IP Library Granted Patent US 8,349,743
Granted Patent B2
US 8,349,743 · App. 13/349,387 · Granted Jan 8, 2013

Method for fabricating light emitting device

Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,349,743
App. No.
13/349,387
Granted
Jan 8, 2013
Kind
B2
Abstract

Disclosed is a method for fabricating a light emitting device. The method includes forming an oxide including gallium aluminum over a gallium oxide substrate, forming a nitride including gallium aluminum over the oxide including gallium aluminum and forming a light emitting structure over the nitride including gallium aluminum.

Claims (18)

1. A method for fabricating a light emitting device comprising:

forming an oxide including gallium aluminum over a gallium oxide substrate;

forming a nitride including gallium aluminum over the oxide including gallium aluminum; and

forming a light emitting structure over the nitride including gallium aluminum.

2. The method of claim 1 , wherein the oxide including gallium aluminum comprises Ga x Al y O z (0 x≦1, 0 y≦1, 0 z≦1).

3. The method of claim 1 , wherein the oxide including gallium aluminum has a thickness of 1 μm or less.

4. The method of claim 1 , wherein the nitride including gallium aluminum comprises Ga x Al y N z (0 x≦1, 0 y≦1, 0 z≦1).

5. The method of claim 1 , wherein forming the light emitting structure comprises:

forming a second conductive semiconductor layer over the nitride including gallium aluminum;

forming an active layer over the second conductive semiconductor layer; and

forming a first conductive semiconductor layer over the active layer.

6. The method of claim 1 , wherein the gallium oxide substrate comprises a Ga 2 O 3 substrate.

7. The method of claim 1 , wherein the oxide including gallium aluminum is formed at a thickness of 1 μm or less.

8. The method of claim 1 , wherein the oxide including gallium aluminum is formed by using a thin film deposition device.

9. The method of claim 1 , wherein the forming the oxide including gallium aluminum comprises:

forming an aluminum layer over the gallium oxide substrate; and

performing a heat treatment with respect to the aluminum layer over the gallium oxide substrate.

10. The method of claim 1 , wherein the nitride including gallium aluminum is formed by using a thin film deposition device.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2022
From: KOHA CO., LTD.
To: TAMURA CORPORATION
Reel/Frame 058547/0853 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: LG INNOTEK CO., LTD.
To: KOHA CO., LTD.; LG INNOTEK CO., LTD.; TAMURA CORPORATION
Reel/Frame 033711/0110 →
Priority Claims (1)
KR 10-2009-0127189 · Dec 18, 2009 · national
Continuity (2)
Continuation 12940718 · Nov 5, 2010
Related Publication 20120115267A1 · May 10, 2012