IP Library Granted Patent US 9,552,955
Granted Patent B2
US 9,552,955 · App. 13/291,080 · Granted Jan 24, 2017

Electron source

Inventors: Moritz Beckmann (Cary, NC); Walter Beyerlein (Bubenreuth, DE); Andreas Böhme (Nürnberg, DE); Yuan Cheng (Cary, NC); Jens Fürst (Herzogenaurach, DE); Markus Hemmerlein (Neunkirchen/Br, DE); Houman Jafari (Cary, NC); Jürgen Oelschlegel (Nürnberg, DE); Qi Qiu (Cary, NC); Frank Sprenger (Cary, NC)
Assignees: SIEMENS HEALTHCARE GMBH; NURAY TECHNOLOGY CO, LTD.
H01J35/065H01J3/021H05G1/265H05G1/32H05G1/48H05G1/58H05G1/70H01J2235/068
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Quick Facts
Patent No.
US 9,552,955
App. No.
13/291,080
Granted
Jan 24, 2017
Kind
B2
Abstract

An electron source includes a plurality of electron emission cathodes and at least one control electrode. A gate current regulator is provided for regulation of current flowing through the at least one control electrode.

Claims (26)

1. A system for regulating an electron source, the system comprising:

a plurality of electron emission cathodes operable to release a current;

at least one control electrode;

a gate current regulator configured for regulation of a gate current flowing through the at least one control electrode via a voltage difference between the at least one control electrode and an electron emission cathode of the plurality of electron emission cathodes; and

a gate current measuring unit in a control loop including the gate current regulator, the gate current measuring unit operable to measure the gate current, the gate current being a portion of the current released by the plurality of electron emission cathodes,

wherein an electron current of at least one electron emission cathode of the plurality of electron emission cathodes is proportional to the gate current.

2. The system as claimed in claim 1 , wherein the gate current measuring unit has a substraction circuit in the control loop.

3. The system as claimed in claim 1 , wherein the gate current-measuring unit comprises paired opto-couplers.

4. The system as claimed in claim 1 , wherein the gate current-measuring unit comprises a shunt, an analog-to-digital converter, and an opto-coupler.

5. The system as claimed in claim 1 , wherein the plurality of electron emission cathodes is configured as field emitters or indirectly heated emitters.

6. The system as claimed in claim 5 , wherein the plurality of electron emission cathodes comprises carbon nanotubes or graphene or is configured as dispenser cathodes.

7. The system as claimed in claim 2 , wherein the plurality of electron emission cathodes is configured as field emitters or indirectly heated emitters.

8. The system as claimed in claim 3 , wherein the plurality of electron emission cathodes is configured as field emitters or indirectly heated emitters.

9. The system as claimed in claim 4 , wherein the plurality of electron emission cathodes is configured as field emitters or indirectly heated emitters.

10. A method for the operation of an electron source, the method comprising:

emitting electrons with a plurality of electron emission cathodes, wherein a voltage is applied between the plurality of electron emission cathodes and a control electrode;

regulating, with a gate current regulator, gate current flowing through the control electrode via the voltage applied between an electron emission cathode of the plurality of electron emission cathodes and the control electrode; and

measuring the gate current with a gate current measuring unit in a control loop including the gate current regulator, the gate current comprising a portion of the electrons emitted by the plurality of electron emission cathodes,

wherein an electron current of at least one electron emission cathode of the plurality of electron emission cathodes is proportional to the gate current.

11. The method as claimed in claim 10 , wherein the plurality of electron emission cathodes is operated is a pulsed manner, with pulse times under 1 ms.

12. The method as claimed in claim 10 , further comprising determining a transmission rate of the electron source,

wherein the determining comprises subtracting the gate current flowing through the control electrode from a cathode current flowing through the plurality of electron emission cathodes.

13. The method as claimed in claim 12 , wherein a change in the transmission rate is incorporated into the regulation of the gate current.

14. The method as claimed in claim 11 , wherein the pulse times are under 0.1 ms.

15. The method as claimed in claim 11 , further comprising determining a transmission rate of the electron source,

wherein the determining comprises subtracting the gate current flowing through the control electrode from a cathode current flowing through the plurality of electron emission cathodes.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 066088 FRAME: 0256. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 17, 2024
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 071178/0246 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2023
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 066088/0256 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2016
From: SIEMENS AKTIENGESELLSCHAFT
To: SIEMENS HEALTHCARE GMBH
Reel/Frame 039841/0548 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2016
From: XINRAY SYSTEMS INC
To: NURAY TECHNOLOGY CO, LTD.
Reel/Frame 039841/0551 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2012
From: BECKMANN, MORITZ; CHENG, YUAN; JAFARI, HOUMAN; QIU, QI; SPRENGER, FRANK
To: XINRAY SYSTEMS INC.
Reel/Frame 028035/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2012
From: BEYERLEIN, WALTER; BOEHME, ANDREAS; FUERST, JENS; OELSCHLEGEL, JUERGEN; HEMMERLEIN, MARKUS
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 028037/0170 →
Priority Claims (1)
DE 10 2010 043 561 · Nov 8, 2010 · national
Continuity (1)
Related Publication 20120286692A1 · Nov 15, 2012