Categorizing bit errors of solid-state, non-volatile memory
Bit errors affecting cells of a solid-state, non-volatile memory are assigned to at least a first or a second category based on a relative amount of voltage shift that caused the respective bit errors in the respective cells. A reference voltage used to access the respective cells is adjusted to manage the respective bit errors of the first category. Additional corrective measures are taken to manage the respective bit errors of the second category.
1. A method, comprising:
assigning bit errors affecting cells of a solid-state, non-volatile memory to at least a first or a second category based on a relative amount of voltage shift that caused the respective bit errors in the respective cells, wherein the first and second categories are based on conditional probabilities of actual values read from the cells in view of expected values of the cells;
adjusting a reference voltage used to access the respective cells to manage the respective bit errors of the first category; and
taking additional corrective measures to manage the respective bit errors of the second category.
2. The method of claim 1 , wherein taking the additional corrective measures comprises retiring the respective cells associated with the second category of bit errors.
3. The method of claim 1 , wherein taking the additional corrective measures comprises adjusting an error correction code used in association with the respective cells.
4. The method of claim 1 , wherein the cells comprise multi-level cells, and wherein the first category comprises errors caused by voltage shifts between two adjacent voltage levels, and wherein the second category comprises complex errors caused by voltage shifts between two non-adjacent voltage levels.
5. The method of claim 1 , wherein the adjusting of the reference voltage and the taking of the additional corrective measures are performed on pages that comprise the respective cells.
6. The method of claim 1 , wherein the relative amount of voltage shift is determined based on soft data of the cells.
7. An apparatus, comprising:
a controller capable of being coupled to a solid-state, non-volatile memory, the controller configured to:
assign bit errors affecting cells of the solid-state, non-volatile memory to at least a first or a second category based on a relative amount of voltage shift that caused the respective bit errors in the respective cells, wherein the first and second categories are based on conditional probabilities of actual values read from the cells in view of expected values of the cells;
adjust a reference voltage used to access the respective cells to manage the respective bit errors of the first category; and
take additional corrective measures to manage the respective bit errors of the second category.
8. The apparatus of claim 7 , wherein taking the additional corrective measures comprises retiring the respective cells associated with the second category of bit errors.
9. The apparatus of claim 7 , wherein taking the additional corrective measures comprises adjusting an error correction code used in association with the respective cells.
10. The apparatus of claim 7 , wherein the cells comprise multi-level cells, and wherein the first category comprises first errors caused by voltage shifts between two adjacent voltage levels, and wherein the second category comprises second errors caused by voltage shifts between two non-adjacent voltage levels.
11. The apparatus of claim 7 , wherein the adjusting of the reference voltage and the taking of the additional corrective measures are performed on pages that comprise the respective cells.
12. The apparatus of claim 7 , wherein the relative amount of voltage shift is determined based on soft data of the cells.
13. The apparatus of claim 7 , wherein the relative amount of voltage shift determined for one of least significant bit or a most significant bit of the cell.
14. An apparatus comprising:
a controller capable of being coupled to a solid-state, non-volatile memory, the controller configured to:
determining a voltage difference between an expected voltage level and an actual voltage level associated with a bit error affecting at least one cell of the solid-state, non-volatile memory;
in response to the voltage difference satisfying a threshold based on conditional probabilities of actual values read from the cells in view of expected values of the cells, adjust a parameter used to access the cell based on the voltage difference; and
take additional corrective measures to manage the bit error in response to the voltage difference not satisfying the threshold.
15. The apparatus of claim 14 , wherein adjusting the parameter used to access the cell comprises determining a magnitude and direction of the voltage difference, and adjusting at least one of a read threshold voltage and a programming threshold voltage associated with the cell.
16. The apparatus of claim 14 , wherein taking the additional corrective measures comprises retiring a page associated with the cell.
17. The apparatus of claim 14 , wherein taking the additional corrective measures comprises adjusting an error correction code used in association with cell.
18. The apparatus of claim 14 , wherein the cell comprises a multi-level cell, and wherein the threshold comprises a voltage shift between two adjacent voltage levels or less.
19. The apparatus of claim 14 , wherein the adjusting of the parameter and the taking of the additional corrective measures are performed on a page that comprises the cell.