Capacitive sensor for thermometer probe

1. An electronic thermometer comprising: a probe adapted to be heated by a subject for use in measuring a temperature of the subject; at least one temperature sensor for detecting a temperature of the probe; a probe sensor for detecting a condition at the probe, the probe sensor having an idle condition when the probe is not inserted into the subject; and

a processor operatively connected to the probe sensor and programmed to monitor a change in the condition of the probe sensor from the idle condition to an active condition wherein the probe has been received in a probe cover and inserted into the subject;

wherein the processor is operatively connected to the at least one temperature sensor and programmed to activate the at least one temperature sensor only after the probe sensor detects a change in condition from the idle condition to the active condition indicating that the probe is received in a probe cover and inserted into the subject.

2. An electronic thermometer as set forth in claim 1 wherein the probe sensor is a capacitive sensor that measures a capacitance at the probe, the capacitive sensor having an idle capacitance when the probe is not inserted into the subject, the processor being programmed to activate the at least one temperature sensor only after the capacitive sensor detects a change in capacitance from the idle capacitance within a predetermined range indicating that the probe is received in a probe cover and inserted into the subject.

3. An electronic thermometer as set forth in claim 2 wherein the processor is programmed to identify a first condition corresponding to a first change in capacitance detected by the capacitive sensor signaling that the probe has been inserted into the subject without a probe cover disposed over the probe, and a second condition corresponding to a second change in capacitance detected by the capacitive sensor different from the first change in capacitance signaling that the probe has been inserted into the subject with a probe cover disposed over the probe.

4. An electronic thermometer as set forth in claim 3 wherein the first change in capacitance is larger than the second change in capacitance.

5. An electronic thermometer as set forth in claim 3 wherein the processor is programmed to trigger an alarm when the processor identifies the first condition.

6. An electronic thermometer as set forth in claim 2 wherein the capacitive sensor is disposed at a distal end of the probe.

7. An electronic thermometer as set forth in claim 1 wherein the thermometer is a tympanic thermometer.

8. An electronic thermometer as set forth in claim 1 wherein the probe sensor comprises external isolated layers mounted on a tip of the probe.

9. An electronic thermometer as set forth in claim 8 wherein the external isolated layers comprise a non-conductive layer disposed over the probe tip and a conductive layer disposed over the non-conductive layer.

10. A method of determining a temperature of a subject with an electronic thermometer, said thermometer having a probe adapted to be heated by a subject and at least one temperature sensor for detecting a temperature of the probe, said method comprising:

detecting a condition at the probe of the thermometer with a probe sensor, said probe sensor having an idle condition when the probe is not inserted into the subject; and

monitoring a change in the condition of the probe sensor from the idle condition to an active condition wherein the probe has been received in a probe cover and inserted into the subject;

and detecting the temperature of the probe inserted into the subject by using the temperature sensor to determine the temperature of the subject;

wherein the thermometer comprises a processor operatively connected to the temperature sensor, the method further comprising activating the temperature sensor using the processor for determining the temperature of the subject only after the probe sensor detects a change in condition from the idle condition to the active condition indicating that the probe is received in a probe cover and inserted into the subject.

11. A method as set forth in claim 10 wherein the probe sensor is a capacitive sensor that measures a capacitance at the probe, the capacitive sensor having an idle capacitance when the probe is not inserted into the subject, the processor being programmed to activate the temperature sensor only after the capacitive sensor detects a change in capacitance from the idle capacitance within a predetermined range indicating that the probe is received in a probe cover and inserted into the subject.

12. A method as set forth in claim 11 further comprising programming the processor to identify a first condition corresponding to a first change in capacitance detected by the capacitive sensor signaling that the probe has been inserted into the subject without a probe cover disposed over the probe, and a second condition corresponding to a second change in capacitance detected by the capacitive sensor different from the first change in capacitance signaling that the probe has been inserted into the subject with a probe cover disposed over the probe.

13. A method as set forth in claim 12 wherein the first change in capacitance is larger than the second change in capacitance.

14. A method as set forth in claim 12 further comprising triggering an alarm to prompt a practitioner to clean the probe and place a probe cover over the probe when the processor identifies the first condition.

15. A method of determining a temperature of a subject with an electronic thermometer, said method comprising:

measuring a condition at a probe of the thermometer with a probe sensor, said probe sensor having an idle condition when the probe is not inserted into the subject;

programming a processor of the thermometer to identify a first condition corresponding to a first change in condition measured by the probe sensor signaling that the probe has been inserted into the subject without a probe cover disposed over the probe, and a second condition corresponding to a second change in condition measured by the probe sensor different from the first change in condition signaling that the probe has been inserted into the subject with a probe cover disposed over the probe; and detecting a temperature of the probe inserted into the subject by using a temperature sensor to determine the temperature of the subject;

wherein the probe sensor is a capacitive sensor that measures a capacitance at the probe, the capacitive sensor having an idle capacitance when the probe is not inserted into the subject, wherein the first condition corresponds to a first change in capacitance measured by the capacitive sensor signaling that the probe has been inserted into the subject without a probe cover disposed over the probe, and the second condition corresponds to a second change in capacitance measured by the capacitive sensor different from the first change in capacitance signaling that the probe has been inserted into the subject with a probe cover disposed over the probe; and

wherein the processor is operatively connected to at least one temperature sensor for determining the temperature of the subject, the method further comprising activating the at least one temperature sensor only after the probe sensor detects the second condition.

16. A method as set forth in claim 15 wherein the first change in capacitance is larger than the second change in capacitance.

17. A method as set forth in claim 15 further comprising programming the processor to trigger an alarm and prompt a practitioner to clean the probe and place a probe cover over the probe when the processor identifies the first condition.