Method of fabricating an analyzer
View Patent ↗A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.
1. A method of fabricating an analyzer for analyzing a conductive item, comprising:
forming a plurality of conductive row traces at a first level in an insulating substrate;
forming a plurality of conductive column traces at a second level in an insulating substrate;
forming conductive pillars from a surface of the analyzer to the respective conductive row and column traces, whereby a conductive item placed on the surface of the analyzer can be analyzed to determine at least a location or a size thereof;
forming a row multiplexer connected to the conductive row traces, and forming a column multiplexer connected to the conductive column traces; and
forming the row and column multiplexers in a semiconductor substrate which is integral with the analyzer.
2. A method of fabricating an analyzer for analyzing a conductive item, comprising:
forming a plurality of conductive row traces at a first level in an insulating substrate;
forming a plurality of conductive column traces at a second level in an insulating substrate;
forming conductive pillars from a surface of the analyzer to the respective conductive row and column traces, whereby a conductive item placed on the surface of the analyzer can be analyzed to determine at least a location or a size thereof;
forming a row multiplexer connected to the conductive row traces, and forming a column multiplexer connected to the conductive column traces;
obtaining samples of electrical signals received from at least one said multiplexer, and digitizing the samples and storing the digital samples; and
using a comparator for comparing the samples with a threshold voltage to determine a digital value to assign to the sample.
3. A method of fabricating an analyzer for analyzing a conductive item, comprising:
forming a plurality of conductive row traces at a first level in an insulating substrate;
forming a plurality of conductive column traces at a second level in an insulating substrate;
forming conductive pillars from a surface of the analyzer to the respective conductive row and column traces, whereby a conductive item placed on the surface of the analyzer can be analyzed to determine at least a location or a size thereof;
mounting the analyzer in an inkjet printer at a location where a printhead can jet ink droplets on the surface of the analyzer, and analyzing the data received from the analyzer for determining a size and a location of an ink droplet.