Testing of transmitters for communication links by software simulation of reference channel and/or reference receiver

1. A method for testing a transmitter for an optical fiber communications link, the method comprising:

accessing a stored waveform for the transmitter under test, wherein the stored waveform represents an optical output generated by the transmitter in response to a data test pattern applied to the transmitter;

processing the waveform in software to simulate propagation of the waveform through a reference channel and/or a reference receiver to generate a synthesized waveform;

determining a temporal offset between logic transitions of the synthesized waveform and the data test pattern;

temporally shifting the synthesized waveform to generate an aligned synthesized waveform based on the temporal offset;

computing an optical modulation amplitude (OMA) based on the aligned synthesized waveform and the data test pattern; and

calculating a performance metric for the transmitter based on the OMA.

2. The method of claim 1 , wherein determining the temporal offset comprises:

determining a synthesized transition time when the synthesized waveform transitions between a first logic level and a second logic level;

determining an expected transition time identifying a transition between the first logic level and the second logic level; and

calculating a difference between the synthesized transition time and the expected transition time.

3. The method of claim 1 , further comprising:

determining if the transmitter meets compliance for a particular compliance standard based on the calculated performance metric.

4. The method of claim 1 , wherein processing the waveform in software comprises:

modeling the at least one of the reference channel and the reference receiver based on the data test pattern.

5. The method of claim 1 , wherein calculating a performance metric for the transmitter based on the OMA comprises:

determining a bit-error-rate based on a model of the at least one of the reference channel and the reference receiver.

6. The method of claim 5 , wherein determining the bit-error-rate comprises:

determining a noise variance of an input signal to a slicer;

for each of a plurality bits in the data test pattern, determining a probability of error based on at least one of an amplitude of the equalized input signal, the noise variance, and a threshold value; and

determining the bit-error-rate based on an average of the probabilities of errors over the plurality of bits in the data test pattern.

7. The method of claim 1 , wherein accessing the stored waveform comprises:

obtaining the optical output outputted from the transmitter under test in response to the test data pattern;

applying a reference filter to the obtained optical output; and

generating the waveform based on an output of the reference filter.

8. The method of claim 1 , wherein accessing the stored waveform comprises:

obtaining the optical output outputted from the transmitter under test in response to the test data pattern;

pre-processing the obtained optical output to obtain a complete cycle of the data test pattern; and

generating the waveform based on the complete cycle of the data test pattern.

9. The method of claim 1 , wherein processing the waveform in software comprises:

simulating propagation of the waveform through an equalizer.

10. A non-transitory computer-readable storage medium storing computer-executable instructions executable by a processor for testing a transmitter for an optical fiber communications link, the instructions when executed causing the processor to perform steps including:

accessing a stored waveform for the transmitter under test, wherein the stored waveform represents an optical output generated by the transmitter in response to a data test pattern applied to the transmitter;

processing the waveform to simulate propagation of the waveform through at least one of a reference channel and a reference receiver to generate a synthesized waveform;

determining a temporal offset between logic transitions of the synthesized waveform and the data test pattern;

temporally shifting the synthesized waveform to generate an aligned synthesized waveform based on the temporal offset;

computing an optical modulation amplitude (OMA) based on the aligned synthesized waveform and the data test pattern; and

calculating a performance metric for the transmitter based on the OMA.

11. The non-transitory computer-readable storage medium of claim 10 , wherein determining the temporal offset comprises:

determining a synthesized transition time when the synthesized waveform transitions between a first logic level and a second logic level;

determining an expected transition time identifying a transition between the first logic level and the second logic level; and

calculating a difference between the synthesized transition time and the expected transition time.

12. The non-transitory computer-readable storage medium of claim 10 , further comprising:

determining if the transmitter meets compliance for a particular compliance standard based on the calculated performance metric.

13. The non-transitory computer-readable storage medium of claim 10 , wherein processing the waveform comprises:

modeling the at least one of the reference channel and the reference receiver based on the data test pattern.

14. The non-transitory computer-readable storage medium of claim 10 , wherein calculating a performance metric for the transmitter based on the OMA comprises:

determining a bit-error-rate based on a model of the at least one of the reference channel and the reference receiver.

15. The non-transitory computer-readable storage medium of claim 14 , wherein determining the bit-error-rate comprises:

determining a noise variance of an input signal to a slicer;

for each of a plurality bits in the data test pattern, determining a probability of error based on at least one of an amplitude of the equalized input signal, the noise variance, and a threshold value; and

determining the bit-error-rate based on an average of the probabilities of errors over the plurality of bits in the data test pattern.

16. The transitory computer-readable storage medium of claim 10 , wherein processing the waveform in software comprises:

simulating propagation of the waveform through an equalizer.

17. A system for testing a transmitter for an optical fiber communication link, the system comprising:

a processor; and

a non-transitory computer-readable storage medium storing computer-executable instructions executable by the processor, the instructions when executed causing the processor to perform steps including:

accessing a stored waveform for the transmitter under test, wherein the stored waveform represents an optical output generated by the transmitter in response to a data test pattern applied to the transmitter;

processing the waveform to simulate propagation of the waveform through at least one of a reference channel and a reference receiver to generate a synthesized waveform;

determining a temporal offset between logic transitions of the synthesized waveform and the data test pattern;

temporally shifting the synthesized waveform to generate an aligned synthesized waveform based on the temporal offset;

computing an optical modulation amplitude (OMA) based on the aligned synthesized waveform and the data test pattern; and

calculating a performance metric for the transmitter based on the OMA.

18. The system of claim 17 , wherein determining the temporal offset comprises:

determining a synthesized transition time when the synthesized waveform transitions between a first logic level and a second logic level;

determining an expected transition time identifying a transition between the first logic level and the second logic level; and

calculating a difference between the synthesized transition time and the expected transition time.

19. The system of claim 17 further comprising:

a reference filter to receive the optical output outputted from the transmitter under test in response to the test data pattern and to generate the waveform.

20. The system of claim 17 , further comprising:

a pre-processor to receive the optical output outputted from the transmitter under test in response to the test data pattern, to pre-process the optical output to obtain a complete cycle of the data test pattern, and to generate the waveform based on the complete cycle of the data test pattern.