IP Library Patent Application 13250168
Patent Application
App. No. 13/250,168

TEXTURED PHOTOVOLTAIC CELLS AND METHODS

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Quick Facts
Patent No.
US None
App. No.
13/250,168
Abstract

The present invention relates to devices and method for textured semiconductor materials. Devices and methods shown provide a textured surface with properties that provide a high breakdown voltage. The devices and methods of the present invention can be used to make semiconductor substrates for use in photovoltaic applications such as solar cells.

Claims (37)

1 . A method of forming a photovoltaic cell, comprising:

texturing a surface of a first conductivity type doped semiconductor substrate, including:

etching the surface using a first etchant chemistry to form an textured surface;

etching the textured surface using a second etchant chemistry to broaden sharp edges in the etched surface;

forming a doped layer of a second conductivity type at the textured surface to form a p-n junction;

coupling a first electrical conductor to the doped layer of second conductivity type; and

coupling a second electrical conductor to a back surface of the semiconductor substrate.

2 . The method of claim 1 , wherein etching the surface using the first etchant chemistry includes etching the surface using an acid etchant chemistry.

3 . The method of claim 1 , wherein etching the surface using a first etchant chemistry includes etching the surface using a first nitric acid and hydrofluoric acid chemistry; and

etching the textured surface using a second etchant chemistry includes etching the textured surface using a second nitric acid and hydrofluoric acid chemistry with a higher nitric acid to hydrofluoric acid concentration ratio than the first etchant chemistry.

4 . The method of claim 3 , wherein etching the surface using a second etchant chemistry includes etching the surface using a second nitric acid and hydrofluoric acid chemistry in a molar ratio greater than or equal to approximately 2.5 to 1.

5 . The method of claim 1 , wherein etching the surface using a second etchant chemistry includes etching the surface to etch an amount of silicon between approximately 0.5μ and 2.0μ.

6 . The method of claim 1 , wherein etching the surface using a second etchant chemistry includes etching the surface to etch an amount of silicon between approximately 1.0μ and 1.5μ.

7 . A photovoltaic device, comprising:

a semiconductor substrate doped with a first conductivity type dopant;

a textured surface on the semiconductor substrate, formed by etching the surface using a first etchant chemistry to form an etched surface, and etching the etched surface using a second etchant chemistry to broaden sharp edges in the etched surface;

a layer of second conductivity type dopant formed at the textured surface, forming a p-n junction with the semiconductor substrate;

a dielectric layer over the textured surface;

a first electrical conductor coupled to the textured surface; and

a second electrical conductor coupled to a back surface of the semiconductor substrate.

8 . The photovoltaic device of claim 7 , further including an anti-reflective coating over the dielectric layer.

9 . The photovoltaic device of claim 7 , wherein the textured surface on the semiconductor substrate is formed by etching the surface using a first etchant chemistry of nitric acid to hydrofluoric acid in a molar ratio of approximately 1 to 1 to form the etched surface; and

etching the etched surface using a second etchant chemistry of nitric acid to hydrofluoric acid in a molar ratio greater than or equal to approximately 2.5 to 1, to broaden sharp edges in the etched surface.

10 . The photovoltaic device of claim 7 , wherein the textured surface on the semiconductor substrate is formed by etching the surface using a first etchant chemistry of nitric acid to hydrofluoric acid in a ratio of 1 to 1 to form an etched surface; and

polishing the etched surface using a second etchant chemistry of nitric acid, hydrofluoric acid, and sulfuric acid in a molar ratio of approximately 2.5 to 1 to 1.5, to broaden sharp edges in the etched surface.

11 . The photovoltaic device of claim 7 , wherein the semiconductor substrate is doped with a p-type dopant, and the layer of second conductivity type dopant is n-type.

12 . The photovoltaic device of claim 7 , wherein the device includes multiple cells electrically connected together to form a module.

13 . The photovoltaic device of claim 12 , wherein the device includes 3 strings of 24 cells electrically connected together to form a module.

14 . A photovoltaic manufacturing system, comprising:

a device to provide a first etchant including nitric acid and hydrofluoric acid, to create a surface texture on a substrate; and

a device to provide a second etchant to broaden sharp edges of the surface texture, wherein the second etchant includes nitric acid and hydrofluoric acid wherein a ratio of nitric acid to hydrofluoric acid is increased from the first etchant.

15 . The photovoltaic manufacturing system of claim 14 , wherein the device to provide a second etchant is configured to etch an amount of silicon between approximately 0.5μ and 2.0μ.

16 . The photovoltaic manufacturing system of claim 14 , wherein the device to provide a second etchant is configured to etch an amount of silicon between approximately 1.0μ and 1.5μ.

17 . The photovoltaic manufacturing system of claim 14 , further including a device to rinse the surface texture between etching operations.

18 . The photovoltaic manufacturing system of claim 14 , wherein the device to provide the first etchant includes a device to provide nitric acid and hydrofluoric acid in a ratio of 1 to 1.

19 . The photovoltaic manufacturing system of claim 18 , wherein the device to provide the second etchant includes a device to provide nitric acid and hydrofluoric acid in a molar ratio greater than or equal to approximately 2.5 to 1.

20 . The photovoltaic manufacturing system of claim 19 , wherein the device to provide the second etchant includes a device to provide nitric acid, hydrofluoric acid, and sulfuric acid in a molar ratio approximately equal to approximately 2.5 to 1 to 1.5.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2023
From: SUNNUVELLIR SLHF
To: HIGHLAND MATERIALS, INC.
Reel/Frame 064388/0757 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2023
From: SILICOR MATERIALS, INC.
To: SUNNUVELLIR SLHF
Reel/Frame 062511/0046 →
LICENSE Recorded Oct 13, 2015
From: SILICOR MATERIALS, INC.
To: SMS GROUP GMBH
Reel/Frame 036811/0327 →
CHANGE OF NAME Recorded Nov 20, 2012
From: CALISOLAR INC.
To: SILICOR MATERIALS INC.
Reel/Frame 029397/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2012
From: LAPARRA, OLIVIER; SCHROEDER, PAUL; RAKOTONIAINA, JEAN PATRICE; CHANG, CHIA-MING; SIDELKHEIR, OMAR; BLOSSE, ALAIN PAUL; OUNADJELA, KAMEL
To: CALISOLAR INC.
Reel/Frame 029034/0198 →