Deconvolution for the reduction of blurring induced by internal reflections
View Patent ↗A system and method of image processing employ mathematical deconvolution to estimate the magnitude and location of a target object within an image. Both the nature of internal reflections and the convolution process by which each internal reflection contributes to blurring of the acquired image data may be measured and modeled. In accordance with mathematical deconvolution techniques, the combined effects of these internal reflections may be reduced to the extent that respective contributions of the target object and each individual reflection may be distinguished and quantified.
1. An imaging system comprising:
an optical train for providing an image of a target object at a detector for acquiring image data of said target object; and
an image processor arranged to:
receive said image data;
modeling said image data to create modeled data;
responsive to said modeling, estimating a size and an magnitude of an internal reflection in said optical train; and
deconvolving said modeled data in accordance with said estimating.
2. The system of claim 1 , wherein said modeling comprises mathematically expressing said modeled data as a sum of object data representing said target object and reflection data representing said internal reflection.
3. The system of claim 2 , wherein said modeling further comprises mathematically expressing said reflection data as a plurality of factors, wherein each of said plurality of factors is associated with a respective internal reflection.
4. The system of claim 1 , wherein said modeling comprises utilizing a series of cylindrical functions.
5. The system of claim 1 , wherein said detector is a charge-coupled device.
6. The system of claim 1 , wherein said detector is a complementary metal oxide semiconductor sensor device.