Conductive particle, and anisotropic conductive film, bonded structure, and bonding method
To provide a conductive particle, containing: a core particle; and a conductive layer formed on a surface of the core particle, wherein the core particle is a nickel particle, and wherein the conductive layer is a nickel plating layer a surface of which has a phosphorous concentration of 10% by mass or lower, and the conductive layer has an average thickness of 1 nm to 10 nm.
1. A conductive particle, comprising:
a core particle; and
a conductive layer formed on a surface of the core particle,
wherein the core particle is a nickel particle,
wherein the conductive layer is a nickel plating layer a surface of which has a phosphorous concentration of 0.3% by mass to 6% by mass, and the conductive layer has an average thickness of 1 nm to 10 nm, and
wherein the phosphorous concentration at the surface of the conductive layer is measured by energy dispersion X-ray analysis instrument.
2. The conductive particle according to claim 1 , wherein the surface of the nickel plating layer has a phosphorous concentration of 0.3% by mass to 1.5% by mass.
3. The conductive particle according to claim 2 , wherein the surface of the nickel plating layer has a phosphorous concentration of 0.3% by mass to 0.8% by mass.
4. The conductive particle according to claim 1 , wherein the conductive particle has protrusions at a surface thereof where each protrusion has a pointed edge.
5. An anisotropic conductive film, comprising:
conductive particles; and
a binder resin containing an epoxy resin, an acrylate resin, and both the epoxy resin and the acrylate resin,
wherein each of the conductive particles contains:
a core particle; and
a conductive layer formed on a surface of the core particle,
wherein the core particle is a nickel particle,
wherein the conductive layer is a nickel plating layer a surface of which has a phosphorous concentration of 0.3% by mass to 6% by mass, and the conductive layer has an average thickness of 1 nm to 10 nm, and
wherein the phosphorous concentration at the surface of the conductive layer is measured by energy dispersion X-ray analysis instrument.
6. The anisotropic conductive film according to claim 5 , further comprising at least one selected from the group consisting of a phenoxy resin, an unsaturated polyester resin, a saturated polyester resin, and a urethane resin.
7. The anisotropic conductive film according to claim 5 , further comprising a latent curing agent.
8. The anisotropic conductive film according to claim 5 , further comprising a silane coupling agent.
9. A bonded structure, comprising:
a first circuit member containing an electrode;
a second circuit member containing an electrode, provided so as to face the first circuit member; and
an anisotropic conductive film, provided between the first circuit member and the second circuit member,
wherein the anisotropic conductive film contains:
conductive particles; and
a binder resin containing an epoxy resin, an acrylate resin, and both the epoxy resin and the acrylate resin,
wherein each of the conductive particles contains:
a core particle; and
a conductive layer formed on a surface of the core particle,
wherein the core particle is a nickel particle,
wherein the conductive layer is a nickel plating layer a surface of which has a phosphorous concentration of 0.3% by mass to 6% by mass, and the conductive layer has an average thickness of 1 nm to 10 nm,
wherein the electrode of the first circuit member and the electrode of the second circuit member are electrically connected via the conductive particles, and
wherein the phosphorous concentration at the surface of the conductive layer is measured by energy dispersion X-ray analysis instrument.
10. The bonded structure according to claim 9 , wherein the first circuit member is a flexible circuit board, and the second circuit member is a printed wiring board.
11. The bonded structure according to claim 10 , wherein the electrode of the printed wiring board has indentations formed by embedding the conductive particles.
12. A bonding method, comprising:
bonding an anisotropic conductive film with a first circuit member containing an electrode, or a second circuit member containing an electrode;
aligning the first circuit member and the second circuit member for positioning; and
electrically connecting the electrode of the first circuit member and the electrode of the second circuit member together via the conductive particles,
wherein the anisotropic conductive film contains:
conductive particles; and
a binder resin containing an epoxy resin, an acrylate resin, and both the epoxy resin and the acrylate resin,
wherein each of the conductive particles contains:
a core particle; and
a conductive layer formed on a surface of the core particle,
wherein the core particle is a nickel particle,
wherein the conductive layer is a nickel plating layer a surface of which has a phosphorous concentration of 0.3% by mass to 6% by mass, and the conductive layer has an average thickness of 1 nm to 10 nm, and
wherein the phosphorous concentration at the surface of the conductive layer is measured by energy dispersion X-ray analysis instrument.
13. The bonding method according to claim 12 , wherein the first circuit member is a flexible circuit board, and the second circuit member is a printed wiring board.