IP Library Granted Patent US 8,574,532
Granted Patent B2
US 8,574,532 · App. 13/337,592 · Granted Nov 5, 2013

Method for producing semiconductor crystal, apparatus for crystal production and group 13 element nitride semiconductor crystal

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Quick Facts
Patent No.
US 8,574,532
App. No.
13/337,592
Granted
Nov 5, 2013
Kind
B2
Abstract

A semiconductor crystal is produced through crystal growth in the presence of a solvent in a supercritical and/or subcritical state in a reactor, wherein at least a part of the surface of the reactor and the surface of the member to be used inside the reactor is coated with a platinum group-Group 13 metal alloy coating film.

Claims (14)

1. A method for producing a semiconductor crystal, comprising:

growing a crystal in the presence of a nitrogen-containing solvent and a mineralizer in a reactor; and

coating at least a portion of an inner surface of the reactor and a surface of a member placed inside the reactor with a platinum group-Group 13 metal alloy coating film at a temperature of from 400 to 700° C. and under a pressure of from 80 to 700 MPa,

wherein the member is placed inside the reactor such that the member is separable from the reactor.

2. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating film comprises Ga as the Group 13 metal.

3. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating film comprises Pt as the platinum group metal.

4. The method for producing a semiconductor crystal of claim 1 , wherein the coating comprises coating at least 50% of a total area of the inner surface of the reactor and the surface of the member with the platinum group-Group 13 metal alloy coating film.

5. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating is carried out simultaneously with at least a part of the growing of the crystal.

6. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating film is a film that comprises at least one alloy selected from the group consisting of Ga 3 Pt 5 , Ga 3 Pt 2 , GaPt, Ga 2 Pt, GaPt 2 and GaPt 3 .

7. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating film has a thickness of from 5 to 100 μm.

8. The method for producing a semiconductor crystal of claim 1 , wherein at least one of the growing and the coating is carried out multiple times.

9. The method for producing a semiconductor crystal of claim 1 , wherein the reactor and the member are formed of Pt or a Pt-containing alloy.

10. The method for producing a semiconductor crystal of claim 1 , wherein the coating forms the platinum group-Group 13 metal alloy coating in the reactor in the presence of the nitrogen-containing solvent and a Group 13 metal therein, at a temperature of from 400 to 700° C. and under a pressure of from 100 to 700 MPa.

11. The method for producing a semiconductor crystal of claim 1 , wherein the platinum group-Group 13 metal alloy coating film is polycrystalline.

Assignments (3)
CHANGE OF NAME Recorded Sep 5, 2017
From: MITSUBISHI RAYON CO., LTD.
To: MITSUBISHI CHEMICAL CORPORATION
Reel/Frame 043750/0834 →
MERGER Recorded Sep 4, 2017
From: MITSUBISHI CHEMICAL CORPORATION
To: MITSUBISHI RAYON CO., LTD.
Reel/Frame 043750/0207 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2012
From: FUJISAWA, HIDEO; MIKAWA, YUTAKA
To: MITSUBISHI CHEMICAL CORPORATION
Reel/Frame 027836/0326 →