Systems and methods for defect detection using exoelectrons
View Patent ↗An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
1. A defect detection system comprising:
an exoemission sensor comprising a conductive layer and an insulating layer, the exoemission sensor mountable to a material of interest and configured to directly receive exoemissions from the material of interest, while in an atmosphere and electrically biased to the material of interest, and to output a signal based upon the received emissions; and
an analysis device configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
2. The defect detection system according to claim 1 , wherein the exoemissions are exoelectrons.
3. The defect detection system according to claim 1 , wherein the exoemission sensor comprises a flexible layer mountable to a surface of the material.
4. The defect detection system according to claim 1 , wherein the exoemission sensor further comprises an adhesive layer intermediate to the conductive layer and the insulating layer and the adhesive layer has openings corresponding to openings in the insulating layer.
5. The defect detection system according to claim 4 , wherein at least part of the insulating layer is configured to sustain an electrical bias between the exoemission sensor and the material of interest.
6. The defect detection system according to claim 4 , wherein the insulating layer is patterned on a surface of the conductive layer.
7. The defect detection system according to claim 1 , wherein:
the insulating layer is patterned on a surface of the conductive layer, and
the analysis device is configured to determine a location of the displacement of the material based upon the signal.
8. The defect detection system according to claim 1 , wherein the analysis device compares a present received signal with a previously received signal, and determines a defect is present in the material based upon the comparison of the present and previously received signals.
9. The defect detection system according to claim 1 , wherein the analysis device is configured to indicate a defect is present in the material at a predetermined level of exoelectron emission.
10. The defect detection system according to claim 1 , wherein the exoemission sensor is configured to satisfy the equation pd<3 Pa-m, where p is equal to atmospheric pressure in units of Pascal and d is equal to a distance between electrodes of the exoemission sensor in units of meters.
11. A method of detecting a defect in a material in an atmosphere, comprising:
placing an exoemission sensor on the material in a test location;
electrically biasing the exoemission sensor to the material of interest;
receiving exoemissions of the material by the sensor, the sensor outputting signals based upon received exoemissions;
comparing a later received signal to a previously received signal;
determining whether a defect is present in the material based upon the comparison.
12. The method according to claim 11 , wherein the exoemissions are exoelectrons emitted from the material when the material is stressed.
13. The method according to claim 11 , wherein the exoemission sensor comprises a flexible layer mountable to a surface of the material.
14. The method according to claim 11 , wherein the exoemission sensor comprises a conductive layer and an insulating layer.
15. The defect detection system according to claim 14 , wherein the insulating layer is configured to sustain an electrical bias between the exoemission sensor and the material of interest.
16. The method according to claim 14 , wherein the insulating layer is patterned on a surface of the conductive layer.
17. The defect detection system according to claim 16 , further comprising determining a location of the displacement of the material based upon the signals.
18. The defect detection system according to claim 11 , wherein placing the exoemission sensor on the material in a test location and receiving the exoemissions are done in an atmosphere such that the equation pd<3 Pa-m, where p is equal to atmospheric pressure in units of Pascal and d is equal to a distance between electrodes of the exoemission sensor in units of meters, is satisfied.
19. An in-atmosphere defect detection system comprising:
at least one flexible exoemission sensor mountable to a material of interest and comprising a conductive layer and a patterned insulating layer disposed on a surface of the conductive layer, the exoemission sensor configured to output signals based upon received exoemission;
wherein the patterned layer is configured to maintain an electrical bias between the exoemission sensor and the material of interest; and an analysis device in communication with the sensor and configured to determine whether a defect in the material exists based upon the signals.
20. The in-atmosphere defect detection system according to claim 19 , wherein the analysis device is configured to generate a fatigue map showing a level of fatigue of the material in a plurality of locations based upon the signals.