Memory testing system and method of computing device
View Patent ↗In a memory testing method for testing a memory module of a computing device, an operating voltage of the memory module is adjusted to a first voltage or a second voltage. A predetermined data set is written into the memory module after the operating voltage of the memory module is adjusted, and the written data set is read out from the memory module, to accomplish a data writing and reading process of the memory module. A register value that presents how many memory errors have occurred during the data writing and reading process is acquired from an ECC register of the memory module, to determine whether the memory module is stable during the adjusting of the operating voltage according to the register value.
1. A memory testing method for testing a memory module of a computing device, the method comprising:
adjusting an operating voltage of the memory module to a first voltage;
writing a predetermined data set into the memory module, and reading out the written data set from the memory module when the operating voltage of the memory module is adjusted to the first voltage, to accomplish a data writing and reading process of the memory module;
adjusting the operating voltage of the memory module to a second value;
writing the data set into the memory module, and reading out the written data set from the memory module when the operating voltage of the memory module is adjusted to the second value;
acquiring a register value of an error checking and correcting (ECC) register of the memory module after the data writing and reading process is accomplished under the second value, wherein: the first voltage is V+Vr, and the second value is V−Vr, V is a nominal operating voltage or a standard operating voltage of the memory module, and Vr is predetermined according to a range within the operating voltage of the memory module;
determining whether the memory module is stable during the adjusting of the operating voltage of the memory module according to the register value; and
generating a test result indicating how many memory errors have occurred after the data writing and reading process is accomplished under the second value if the memory module is determined to be unstable.
2. The method according to claim 1 , wherein the memory module is determined to be stable if the register value is equal to or less than a predefined value, and wherein the memory module is determined to be unstable if the register value is greater than the predefined value.
3. The method according to claim 1 , wherein the operating voltage of the memory module is adjusted through a basic input output system (BIOS) of the computing device.
4. The method according to claim 1 , wherein the memory module is an ECC memory module that automatically checks and corrects the memory errors occurred during the data writing and reading process using an ECC function.
5. The method according to claim 1 , wherein the register value of the ECC register represents how many memory errors that have occurred during the data writing and reading process.
6. A computing device, comprising:
a memory module;
a storage system;
at least one processor;
one or more programs stored in the storage system and being executable by the at least one processor, the one or more programs comprising:
a voltage adjustment module operable to adjust an operating voltage of the memory module to a first voltage, and adjust the operating voltage of the memory module to a second voltage, wherein: the first voltage is V+Vr, and the second voltage is V−Vr, V is a nominal operating voltage or a standard operating voltage of the memory module, and Vr is predetermined according to a range within the operating voltage of the memory module;
a data reading and writing module operable to write a predetermined data set into the memory module, and reading out the written data set from the memory module when the operating voltage of the memory module is adjusted, to accomplish a data writing and reading process of the memory module; and
a determination module operable to acquire a register value of an error checking and correcting (ECC) register of the memory module after the data writing and reading process is accomplished under the second voltage, and determine whether the memory module is stable during the adjusting of the operating voltage of the memory module according to the register value, and generate a test result indicating how many memory errors have occurred after the data writing and reading process is accomplished under the second voltage if the memory module is determined to be unstable.
7. The computing device according to claim 6 , wherein the memory module is determined to be stable if the register value is equal to or less than a predefined value, and wherein the memory module is determined to be unstable if the register value is greater than the predefined value.
8. The computing device according to claim 6 , wherein the operating voltage of the memory module is adjusted through a basic input output system (BIOS) of the computing device.
9. The computing device according to claim 6 , wherein the memory module is an ECC memory module that automatically checks and corrects the memory errors that occurred during the data writing and reading process using an ECC function.
10. The computing device according to claim 6 , wherein the register value of the ECC register represents how many memory errors have occurred during the data writing and reading process.
11. A non-transitory storage medium storing a set of instructions, the set of instructions capable of being executed by a processor of a computing device, cause the computing device to perform a memory testing method for testing a memory module of the computing device, the method comprising:
adjusting an operating voltage of the memory module to a first voltage;
writing a predetermined data set into the memory module, and reading out the written data set from the memory module when the operating voltage of the memory module is adjusted to the first voltage, to accomplish a data writing and reading process of the memory module;
adjusting the operating voltage of the memory module to a second value;
writing the data set into the memory module, and reading out the written data set from the memory module when the operating voltage of the memory module is adjusted to the second value;
acquiring a register value of an error checking and correcting (ECC) register of the memory module after the data writing and reading process is accomplished under the second value, wherein: the first voltage is V+Vr, and the second value is V−Vr, V is a nominal operating voltage or a standard operating voltage of the memory module, and Vr is predetermined according to a range within the operating voltage of the memory module;
determining whether the memory module is stable during the adjusting of the operating voltage of the memory module according to the register value; and
generating a test result indicating how many memory errors have occurred after the data writing and reading process is accomplished under the second value if the memory module is determined to be unstable.
12. The non-transitory storage medium according to claim 11 , wherein the memory module is determined to be stable if the register value is equal to or less than a predefined value, and wherein the memory module is determined to be unstable if the register value is greater than the predefined value.
13. The non-transitory storage medium according to claim 11 , wherein the operating voltage of the memory module is adjusted through a basic input output system (BIOS) of the computing device.
14. The non-transitory storage medium according to claim 11 , wherein the memory module is an ECC memory module that automatically checks and corrects the memory errors that occurred during the data writing and reading process using an ECC function.
15. The non-transitory storage medium according to claim 11 , wherein the register value of the ECC register represents how many memory errors have occurred during the data writing and reading process.