Arrangement of analyzer measuring window
View Patent ↗The invention relates to an arrangement of a measuring window in a continuously operated X-ray analyzer ( 1 ), said analyzer being is used particularly for analyzing elemental contents in solid, liquid or slurry-like materials; which measuring window ( 2 ) separates the sampling space ( 3 ) containing the sample material to be measured and the measurement space ( 4 ) containing the measuring probe ( 11 ), and is sealed by a lid structure ( 6 ) arranged in the sampling space, said lid structure defining the measurement aperture ( 7 ) of the sampling space, in which case the lid structure defining the measurement aperture of the sampling space is provided with a sealing surface ( 8 ) of the measuring window, so that said surface is at least partly planar and at least partly curved.
1. An arrangement of a measuring window in a continuously operated X-ray analyzer ( 1 ), said analyzer being used particularly when analyzing elemental contents in solid, liquid or slurry-like materials, which measuring window ( 2 ) separates a sampling space ( 3 ) containing a sample material to be measured and a measurement space ( 4 ) containing a measuring probe ( 11 ), and is sealed onto a lid structure ( 6 ) arranged in the sampling space, said lid structure ( 6 ) defining a measurement aperture ( 7 ) of the sampling space, characterized in that the lid structure ( 6 ), made of ceramic material, defining the measurement aperture ( 7 ) of the sampling space, is provided with a sealing surface ( 8 ) of the measuring window, said sealing surface ( 8 ) surrounding the measurement aperture ( 7 ) and being at least partly planar and having a curved section, the sealing surface ( 8 ) being elevated with respect to a surface of the lid structure ( 6 ) surrounding the sealing surface ( 8 ).
2. An arrangement of a measuring window according to claim 1 , characterized in that the planar part of the sealing surface ( 8 ) is at least partly vertical.
3. An arrangement of a measuring window according to claim 1 , characterized in that the planar part of the sealing surface ( 8 ) is at least partly conical.
4. An arrangement of a measuring window according to claim 1 , characterized in that the shape of the lid structure defining the measurement aperture of the sampling space is a truncated cone.
5. An arrangement of a measuring window according to claim 1 , characterized in that the radius of curvature (α) of the curved section ( 9 ) of the sealing surface ( 8 ) is preferably 0.3-1.0 millimeters.
6. An arrangement of a measuring window according to claim 1 , characterized in that the width (B) of the sealing surface ( 8 ) of the lid structure is preferably larger than 1 millimeter.
7. An arrangement of a measuring window according to claim 1 , characterized in that in the space left between the measurement space and the sampling space, there is arranged an annular sealing element ( 10 ).
8. An arrangement of a measuring window according to claim 1 , characterized in that the lid structure is made of ceramic material, such as silicon carbide.