Encoding information in illumination patterns
View Patent ↗An apparatus for authentication of three-dimensional (3D) structures includes a projector ( 1510 ) for projecting a first pattern of illumination ( 1520 ) on the three-dimensional structure; a sensor ( 1525 ) for detecting a first reflected pattern ( 1540 ) from the three-dimensional structure; a computer ( 1530 ) for analyzing the first reflected pattern for a first pre-determined characteristic; and wherein the computer authenticates the three-dimensional structure if the pre-determined characteristic is present.
1. An apparatus for authentication of three-dimensional (3D) structures comprising:
a projector for projecting a first pattern of illumination on the three-dimensional structure to form a first reflected pattern;
a sensor for detecting the first reflected pattern from the three-dimensional structure;
a computer for calculating an inverse transformation of the first reflected pattern;
wherein the projector projects the inverse transformation of the first reflected pattern on the three-dimensional structure to form a second reflected pattern;
wherein the sensor detects the second reflected pattern;
wherein the computer analyzes the second reflected pattern for a pre-determined characteristic; and
wherein the computer authenticates the three-dimensional structure if the pre-determined characteristic is present.
2. The apparatus of claim 1 wherein analyzing comprises comparing the first reflected pattern to the projected pattern.
3. The apparatus of claim 1 wherein analyzing comprises comparing the first reflected pattern to a database of patterns.
4. The apparatus of claim 1 wherein the predetermined characteristic is the same as the first pattern of illumination.
5. The apparatus of claim 1 further comprising:
wherein the first projector or a second projector projects a second pattern of illumination on the three-dimensional structure;
wherein the sensor detects a third reflected pattern from the three-dimensional structure;
wherein the computer analyzes the third reflected pattern for a second pre-determined characteristic; and
wherein the computer authenticates the three-dimensional structure if the second pre-determined characteristic is present.
6. The apparatus of claim 1 wherein the first pattern of illumination is monochromatic.
7. The apparatus of claim 1 wherein the first pattern of illumination is polychromatic.
8. The apparatus of claim 5 wherein the first pattern of illumination is monochromatic and the second pattern of illumination is polychromatic.