IP Library Granted Patent US 8,684,527
Granted Patent B2
US 8,684,527 · App. 13/360,515 · Granted Apr 1, 2014

Ophthalmic diagnostic instrument

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Quick Facts
Patent No.
US 8,684,527
App. No.
13/360,515
Granted
Apr 1, 2014
Kind
B2
Abstract

An eye simulation system for testing wavefront sensor systems, the eye stimulation system comprising a housing having a chamber with an opening for allowing light to enter said chamber, a fluid located in the chamber, said fluid having a known index of refraction, a lens positioned relative to said housing such that light entering the opening of the chamber passes through said lens, and a rotatable imaging surface positioned in said chamber such that light passing through said lens propagates through said fluid and is incident on said rotatable imaging surface.

Claims (36)

1. An eye simulation system for testing wavefront sensor systems, comprising:

a housing having a chamber with an opening for allowing light to enter said chamber;

a fluid located in the chamber, said fluid having a known index of refraction;

a lens positioned relative to said housing such that light entering the opening of the chamber passes through said lens; and

a rotatable imaging surface positioned in said chamber such that light passing through said lens propagates through said fluid and is incident on said rotatable imaging surface.

2. The system of claim 1 , wherein the lens is removable and replaceable with another lens or optical element.

3. The system of claim 1 , wherein the fluid in the chamber is removable and replaceable with another fluid that approximates the index of refraction of a human eye.

4. The system of claim 1 , wherein the rotatable imaging surface is disposed on a shaft, and wherein the shaft is connected to a motor configured to drive the shaft in rotary fashion about a longitudinal axis through the shaft.

5. The system of claim 4 , wherein the shaft comprises a bearing block and is attached to a micrometer stage.

6. The system of claim 5 , wherein the micrometer stage is adjustable to position the lens and the rotatable imaging surface a desired distance apart.

7. The system of claim 1 , wherein the rotation of the imaging surface removes an unwanted feature.

8. The system of claim 7 , wherein the unwanted feature is at least one selected from the group consisting of scratches in the imaging surface and laser speckle.

9. The system of claim 1 , wherein the rotatable imaging surface comprises a rotatable imaging disk.

10. A method of simulating light propagation through an eye, said method comprising:

passing light through a lens disposed in front of a chamber;

focusing the light on an imaging surface in the chamber by adjusting a distance between the lens and the imaging surface;

rotating the imaging surface; and

reflecting light from the imaging surface out of the chamber and through the lens.

11. The method of claim 10 , wherein passing light is provided by a light source.

12. The method of claim 10 , wherein the reflected light is analyzed by a wavefront sensor system.

13. The system of claim 10 , wherein the lens is removable and replaceable with another lens or optical element.

14. The method of claim 10 , wherein rotating the imaging surface further comprises removing the appearance of an unwanted feature.

15. The method of claim 14 , wherein the unwanted feature comprises at least one selected from the group consisting of scratches in the imaging surface and laser speckle.

16. The system of claim 10 , wherein the imaging surface comprises an imaging disk.

17. A method of calibrating a wavefront measuring system utilizing an eye simulation system, said method comprising:

attaching the eye simulating system to the wavefront measuring system;

passing light through a lens disposed in front of a chamber of the eye simulating system;

focusing the light on an imaging surface in the chamber by adjusting a distance between the lens and the imaging surface;

reflecting light from the imaging surface out of the chamber and through the lens, wherein the reflected light comprises a reflected wavefront; and

analyzing the reflected wavefront by the wavefront measuring system.

18. The method of claim 17 , wherein the wavefront measuring system comprises a light source and a wavefront analyzer.

19. The method of claim 18 , wherein the wavefront analyzer comprises at least one selected from the group consisting of a Hartmann-Shack wavefront sensor, a Ray Tracing interferometer sensor, and a Talbot interferometer sensor.

20. The method of claim 17 , where the imaging surface is rotated to remove the appearance of an unwanted feature.

21. The method of claim 20 , wherein the unwanted feature comprises at least one selected from the group consisting of scratches in the imaging surface and laser speckle.

22. The system of claim 17 , wherein the lens is removable and replaceable with another lens or optical element.

23. The system of claim 17 , wherein the imaging surface comprises an imaging disk.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2018
From: ESSILOR INTERNATIONAL (COMPAGNIE GÉNÉRALE D'OPTIQUE)
To: ESSILOR INTERNATIONAL
Reel/Frame 045853/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2013
From: OPHTHONIX, INC.
To: ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE)
Reel/Frame 030797/0092 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2012
From: DILLON, KEITH J.
To: OPHTHONIX, INC.
Reel/Frame 028855/0937 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2012
From: WARDEN, LAURENCE; DREHER, ANDREAS W.; MILLS, GARY D.; LAI, SHUI T.; FOOTE, WILLIAM G.; SANDLER, DAVID G.
To: OPHTHONIX, INC.
Reel/Frame 028855/0946 →