IP Library Granted Patent US 8,847,616
Granted Patent B2
US 8,847,616 · App. 13/323,102 · Granted Sep 30, 2014

E-field probe integrated with package lid

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,847,616
App. No.
13/323,102
Granted
Sep 30, 2014
Kind
B2
Abstract

A measurement apparatus is disclosed. The measurement apparatus includes a lid configured to be removably affixed to a microcircuit case. One or more penetrations through the lid allow insertion of a signal-conducting probe. The probe is removably affixed to the lid at the site of the penetration. The probe includes a central conductive pin. The central conductive pin transmits to a connection outside the case a radio-frequency signal inductively received from a source inside the case. The probe also includes a dielectric region radially surrounding a portion of the central conductive pin, and a grounded outer conductive housing radially surrounding the dielectric region and electrically isolated from the central conductive pin by the dielectric region.

Claims (50)

1. A measurement apparatus, the measurement apparatus comprising:

a lid, wherein the lid comprises one or more penetrations through the lid; and

a signal-conducting probe insertable through a penetration of the one or more penetrations, wherein

the probe is removably affixed to the lid at the site of the penetration, and

the probe comprises:

a central conductive pin, wherein the central conductive pin transmits to a connection outside a case to which the lid is removably affixed a radio-frequency signal inductively received from a source inside the case, wherein the central conductive pin is dimensioned to extend at full insertion of the probe within an inductive signal transmission range of a test point on a circuit inside the case without touching the circuit;

a dielectric region radially surrounding a portion of the central conductive pin, and

a grounded outer conductive housing radially surrounding the dielectric region and electrically isolated from the central conductive pin by the dielectric region.

2. The measurement apparatus of claim 1 , wherein the central conductive pin is capacitively coupled to a circuit carrying the radio-frequency signal.

3. The measurement apparatus of claim 1 , further comprising a threaded barrel, wherein the probe is removably affixed to the lid at the site of the penetration by threads of the threaded barrel.

4. The measurement apparatus of claim 1 , wherein the lid comprises an interior surface and an exterior surface and wherein the central conductive pin extends beyond the interior surface and beyond the exterior surface.

5. The measurement apparatus of claim 1 , wherein the outer conductive housing extends beyond the exterior surface but not beyond the interior surface.

6. The measurement apparatus of claim 1 , wherein the lid further comprises a second penetration of the one more penetrations, and wherein the second penetration is configured to receive a bolt for affixing the lid to the case.

7. A method of transmitting a radio-frequency electrical signal, the method comprising:

removably affixing a lid to a case, wherein the case houses a circuit;

inserting a signal-conducting probe through a penetration of the lid, wherein

after insertion, a central conductive pin of the signal-conducting probe sits within an inductive signal transmission range of a test point on the circuit, and

the central conductive pin does not touch the circuit; and

transmitting to a measurement device outside the case a radio-frequency signal inductively received from the test point on the circuit.

8. The method of claim 7 , further comprising

removing the lid from the case;

attaching the lid to a second case; and

transmitting to the measurement device outside the case a radio-frequency signal inductively received from a test point on a second circuit.

9. The method of claim 7 , further comprising characterizing the probe by measuring a frequency response to an input signal for the circuit.

10. The method of claim 7 , wherein the removably affixing the lid to the case further comprises securing the lid by inserting a bolt through a second penetration of the lid.

11. The method of claim 7 , wherein the inserting the signal-conducting probe through the penetration of the lid further comprises screwing the signal-conducting probe into the penetration using threads arranged on an outer conductor of the signal-conducting probe.

12. The method of claim 7 , wherein the inserting the signal-conducting probe through the penetration of the lid further comprises pushing the signal-conducting probe into a friction-fit well formed by the penetration.

13. The method of claim 7 , further comprising determining whether the circuit is in working order by measuring the signal transmitted to the measurement device.

14. A method for fabricating a measurement apparatus, the method comprising:

fabricating a lid with dimensions configured for the lid to be removably affixed to a case;

creating one or more penetrations through the lid;

fabricating a probe by inserting a central conductive pin through a dielectric region surrounded by an outer conductive housing such that

the central conductive pin is electrically isolated from the outer conductive housing by the dielectric region, and

the outer conductive housing is dimensioned for insertion into a penetration of the one or more penetrations;

inserting the signal-conducting probe through the penetration of the one or more penetrations, wherein

the inserting comprises removably affixing the signal-conducting probe to the lid at the site of the penetration; and

trimming the central conductive pin at a length such that the central conductive pin is dimensioned to extend at full insertion of the probe within an inductive signal transmission range of a test point on a circuit inside the case without touching the circuit.

15. The method of claim 14 , wherein the fabricating the probe further comprises inserting the central conductive pin at a position to connect to an external connector outside the case.

16. The method of claim 14 , wherein the fabricating the probe further comprises threading the outer conductive housing.

17. The method of claim 14 , wherein the fabricating the probe further comprises generating a dielectric region that extends beyond neither an outer surface nor an inner surface of the lid at the full insertion.

18. The method of claim 14 , wherein the fabricating the probe further comprises fabricating the outer conductive surface such that the outer conductive surface provides a connection surface to which to removably affix a signal connector.

19. The method of claim 14 , further comprising fabricating a spacer for storing the lid with the probe inserted.

20. A measurement apparatus, the measurement apparatus comprising:

a lid, wherein the lid comprises one or more penetrations through the lid; and

a signal-conducting probe insertable through a penetration of the one or more penetrations, wherein

the probe is removably affixed to the lid at the site of the penetration, and

the probe comprises

a central conductive pin, wherein the central conductive pin transmits to a connection outside a case to which the lid is removably affixed a radio-frequency signal inductively received from a source inside the case, wherein the central conductive pin is capacitively coupled to a circuit carrying the radio-frequency signal;

a dielectric region radially surrounding a portion of the central conductive pin, and

a grounded outer conductive housing radially surrounding the dielectric region and electrically isolated from the central conductive pin by the dielectric region.

Assignments (5)
RELEASE OF SECURITY INTEREST IN PATENTS (REEL/FRAME 057280/0028) Recorded Oct 13, 2023
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: NATIONAL INSTRUMENTS CORPORATION
Reel/Frame 065231/0466 →
RELEASE OF SECURITY INTEREST IN PATENTS (REEL/FRAME 052935/0001) Recorded Oct 13, 2023
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: NATIONAL INSTRUMENTS CORPORATION; PHASE MATRIX, INC.
Reel/Frame 065653/0463 →
SECURITY INTEREST Recorded Jun 18, 2021
From: NATIONAL INSTRUMENTS CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 057280/0028 →
SECURITY INTEREST Recorded Jun 14, 2020
From: NATIONAL INSTRUMENTS CORPORATION; PHASE MATRIX, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 052935/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2011
From: BARNETT, RON JAY
To: NATIONAL INSTRUMENTS CORPORATION
Reel/Frame 027366/0364 →