Barrier and planarization layer for thin-film photovoltaic cell
Thin film photovoltaic cells and methods of manufacturing such cells that include one or more diffusion barrier layers configured to provide a relatively smooth growth surface for subsequent deposition of a p-type semiconductor layer. Diffusion barrier layers according to the present teachings may be amorphous, microcrystalline or nanocrystalline layers of materials including molybdenum, conductive oxides, conductive nitrides, conductive carbides, or mixtures thereof. In some cases a diffusion barrier layer may be configured to have surface roughness less than a predetermined threshold value.
1. A thin-film photovoltaic cell, comprising:
an electrically conductive substrate including substrate components selected from the group consisting of iron and chromium;
a first diffusion barrier layer including an amorphous molybdenum layer disposed above the substrate;
a rear electrode layer formed of polycrystalline molybdenum formed upon the diffusion barrier layer;
a p-type semiconductor layer disposed above the rear electrode layer;
an n-type semiconductor layer disposed above the p-type semiconductor layer;
a front electrode layer disposed above the n-type semiconductor layer; and
a collection grid disposed above the front electrode layer.
2. The thin-film photovoltaic cell of claim 1 , wherein the first diffusion barrier layer includes a material selected from the group consisting of aluminum doped zinc oxide (AZO), tin oxide (SnO), indium tin oxide (ITO), zinc tin oxide (SnZnO) and titanium nitride (TiN).
3. The thin-film photovoltaic cell of claim 1 , wherein the first diffusion barrier layer consists essentially of an amorphous layer of molybdenum.
4. The thin-film photovoltaic cell of claim 1 , wherein the first diffusion barrier layer is a textured layer having a thickness, and a grain size on an order of the thickness.
5. The thin-film photovoltaic cell of claim 1 , further comprising an adhesion layer disposed between the substrate layer and the first diffusion barrier layer.
6. A method of manufacturing a thin-film photovoltaic cell, comprising:
providing an electrically conductive substrate including substrate components selected from the group consisting of iron and chromium, and having a surface with roughness less than a predetermined roughness threshold;
providing a diffusion barrier layer including an amorphous molybdenum layer above the substrate, the diffusion barrier layer having a surface with roughness less than the predetermined roughness threshold;
providing a polycrystalline molybdenum electrode layer above the diffusion barrier layer; and
depositing a p-type semiconductor layer on the electrode layer.
7. The method of claim 6 , further comprising depositing an n-type semiconductor layer on the p-type semiconductor layer to form a p-n junction.
8. The method of claim 7 , wherein the p-type semiconductor layer is a CIGS layer, and the n-type semiconductor layer is a CdS layer.
9. The method of claim 7 , further comprising depositing a transparent conductive oxide layer on the n-type semiconductor layer, and depositing a conductive collection grid on the transparent conductive oxide layer.
10. The method of claim 6 , wherein the predetermined roughness threshold is a profile roughness parameter of 10 nm.
11. The method of claim 6 , wherein the diffusion barrier layer consists essentially of amorphous molybdenum.
12. The method of claim 6 , wherein the diffusion barrier layer includes a material selected from the group consisting of conductive nitrides, conductive oxides, conductive carbides, and mixtures thereof.
13. A method of manufacturing a thin-film photovoltaic cell, comprising:
providing a flexible, electrically conductive substrate including substrate components selected from the group consisting of iron and chromium;
depositing an adhesion layer onto the substrate;
depositing an amorphous diffusion barrier layer onto the adhesion layer, wherein the amorphous diffusion barrier layer includes a layer of amorphous molybdenum;
depositing an electrode layer formed of polycrystalline molybdenum onto the diffusion barrier layer; and
depositing a p-type semiconductor layer onto the electrode layer.
14. The method of claim 13 , wherein the adhesion layer is an amorphous layer of chromium.
15. The method of claim 13 , wherein the diffusion barrier layer has a surface roughness less than a predetermined threshold.
16. The method of claim 13 , wherein the diffusion barrier layer contains sodium.