Detection circuit with correlated double sampling with improved anti-blooming circuit
View Patent ↗The detection circuit with correlated double sampling comprises two transimpedance amplifiers connected by means of a sampling capacitor. A photodiode is connected to the input of the first transimpedance amplifier. The circuit comprises an anti-blooming circuit connected between the input and output of the first transimpedance amplifier. The anti-blooming circuit comprises means for comparing the output voltage of the first transimpedance amplifier with a setpoint voltage defined by means of the output voltage of the second transimpedance amplifier. The means for comparing are connected to means for applying a feedback current to the input of the first transimpedance amplifier when the difference between the output voltage and the setpoint voltage reaches a limit value.
1. A detection circuit with correlated double sampling comprising:
a first capacitive transimpedance amplifier,
a photodiode connected to an input of the first transimpedance amplifier,
a second capacitive transimpedance amplifier,
a sampling capacitor connected between an output of the first transimpedance amplifier and an input of the second transimpedance amplifier,
an anti-blooming circuit connected between the input and output of the first transimpedance amplifier, the anti-blooming circuit comprising:
a comparator configured to compare the output voltage of the first transimpedance amplifier with a setpoint voltage defined from the output voltage of the second transimpedance amplifier, and
a circuitry configured to apply a feedback current to the input of the first transimpedance amplifier when the difference between the output voltage and the setpoint voltage reaches a limit value.
2. The circuit according to claim 1 , wherein the sampling capacitor presents a variable capacitance according to the voltage difference present between the output of the first transimpedance amplifier and the input of the second transimpedance amplifier.
3. The circuit according to claim 2 , wherein the sampling capacitor is made from a MOS capacitor.
4. The circuit according to claim 1 , wherein the anti-blooming circuit comprises:
a p-type MOS transistor with a first terminal connected to the input of the first transimpedance amplifier and connected to a cathode of the photodiode and a second terminal connected to the output of the first transimpedance amplifier,
a device for applying the setpoint voltage on a control electrode of the transistor,
a device for applying a reference voltage to the first amplifier and a gain voltage to the second amplifier, the reference voltage being lower than the gain voltage.
5. The circuit according to claim 1 , wherein the anti-blooming circuit comprises:
an n-type MOS transistor with a first terminal connected to the input of the first transimpedance amplifier and connected to an anode of the photodiode and a second terminal connected to the output of the first transimpedance amplifier,
a device for applying the setpoint voltage on a control electrode of the transistor,
a device for applying a reference voltage to the first amplifier and a gain voltage to the second amplifier, the reference voltage being higher than the gain voltage.
6. The circuit according to claim 1 , wherein the setpoint voltage is equal to the output voltage of the second transimpedance amplifier.
7. A method for reading a detection circuit, comprising the following steps:
generating a current from a reverse-biased photodiode to an input of a first transimpedance amplifier, an output of the first transimpedance amplifier being connected to an input of a second transimpedance amplifier by a sampling capacitor, each transimpedance amplifier having an input and an output connected by a passive element,
comparing the output voltage of the first transimpedance amplifier with a setpoint voltage defined from the output voltage of the second transimpedance amplifier,
generating a feedback current to the input of the first transimpedance amplifier when the difference between the output voltage and the setpoint voltage reaches a threshold value so as to limit the output voltage of the first transimpedance amplifier.
8. The method according to claim 7 , wherein generation of the feedback current is caused by turn-on of a transistor connecting the input to the output of the first operational amplifier.