Systems and methods for efficiently and accurately detecting changes in spatial feature data
View Patent ↗Systems ( 100 ) and methods ( 300 ) for efficiently and accurately detecting changes in feature data. The methods generally involve: determining first vectors for first features extracted from a first image using pixel information associated therewith; comparing the first vectors with second vectors defined by spatial feature data; classifying the first features into a plurality of classes based on the results of the vector comparisons; and analyzing the first image to determine if any one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in relation to an object represented thereby.
1. A method for efficiently and accurately detecting changes in feature data, comprising:
determining, by at least one electronic circuit, first vectors for first features extracted from a first image;
comparing, by the electronic circuit, the first vectors with pre-defined second vectors;
classifying, by the electronic circuit, the first features into a plurality of classes based on the results of the comparing step; and
analyzing a plurality of chip images to determine if any one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in relation to an object represented thereby, said chip images comprising panned and/or zoomed views of said first image of objects.
2. The method according to claim 1 , wherein the first vectors are determined by converting locations of pixels defining the first features to coordinates of a multi-dimensional space.
3. The method according to claim 1 , wherein the first vectors and the second vectors are compared with each other to determine mathematically which of the first features overlap one or more of second features.
4. The method according to claim 3 , wherein the first features which overlap the second features are classified as “matched features”.
5. The method according to claim 3 , wherein the first features which do not overlap any of the second features are classified as “new features”.
6. The method according to claim 3 , wherein the second features which do not have any overlapping first features are classified as “deleted features”.
7. The method according to claim 1 , further comprising determining, by the electronic circuit, a plurality of confidence values indicating a degree of similarity, difference or overlap between the first features and pre-defined second features.
8. A method for efficiently and accurately detecting changes in feature data, comprising:
determining, by at least one electronic circuit, first vectors for first features extracted from a first image;
comparing, by the electronic circuit, the first vectors with pre-defined second vectors;
classifying, by the electronic circuit, the first features into a plurality of classes based on the results of the comparing step; and
analyzing the first image to determine if an one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in the relation to an object represented thereby;
wherein the analyzing step comprises:
automatically and simultaneously generating a plurality of chip images for the first image, the chip images comprising panned and/or zoomed views of the first image of objects defined by a user-selected feature and other features of the same feature class as the user-selected feature; and
analyzing the plurality of chip images to determine if any one of the first features indicates that a relevant change has occurred in relation to the object represented thereby.
9. The method according to claim 1 , wherein the analyzing step comprises comparing the contents of the first image with the contents of a second image to determine if any one of the first features indicates that a relevant change has occurred in relation to the object represented thereby.
10. The method according to claim 1 , further comprising:
generating at least one color difference image using imagery data for the first image and imagery data for a second image; and
analyzing the color difference image to determine if any one of the features thereof indicates that a relevant change has occurred in relation to the object represented thereby.
11. A system, comprising:
at least one electronic circuit configured to
determine first vectors for first features extracted from a first image,
compare the first vectors with pre-defined second vectors,
classify the first features into a plurality of classes based on the results of the comparing step, and
analyze a plurality of chip images to determine if any one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in relation to an object represented thereby, said chip images comprising panned and/or zoomed views of said first image of objects.
12. The system according to claim 11 , wherein the first vectors are determined by converting locations of pixels defining the first features to coordinates of a multi-dimensional space.
13. The system according to claim 11 , wherein the first vectors and the second vectors are compared with each other to determine mathematically which of the first features overlap one or more second features defined by previously stored data.
14. The system according to claim 13 , wherein the first features which overlap the second features are classified as “matched features”.
15. The system according to claim 13 , wherein the first features which do not overlap any of the second features are classified as “new features”.
16. The system according to claim 13 , wherein the second features which do not have any overlapping first features are classified as “deleted features”.
17. The system according to claim 11 , wherein the electronic circuit is further configured to determine a plurality of confidence values indicating a degree of similarity, difference or overlap between the first features and second features defined by previously stored data.
18. A system, comprising:
at least one electronic circuit configured to
determine first vectors for first features extracted from a first image,
compare the first vectors with pre-defined second vectors,
classify the first features into a plurality of classes based on the results of the comparing step, and
analyze the first image to determine if any one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in relation to an object represented thereby:
wherein the electronic circuit is further configured to
automatically and simultaneously generate a plurality of chip images for the first image, the chip images comprising panned and/or zoomed views of the first image of objects defined by a user-selected feature and other features of the same feature class as the user-selected feature, and
facilitate a user analysis of the plurality of chip images to identify at least one first feature which indicates that a relevant change has occurred in relation to the object represented thereby.
19. The system according to claim 11 , wherein the electronic circuit is further configured to facilitate a user comparison of the contents of the first image with the contents of a second image to identify at least one first feature which indicates that a relevant change has occurred in relation to the object represented thereby.
20. The system according to claim 11 , wherein the electronic circuit is further configured to
generate at least one color difference image using imagery data for the first image and imagery data for a second image, and
facilitate a user analysis of the color difference image to identify at least one feature thereof which indicates that a relevant change has occurred in relation to the object represented thereby.