High voltage cascoded III-nitride rectifier package utilizing clips on package surface
Some exemplary embodiments of high voltage cascoded III-nitride semiconductor package utilizing clips on a package support surface have been disclosed. One exemplary embodiment comprises a III-nitride transistor attached to a package support surface and having an anode of a diode stacked over a source of the III-nitride transistor, a first conductive clip coupled to a gate of the III-nitride transistor and the anode of the diode, and a second conductive clip coupled to a drain of the III-nitride transistor. The conductive clips are connected to the package support surface and expose respective flat portions that are surface mountable. In this manner, reduced package footprint, improved surge current capability, and higher performance may be achieved compared to conventional wire bonded packages. Furthermore, since a low cost printed circuit board (PCB) may be utilized for the package support surface, expensive leadless fabrication processes may be avoided for cost effective manufacturing.
1. A wire-bondless surface mountable high voltage semiconductor package comprising:
a package support surface;
a III-nitride transistor having a gate, a source, and a drain, said III-nitride transistor attached to said package support surface;
a diode having an anode and a cathode, said diode stacked over said III-nitride transistor such that said cathode is mechanically and electrically coupled to said source;
a first conductive clip connected to said gate of said III-nitride transistor, said anode of said diode, and said package support surface;
a second conductive clip connected to said drain of said III-nitride transistor, and said package support surface;
said first conductive clip and second conductive clip each having respective flat portions for surface mounting said high voltage semiconductor package.
2. The high voltage semiconductor package of claim 1 , wherein said respective flat portions are substantially coplanar.
3. The high voltage semiconductor package of claim 1 , further comprising a glob-top encapsulating said III-nitride transistor and said diode.
4. The high voltage semiconductor package of claim 3 , wherein said glob-top extends beyond top edges of said III-nitride transistor.
5. The high voltage semiconductor package of claim 1 , wherein said first conductive clip is connected to said anode by a connector selected from the group consisting of a coin connector, a mushroom connector, a nail-head, a screw-head, and a straight connector.
6. The high voltage semiconductor package of claim 1 , wherein said first and second conductive clips comprise copper.
7. The high voltage semiconductor package of claim 1 , wherein said package support surface comprises a printed circuit board (PCB).
8. The high voltage semiconductor package of claim 1 , wherein said package support surface includes thermal traces.
9. The high voltage semiconductor package of claim 1 , wherein said diode is a Schottky diode.
10. The high voltage semiconductor package of claim 1 , wherein said III-nitride transistor is a GaN FET.
11. The high voltage semiconductor package of claim 1 , wherein said III-nitride transistor is a GaN HEMT.