Semiconductor device
A semiconductor device includes a nonvolatile memory, and an interface configured to transfer data to and from the nonvolatile memory. The interface includes a security logic unit which controls a security level for the data written to the nonvolatile memory, in accordance with a plurality of preset security codes and a lock code that is written to a specific area in the nonvolatile memory.
1. A semiconductor device comprising:
a nonvolatile memory; and
an interface configured to transfer data to and from the nonvolatile memory, wherein
the interface includes a security logic unit which controls a security level for the data written to the nonvolatile memory, in accordance with a plurality of preset security codes and a lock code that is written to a specific area in the nonvolatile memory, and
the security codes include a first security code and a second security code, and wherein
in a test mode for testing the semiconductor device, the security logic unit sets security ON if the first security code matches the lock code, and sets security OFF if the first security code does not match the lock code, and
in a normal mode for operating the semiconductor device, the security logic unit sets security OFF if the second security code matches the lock code, and sets security ON if the second security code does not match the lock code.
2. The semiconductor device as claimed in claim 1 , wherein the security codes further include a third security code, and wherein
in the test mode, if the first security code does not match the lock code, then the security logic unit sets security ON except for some functions if the third security code matches the lock code, and sets security OFF if the third security code does not match the lock code.
3. The semiconductor device as claimed in claim 2 , wherein if the first security code does not match the lock code, but the third security code matches the lock code, the security logic unit permits only a predetermined function to be executed.
4. The semiconductor device as claimed in claim 3 , wherein the predetermined function is a function that is executed by an initial analysis command for fault analysis of the semiconductor device.
5. The semiconductor device as claimed in claim 2 , wherein the second security code includes a code corresponding to data resulting from a total erasure of the nonvolatile memory.
6. The semiconductor device as claimed in claim 5 , wherein the first security code and the third security code are each chosen to be a code that differs from the code corresponding to the data resulting from a total erasure of the nonvolatile memory.
7. The semiconductor device as claimed in claim 2 , wherein the second security code includes a code corresponding to a test pattern used in a pre-shipment test of the nonvolatile memory.
8. The semiconductor device as claimed in claim 7 , wherein the first security code and the third security code are each chosen to be a code that differs from the code corresponding to the test pattern used in the pre-shipment test of the nonvolatile memory.
9. A semiconductor device comprising:
a nonvolatile memory; and
an interface configured to transfer data to and from the nonvolatile memory, wherein
the interface includes a security logic unit which controls a security level for the data written to the nonvolatile memory, in accordance with a plurality of preset security codes and a lock code that is written to a specific area in the nonvolatile memory, and
switching from the normal mode to the test mode is effected by entering a predetermined code from an external device.
10. The semiconductor device as claimed in claim 1 , wherein the specific area is an area to be erased last in an address space of the nonvolatile memory.
11. The semiconductor device as claimed in claim 10 , wherein the nonvolatile memory comprises a plurality of banks, and
the specific area is contained in a bank to be erased last among the plurality of banks.
12. The semiconductor device as claimed in claim 1 , wherein the security codes are each preset in the interface by burn-in using a mask at the time of manufacture or by power supply clamping.
13. The semiconductor device as claimed in claim 1 , wherein security state after startup is ON by default.
14. The semiconductor device as claimed in claim 1 , further comprising a CPU, and wherein
the data written to the nonvolatile memory is a program code for implementing a prescribed function by controlling the CPU.
15. The semiconductor device as claimed in claim 9 , wherein the specific area is an area to be erased last in an address space of the nonvolatile memory.
16. The semiconductor device as claimed in claim 15 , wherein the nonvolatile memory comprises a plurality of banks, and
the specific area is contained in a bank to be erased last among the plurality of banks.
17. The semiconductor device as claimed in claim 9 , wherein the security codes are each preset in the interface by burn-in using a mask at the time of manufacture or by power supply clamping.
18. The semiconductor device as claimed in claim 9 , wherein security state after startup is ON by default.
19. The semiconductor device as claimed in claim 9 , further comprising a CPU, and wherein
the data written to the nonvolatile memory is a program code for implementing a prescribed function by controlling the CPU.