Micro gyroscope for determining rotational movements about three spatial axes which are perpendicular to one another
View Patent ↗A micro gyroscope determine three-dimensional rotational movements is mounted on a substrate on which a plurality of masses tangentially oscillate about the z axis perpendicular to the substrate. The oscillating masses are fastened to the substrate by springs and bolts. Driving elements maintain oscillating tangential vibrations of the masses about the z axis. Upon rotation of the substrate about any spatial axis, the masses are subjected to deflections caused by Corolis forces that are detected by sensor elements. Certain masses oscillating about the z axis are tiltable about the x axis, while some others are tiltable about the y axis. At least one other mass is configured to deflect radially to the z axis in a x-y plane parallel to the plane of the substrate. This mass is assigned a sensor element that can deflect radially with respect to the axis but cannot oscillate about the z axis.
1. A micro gyroscope to determine rotational movements about three perpendicularly stacked spatial axes x, y and z, the gyroscope comprising:
a substrate on which several tangentially oscillating masses are arranged about the z axis that is perpendicularly positioned on the substrate, the oscillating masses are fastened to the substrate with springs and tie bolts;
drive elements to maintain oscillating tangential vibrations of the masses about the z axis, as a result of which the masses are subject to Coriolis forces and the deflections caused by the Coriolis forces when the substrate rotates around any spatial axis; and
sensor elements to register the deflection of the masses caused by the Coriolis forces,
wherein some of the masses oscillating about the z axis are tiltably arranged about the x axis that runs parallel to the substrate, other masses oscillating about the z axis are essentially tiltably arranged about the y axis that runs parallel to the substrate, and at least one of the oscillating masses can be also be deflected at least partially radially with respect to the z axis in the x-y plane parallel to the plane of the substrate, this z mass can be additionally deflected radially and is allocated to an oscillating sensor element that can also be deflected radially with regard to the z axis but not about the z axis.