Heat strengthening of a glass superstrate for thin film photovoltaic devices
View Patent ↗Process and apparatus are generally provided for forming a thin film photovoltaic device. In one particular embodiment, the process includes: depositing a photovoltaic absorber layer on a glass substrate; heating the glass substrate to an anneal temperature; and quenching the glass substrate to cool the glass substrate to a quenched temperature in less than 10 seconds. The quenched temperature can be about 85° C. to about 200° C. less than the anneal temperature. The quenching atmosphere can have a quenching pressure of about 1 torr or more and can include an inert gas.
1. A process of forming a thin film photovoltaic device, the process comprising:
depositing a photovoltaic absorber layer on a glass substrate;
heating the glass substrate to an anneal temperature; and,
quenching the glass substrate with a quenching gas to cool the glass substrate to a quenched temperature in less than 10 seconds, the quenched temperature being about 85° C. to about 200° C. less than the anneal temperature, and wherein the quenching gas comprises an inert gas, and wherein the glass substrate has a temperature gradient across its surface of less than 20° C. during quenching.
2. The process as in claim 1 , wherein the anneal temperature is about 575° C. to about 650° C.
3. The process as in claim 2 , wherein the quenched temperature is 500° C. or less.
4. The process of claim 1 , wherein the quenching gas has a quenching temperature of about 0° C. to about 100° C.
5. The process of claim 1 , wherein the quenching gas is substantially free from oxygen.
6. The process of claim 1 , wherein the glass substrate comprises borosilicate glass.
7. The process of claim 6 , wherein the glass substrate has a thickness of about 0.5 mm to about 2.5 mm.
8. The process of claim 1 , wherein quenching the glass substrate to cool the glass substrate to the quenched temperature is performed in a first quenching chamber.
9. The process of claim 8 , further comprising:
transporting the glass substrate from the first quenching chamber to a second quenching chamber; and
cooling the glass substrate in the second quenching chamber to a second quenched temperature in a second quenching time of about 4 seconds to about 30 seconds, wherein the second quenched temperature is at least 100° C. less than the quenched temperature.
10. The process of claim 9 , wherein the second quenched temperature is about 225° C. to about 375° C.
11. The process of claim 1 , further comprising:
monitoring the temperature gradient across the surface of the glass substrate during quenching.
12. The process of claim 1 , wherein the photovoltaic absorber layer comprises cadmium telluride, the process further comprising:
treating the photovoltaic absorber layer with cadmium chloride prior to heating and quenching.
13. The process of claim 12 , wherein the photovoltaic absorber layer is treated with cadmium chloride via depositing cadmium chloride as a film layer on the cadmium telluride layer prior to annealing the cadmium telluride layer.
14. A process for forming a thin film photovoltaic device, the process comprising:
depositing a cadmium telluride layer on a substrate in a vapor deposition chamber by heating a source material to produce source vapors that deposit onto the substrate, wherein the substrate has a deposition temperature of about 450° C. to about 600° C.;
transporting the substrate from the vapor deposition chamber into an annealing chamber;
heating the substrate to an anneal temperature to anneal the cadmium telluride layer, wherein the anneal temperature is about 575° C. to about 650° C.;
transporting the substrate from the annealing chamber into a quenching chamber;
quenching the glass substrate to cool the glass substrate to a quenched temperature of less than 500° C. in a quenching time of less than 10 seconds, wherein the quenching atmosphere has a quenching pressure of about 1 torr or more, and wherein the quenching atmosphere comprises an inert gas, wherein the quenching chamber comprises a plurality of coolant elements, and wherein each coolant element is configured to reduce the temperature of a surface of the glass substrate in a zone adjacent to the coolant element;
monitoring the temperature across the surface of the glass substrate during quenching at a plurality of points; and
adjusting the plurality of coolant elements to reduce any temperature gradient detected across the surface of the glass substrate.
15. The process of claim 14 , wherein the substrate is transported from the vapor deposition chamber through a second deposition chamber and then into the annealing chamber.
16. The process of claim 15 , further comprising:
transporting the substrate from the vapor deposition chamber into the second deposition chamber, wherein the second vapor deposition chamber comprises a treatment material, wherein the treatment material comprises cadmium chloride; and,
treating the cadmium telluride layer by heating the treatment material to produce treatment vapors that deposit onto the substrate;
thereafter, transporting the substrate from the second vapor deposition chamber to the annealing chamber.
17. The process of claim 14 , further comprising:
oscillating the glass substrate during quenching.