Granted Patent B1

US 8,443,271 · App. 13/284,730 · Granted May 14, 2013

Abstract

Claims (78)

1. A data processing system, the data processing system comprising:

a data decoding system including:

a data decoder circuit operable to apply a data decode algorithm to a decoder input to yield a first decoded output and an indication of at least one point of failure of the first decoded output;

a simplified maximum likelihood value modification circuit operable to identify a symbol of the first decoded output associated with the point of failure, and to modify a subset of values associated with the identified symbol to yield a modified decoded output; and

wherein the data decoder circuit is further operable to apply the data decode algorithm to the decoder input guided by the modified decoded output to yield a second decoded output.

2. The data processing system of claim 1 , wherein the simplified maximum likelihood value modification circuit comprises:

a syndrome calculation circuit operable to calculate a syndrome based upon a number of symbols associated with the point of failure;

an array calculator circuit operable to calculate an array of possible hard decision values across the contributors to the point of failure; and

an index identifier circuit operable to determine a candidate from the array as the identified symbol.

3. The data processing system of claim 2 , wherein the simplified maximum likelihood value modification circuit further comprises:

a likely symbol value selector circuit operable to determine whether the subset of values associated with the identified symbol includes one log likelihood ratio value or two log likelihood ratio values.

4. The data processing circuit of claim 1 , wherein the data processing system is implemented as part of a device selected from a group consisting of: a storage device, and a receiving device.

5. The data processing system of claim 1 , wherein the data processing system is implemented as part of an integrated circuit.

6. The data processing system of claim 1 , wherein the data decode algorithm is a low density parity check algorithm, and wherein the point of failure of the decoded output is a failure of a parity check equation implemented as part of the low density parity check algorithm.

7. The data processing system of claim 6 , wherein the low density parity check algorithm is selected from a group consisting of: a non-binary low density parity check algorithm, and a binary low density parity check algorithm.

8. The data processing system of claim 6 , wherein the low density parity check algorithm is implemented as a belief propagation data decode algorithm.

9. The data processing system of claim 1 , wherein the data processing system further comprises:

a data detector circuit operable to apply a data detection algorithm to a data set to yield a detected output, wherein the decoder input is derived from the detected output.

10. The data processing system of claim 9 , wherein the data detection algorithm is selected from a group consisting of: a maximum a posteriori data detection algorithm and a Viterbi detection algorithm.

11. The data processing system of claim 1 , wherein the data decoder circuit further comprises:

a controller circuit operable to selectively control generation of the modified decoded output.

12. The data processing system of claim 11 , wherein the controller circuit enables generation of the modified decoded output when:

a number of iterations of the data decoder circuit applying the data decode algorithm to the decoder input is greater than a first threshold value;

a number of points of failure corresponding to the first decoded output is less than a second threshold value; and

the number of points of failure corresponding to the first decoded output is the same as the number of points of failure corresponding to a previous decoded output.

13. The data processing system of claim 12 , wherein the first threshold value is three, and the second threshold value is ten.

14. A method for data processing, the method comprising:

applying a data decode algorithm by a data decoder circuit to a decoder input to yield a first decoded output and an indication of at least one point of failure of the first decoded output;

identifying at least a first symbol and a second symbol associated with the point of failure of the first decoded output;

calculating a syndrome including the first symbol and the second symbol;

calculating an array of possible hard decision values across the contributors to the point of failure;

determining an index corresponding to a candidate from the array as an identified symbol;

determining a subset values associated with the identified symbol to be modified;

modifying the subset of values to yield a modified decoded output; and

applying the data decode algorithm by the data decoder circuit to the decoder input guided by the modified decoded output to yield a second decoded output.

15. The method of claim 14 , wherein calculating the syndrome is done in accordance with the following equation:

s

=

∑

i

=

0

M

⁢

v

i

×

e

i

,

wherein v i corresponds to hard decision values of variable nodes corresponding to the point of failure of a check node, M is the number of variable nodes corresponding to the check node, and e i corresponds to edge values connecting the variable nodes to the check node.

16. The method of claim 15 , wherein calculating the array of possible hard decision values across the contributors to the point of failure is done in accordance with the following equation:

Array i,j =( j×e i −1 )− HD i , for iε{ 1,2 , . . . M},jε{ 1,2,3},

wherein j represents the contribution from the calculated syndrome, HD i represents the most likely symbol for a particular instance i, and e i −1 corresponds to an inverse edge value for the particular instance i.

17. The method of claim 16 , wherein determining the index is done in accordance with the following equation:

index j =arg min i ( LLR HD i XOR Array i,j ),

wherein jε{1, 2, 3}, and wherein LLR is a log likelihood ratio of the most likely symbol.

18. A storage device, the storage device comprising:

a storage medium;

a head assembly disposed in relation to the storage medium and operable to provide a sensed signal corresponding to information on the storage medium;

a read channel circuit including:

an analog to digital converter circuit operable to sample an analog signal derived from the sensed signal to yield a series of digital samples;

an equalizer circuit operable to equalize the digital samples to yield a data set;

a data detector circuit operable to apply a data detection algorithm to the data set to yield a detected output; and

a data decoding system including:

a data decoder circuit operable to apply a data decode algorithm to a decoder input to yield a first decoded output and an indication of at least one point of failure of the first decoded output;

a simplified maximum likelihood value modification circuit operable to identify a symbol of the first decoded output associated with the point of failure, and to modify a subset of values associated with the identified symbol to yield a modified decoded output; and

wherein the data decoder circuit is further operable to apply the data decode algorithm to the decoder input guided by the modified decoded output to yield a second decoded output.

19. The storage device of claim 18 , wherein the simplified maximum likelihood value modification circuit comprises:

a syndrome calculation circuit operable to calculate a syndrome based upon a number of symbols associated with the point of failure;

an array calculator circuit operable to calculate an array of possible hard decision values across the contributors to the point of failure;

an index identifier circuit operable to determine a candidate from the array as the identified symbol; and

a likely symbol value selector circuit operable to determine whether the subset of values associated with the identified symbol includes one log likelihood ratio value or two log likelihood ratio values.

20. The storage device of claim 18 , wherein the simplified maximum likelihood value modification circuit further comprises:

a controller circuit operable to selectively control generation of the modified decoded output, wherein the controller circuit enables generation of the modified decoded output when:

a number of iterations of the data decoder circuit applying the data decode algorithm to the decoder input is greater than a first threshold value;

a number of points of failure corresponding to the first decoded output is less than a second threshold value; and

the number of points of failure corresponding to the first decoded output is the same as the number of points of failure corresponding to a previous decoded output.

Assignments (10)