having a pinned magnetization orientation;

a free layer having a switchable magnetization orientation;

a first non-magnetic, electrically insulating barrier layer;

a second non-magnetic, electrically insulating barrier layer; and

a second ferromagnetic reference layer having a pinned magnetization orientation,

wherein the first non-magnetic spacer layer is positioned between the first ferromagnetic reference layer and the free layer, the free layer is positioned between the first non-magnetic spacer layer and the second non-magnetic spacer layer, and the second non-magnetic spacer layer is positioned between the free layer and the second ferromagnetic reference layer,

wherein the magnetic memory cell has a resistance state, which can be switched via spin-transfer by passing a current through the magnetic memory cell;

a first line electrically connected to the magnetic memory cell; and

a second line electrically connected to the other of the source region and the drain region.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2025
From: THE BANK OF NOVA SCOTIA
To: SEAGATE TECHNOLOGY US HOLDINGS, INC.; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY LLC
Reel/Frame 070363/0903 →
RELEASE OF SECURITY INTEREST Recorded Jul 23, 2024
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: SEAGATE TECHNOLOGY LLC; EVAULT INC
Reel/Frame 068457/0076 →
RELEASE OF SECURITY INTEREST Recorded May 20, 2024
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
Reel/Frame 067471/0955 →
SECURITY AGREEMENT Recorded Oct 15, 2012
From: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
To: THE BANK OF NOVA SCOTIA, AS ADMINISTRATIVE AGENT
Reel/Frame 029127/0527 →
SECOND LIEN PATENT SECURITY AGREEMENT Recorded Oct 15, 2012
From: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 029253/0585 →