Expedited memory drive self test
View Patent ↗Expedited memory drive self test, including: determining, by a drive self test module, a base block size for testing a memory drive; determining, by a drive self test module, a block group size for testing a memory drive; determining, by the drive self test module, a percentage of the memory drive to test; and for each block group size of memory in the memory drive: testing for media defects, by the drive self test module, a number of blocks in a block group that corresponds to the percentage of the memory drive to test.
1. A method of expedited memory drive self test, the method comprising:
determining, by a drive self test module, a base block size for testing a memory drive;
determining, by a drive self test module, a block group size for testing the memory drive;
determining, by the drive self test module, a percentage of the memory drive to test; and
for each block group of memory in the memory drive:
testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test.
2. The method of claim 1 wherein the base block size for testing the memory drive is specified by a memory drive testing administrator.
3. The method of claim 1 wherein the percentage of the memory drive to test is specified by a memory drive testing administrator.
4. The method of claim 1 wherein determining, by the drive self test module, a percentage of the memory drive to test further comprises:
determining, by the drive self test module, the total capacity of the memory drive to test;
determining, by the drive self test module, a testing rate for the memory drive to test;
determining, by the drive self test module, a maximum amount of time to dedicate to performing testing operations; and
determining, by the drive self test module, the percentage of the memory drive to test in dependence upon the total capacity of the memory drive to test, the testing rate for the memory drive to test, and the maximum amount of time to dedicate to testing operations.
5. The method of claim 1 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing write operations to blocks under test.
6. The method of claim 1 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing read operations from blocks under test.
7. An apparatus for expedited memory drive self test, the apparatus comprising a computer processor, a computer memory operatively coupled to the computer processor, the computer memory having disposed within it computer program instructions that, when executed by the computer processor, cause the apparatus to carry out the steps of:
determining, by a drive self test module, a base block size for testing a memory drive;
determining, by a drive self test module, a block group size for testing the memory drive;
determining, by the drive self test module, a percentage of the memory drive to test; and
for each block group of memory in the memory drive:
testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test.
8. The apparatus of claim 7 wherein the base block size for testing the memory drive is specified by a memory drive testing administrator.
9. The apparatus of claim 7 wherein the percentage of the memory drive to test is specified by a memory drive testing administrator.
10. The apparatus of claim 7 wherein determining, by the drive self test module, a percentage of the memory drive to test further comprises:
determining, by the drive self test module, the total capacity of the memory drive to test;
determining, by the drive self test module, a testing rate for the memory drive to test;
determining, by the drive self test module, a maximum amount of time to dedicate to performing testing operations; and
determining, by the drive self test module, the percentage of the memory drive to test in dependence upon the total capacity of the memory drive to test, the testing rate for the memory drive to test, and the maximum amount of time to dedicate to testing operations.
11. The apparatus of claim 7 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing write operations to blocks under test.
12. The apparatus of claim 7 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing read operations from blocks under test.
13. A computer program product for expedited memory drive self test, the computer program product disposed upon a non-transitory computer readable storage medium, the computer program product comprises computer program instructions that, when executed, cause a computer to carry out the steps of:
determining, by a drive self test module, a base block size for testing a memory drive;
determining, by a drive self test module, a block group size for testing the memory drive;
determining, by the drive self test module, a percentage of the memory drive to test; and
for each block group of memory in the memory drive:
testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test.
14. The computer program product of claim 13 wherein the base block size for testing the memory drive is specified by a memory drive testing administrator.
15. The computer program product of claim 13 wherein the percentage of the memory drive to test is specified by a memory drive testing administrator.
16. The computer program product of claim 13 wherein determining, by the drive self test module, a percentage of the memory drive to test further comprises:
determining, by the drive self test module, the total capacity of the memory drive to test;
determining, by the drive self test module, a testing rate for the memory drive to test;
determining, by the drive self test module, a maximum amount of time to dedicate to performing testing operations; and
determining, by the drive self test module, the percentage of the memory drive to test in dependence upon the total capacity of the memory drive to test, the testing rate for the memory drive to test, and the maximum amount of time to dedicate to testing operations.
17. The computer program product of claim 13 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing write operations to blocks under test.
18. The computer program product of claim 13 wherein testing for media defects, by the drive self test module, a number of blocks in the block group that corresponds to the percentage of the memory drive to test further comprises performing read operations from blocks under test.
19. The computer program product of claim 13 wherein the computer readable medium further comprises a computer readable storage medium.