IP Library Patent Application 13281074
Patent Application
App. No. 13/281,074

COMPUTER-READABLE MEDIUM STORING PROCESSOR TESTING PROGRAM

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Quick Facts
Patent No.
US None
App. No.
13/281,074
Abstract

A non-transitory computer-readable medium storing a processor testing program causing a computer to execute a testing process for a processor, the processor having a plurality of pipeline stages for processing an instruction and a controller for providing the pipeline stage with an inter-lock signal for aborting a transition of the instruction between the pipeline stages when a pipeline hazard is expected to occur. The testing process has a timing generating process including: referring to a pipeline-stage combination pattern indicating whether or not an instruction is under process at each pipeline stage and prescribes a processing status to be tested, and timing generating which provides the inter-lock signal, while an instruction included in a test instruction sequence is executed, so that a processing status of the instruction is matched with the processing status to be tested according to an status information.

Claims (23)

1 . A non-transitory computer-readable medium storing a processor testing program causing a computer to execute a testing process for a processor, the processor having a plurality of pipeline stages for processing an instruction and a controller for providing the pipeline stage with an inter-lock signal for aborting a transition of the instruction between the pipeline stages when a pipeline hazard is expected to occur,

the testing process comprising:

referring to a pipeline-stage combination pattern indicating whether or not an instruction is under process at each pipeline stage and prescribes a processing status to be tested at the pipeline stages; and

timing generating which provides the inter-lock signal to the pipeline stage, while an instruction included in a test instruction sequence is executed, so that a processing status of the instruction at the pipeline stages is matched with the processing status to be tested of the pipeline-stage combination pattern according to an status information indicating whether or not the instruction is under process at each pipeline stage.

2 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the plurality of the pipeline stages have a first and a second stages,

the processor has a bypass circuit which bypasses a calculation result of the first stage to the second stage, and

the pipeline-stage combination pattern has a pipeline-stage combination pattern which indicates the instruction being under process at both of the first and the second stages.

3 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the plurality of the pipeline stages have a third stage, and a fourth stage to which an instruction transits from the third stage and which accesses to a shared resource with the processor, and a fifth stage to which an instruction branches from the third stage without transiting to the fourth stage, the fourth stage processing an instruction requiring a plurality of cycles for processing and accessing to the shared resource at the end of the processing of the instruction, and

the timing generating provides the inter-lock signal to the pipeline stage so that the processing status of the instruction at the pipeline stages is matched with the processing status to be tested of the pipeline-stage combination pattern, in which an access to the shared resource simultaneously occurs at the fourth and the fifth stages.

4 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the testing process is executed for all the pipeline-stage combination patterns about each of a plurality of test instruction sequences.

5 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the pipeline-stage combination pattern has a basic pattern, and a derived pattern prescribing a processing status to be tested generated by a transition of the instructions between the pipeline stages from a processing status of the basic pattern, and

the timing generating matches the processing status of the instruction at the pipeline stages with the derived pattern, by the transition of the instructions after matching the processing status of the instruction at the pipeline stages with the basic pattern, while the instruction included in the test instruction sequence is executed.

6 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the plurality of the pipeline stages have a fetch stage for performing a fetch process of the instruction, and

the timing generating provides the inter-lock signal to the pipeline stage to suspend the transition of the instruction of a pipeline stage subsequent to the fetch stage until the fetch process of the instruction is completed at the fetch stage.

7 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the timing generating provides the inter-lock signal to the pipeline stage to abort all the transitions of the instruction between all the pipeline stages, when a inter-lock signal is provided to a certain pipeline stage by the processor.

8 . The non-transitory computer-readable medium storing the processor testing program according to claim 1 , wherein

the testing process performs the timing generating while the computer executing the processor which is described by a Hardware Description Language.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035481/0236 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: TSUJI, MASAYUKI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027256/0166 →