IP Library Granted Patent US 8,760,883
Granted Patent B2
US 8,760,883 · App. 13/344,864 · Granted Jun 24, 2014

Wiring substrate and manufacturing method thereof

Inventors: Kentaro Kaneko (Nagano, JP); Toshiaki Aoki (Nagano, JP); Kazuhiro Kobayashi (Nagano, JP); Kotaro Kodani (Nagano, JP); Junichi Nakamura (Nagano, JP)
Assignee: Shinko Electric Industries Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,760,883
App. No.
13/344,864
Granted
Jun 24, 2014
Kind
B2
Abstract

A wiring substrate includes plural insulating layers including an outermost insulating layer; and plural wiring layers which are alternately laminated between the insulating layers and include outermost wiring layers exposed from the outermost insulating layer and through wirings having electrode pads on end portions of the through wirings and penetrating through the outermost insulating layer, wherein the electrode pads of the through wirings are exposed from the outermost insulating layer, and a part of the outermost wiring layers overlaps the end portions of the through wirings and is connected to the through wirings.

Claims (21)

1. A wiring substrate comprising:

a plurality of insulating layers including an outermost insulating layer; and

a plurality of wiring layers which are alternately laminated between the insulating layers and include

outermost wiring layers exposed from the outermost insulating layer, and

through wirings having electrode pads on end portions of the through wirings and penetrating through the outermost insulating layer,

wherein the electrode pads of the through wirings are exposed from the outermost insulating layer, and

a part of the outermost wiring layers overlaps the end portions of the through wirings and is connected to the through wirings,

wherein exposed faces of the through wirings and faces opposite to the exposed faces of the through wirings are circular, and

diameters of the exposed faces are smaller than diameters of the opposite faces of the through wirings,

wherein at least one through wiring of the through wirings contacts an upper surface and side surfaces of an end part of the outermost wiring layers,

wherein the outermost insulating layer contacts an upper surface and side surfaces of parts of the outermost wiring layers other than the end part so that the parts of the outermost wiring layers are embedded in the outermost insulating layer.

2. The wiring substrate according to claim 1 ,

wherein exposed faces of the outermost wiring layers, exposed faces of the end portions of the through wirings and a surface of the outermost insulating layer are arranged on the same plane.

3. The wiring substrate according to claim 1 ,

wherein exposed faces of the outermost wiring layers and the exposed faces of the through wirings are recessed from an outermost lower surface of the outermost insulating layer.

4. The wiring substrate according to claim 1 ,

wherein another part of the outermost wiring layers is wired between the adjacent through wirings.

5. The wiring substrate according to claim 1 ,

wherein other electrode pads are exposed from another outermost insulating layer,

the electrode pads are configured to electrically connect a semiconductor chip, and

the other electrode pads are configured to electrically connect another wiring substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2012
From: KANEKO, KENTARO; AOKI, TOSHIAKI; KOBAYASHI, KAZUHIRO; KODANI, KOTARO; NAKAMURA, JUNICHI
To: SHINKO ELECTRIC INDUSTRIES CO., LTD.
Reel/Frame 027492/0526 →
Priority Claims (1)
JP 2011-003423 · Jan 11, 2011 · national
Continuity (1)
Related Publication 20120175153A1 · Jul 12, 2012