Method and system for standardizing microscope instruments
View Patent ↗Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
1. A method for standardizing a quantitative measurement of target sample data imaged by an optical system having an excitation light source, an optics portion, an image capture portion, and a data storage portion, cooperatively arranged for obtaining an image of the target sample, comprising:
a. obtaining for the excitation light source, a light source correction factor, by temporarily positioning a calibration surface along an optical path;
b. applying the light source correction factor to the target sample data, thereby obtaining a target sample data standardized with regard to light intensity variability; and
c. determining a quantitative measure of the standardized target sample data.
2. The method of claim 1 , in which the optical system is a microscope.
3. The method of claim 2 , wherein the microscope is selected from the group consisting of: optical microscopes using incoherent illumination sources; optical microscopes using polarized illumination sources, optical microscopes using fluorescent illumination sources; microscopes using coherent illumination sources; and combinations thereof.
4. The method of claim 1 , in which the target sample data is obtained from an intensity measurement.
5. The method of claim 1 , wherein obtaining the light source correction factor comprises collecting a relative light intensity measurement substantially coincidentally with the target sample image.
6. The method of claim 1 , in which the calibration surface is included in a calibration instrument installed in the optical system.
7. The method of claim 1 further comprising determining a calibration instrument compensation factor and applying the factor to the target sample data.
8. The method of claim 7 , in which the calibration instrument compensation factor is stored in the data storage portion of the optical system.
9. The method of claim 1 further comprising:
d. obtaining an optical system intrinsic factor; and
e. applying the optical system intrinsic factor to the target sample data before determining the quantitative measurement of the standardized target sample data, the target sample data thereby standardized with regard to optical system intrinsic factors.
10. The method of claim 9 , wherein obtaining the optical system intrinsic factor comprises:
d-1. illuminating by the excitation light source, a calibration target sample configured to produce a standardized response;
d-2. obtaining in response to illuminating the calibration target, measured target sample data; and
d-3. determining the optical system intrinsic factor indicative of relative performance of the optics portion.
11. A computer-usable medium having computer readable instructions stored thereon for execution by a processor to perform a method for standardizing a quantitative measurement of target sample data imaged by an optical system having an excitation light source, an optics portion, an image capture portion, and a data storage portion, cooperatively arranged for obtaining an image of the target sample, where the instructions comprise the steps of:
a. obtaining for the excitation light source, a light source correction factor, by temporarily positioning a calibration surface along an optical path;
b. applying the light source correction factor to the target sample data, thereby obtaining a target sample data standardized with regard to light intensity variability; and
c. determining a quantitative measure of the standardized target sample data.
12. A microscope system for obtaining a standardized quantitative measurement, of target sample data imaged by an optical system having an excitation light source, an optics portion, an image capture portion, and a data storage portion, cooperatively arranged for obtaining an image of the target sample, comprising:
means for obtaining for the excitation light source, a light source correction factor, including means for temporarily positioning a calibration surface along an optical path;
means for applying the light source correction factor to the target sample data, thereby obtaining a target sample data standardized with regard to light intensity variability; and
means for determining a quantitative measure of the standardized target sample data.
13. The microscopy system of claim 12 in which the calibration surface scatters illumination from the excitation light source toward a detection portion of the microscopy system.