Fluorescence microscope
A fluorescence microscope includes: a light source that emits excitation light for exciting a sample; an optical detector that detects fluorescence emitted from the sample excited by the excitation light; a first wavelength selection filter arranged in an optical path leading from the light source to the sample to reflect at least an S-polarized component of the excitation light and transmit the fluorescence; and a second wavelength selection filter arranged in an optical path between the optical detector and the first wavelength selection filter to reflect at least the S-polarized component of the excitation light and transmit the fluorescence. In the fluorescence microscope, light entering and transmitted through the first wavelength selection filter as P-polarized light enters the second wavelength selection filter as S-polarized light.
1. A fluorescence microscope comprising:
a light source that emits excitation light for exciting a sample;
an optical detector that detects fluorescence emitted from the sample excited by the excitation light;
a first wavelength selection filter that is arranged in an optical path leading from the light source to the sample and that reflects at least an S-polarized component of the excitation light and transmits the fluorescence;
a second wavelength selection filter that is arranged in an optical path between the optical detector and the first wavelength selection filter and that reflects at least the S-polarized component of the excitation light and transmits the fluorescence; and
a polarization plane rotating unit that is arranged in an optical path between the first wavelength selection filter and the second wavelength selection filter and that rotates a polarization plane of light by 90 degrees with an optical axis as a rotation axis such that a P-polarized component of the excitation light which entered and was transmitted through the first wavelength selection filter is converted to an S-polarized component of the excitation light by the polarization plane rotating unit and said converted S-polarized component of the excitation light is incident on the second wavelength selection filter and is reflected by the second wavelength selection filter,
wherein a plane including a normal line of the first wavelength selection filter and an incident optical axis of the fluorescence entering the first wavelength selection filter, and a plane including a normal line of the second wavelength selection filter and an incident optical axis of the fluorescence entering the second wavelength selection filter are parallel to each other; and
wherein the normal line of the first wavelength selection filter and the normal line of the second wavelength selection filter are parallel to each other.
2. The fluorescence microscope according to claim 1 , wherein the normal line of the first wavelength selection filter and the incident optical axis of the fluorescence entering the first wavelength selection filter form an angle of 45 degrees, and the normal line of the second wavelength selection filter and the incident optical axis of the fluorescence entering the second wavelength selection filter form an angle of 45 degrees.
3. The fluorescence microscope according to claim 1 , wherein the polarization plane rotating unit is an image rotator.
4. The fluorescence microscope according to claim 1 , wherein the polarization plane rotating unit is a half wavelength plate.
5. The fluorescence microscope according to claim 1 , wherein the polarization plane rotating unit has at least two reflection surfaces.
6. The fluorescence microscope according to claim 1 , wherein a reflection band of the first wavelength selection filter with respect to the S-polarized light and a reflection band of the second wavelength selection filter with respect to the S-polarized light are equal to each other.
7. The fluorescence microscope according to claim 6 , wherein the first wavelength selection filter and the second wavelength selection filter are formed of interference films having the same film compositions with the same wavelength characteristics.