Backscatter energy analysis for classification of materials based on positional non-commutativity
View Patent ↗A system and methods for characterizing regions within, or on, an inspected object, wherein a lower-Z scattering material and a higher-Z material may both lie along a common line of sight. The inspected object is scanned with penetrating radiation characterized by an energy distribution, and penetrating radiation scattered by the inspected object is detected in a manner that generates two detector signals that distinguish between materials of higher and lower effective atomic number under distinct sets of conditions with respect to the energy distribution of the penetrating radiation. An image is generated, based on a function of the two detector signals, as is a differential image, so as to allow distinction of higher-Z and lower-Z materials.
1. A method for characterizing regions within an inspected object wherein at least one of a lower-Z scattering material and a higher-Z scattering material lies along a single line of sight, the method comprising:
a. scanning the inspected object with penetrating radiation emitted by a source characterized by an energy distribution;
b. detecting penetrating radiation scattered by the inspected object in a manner generating a first detector signal that distinguishes between materials of higher and lower effective atomic number under a first set of conditions with respect to the energy distribution of the penetrating radiation;
c. detecting penetrating radiation scattered by the inspected object in a manner generating a second detector signal that distinguishes between materials of higher and lower effective atomic number under a second set of conditions with respect to the energy distribution of the penetrating radiation;
d. generating a differential image based on a function of the first and the second detector signals; and
e. determining placement of materials of lower Z and higher Z within a single line of sight relative to the source, based at least on the differential image.
2. A method in accordance with claim 1 , wherein scanning the inspected object with penetrating radiation characterized by an energy distribution comprises sequentially scanning the inspected object with penetrating radiation characterized by a first energy distribution and a second energy distribution.
3. A method in accordance with claim 1 or claim 2 , further comprising a step of ascertaining relative placement of a lower-Z region with respect to a higher-Z region within the inspected object based at least on values of respective regions within the differential image.
4. A method in accordance with claim 1 or claim 2 , wherein respective regions are defined, in whole or in part, based upon segmentation.
5. A method in accordance with claim 1 or claim 2 , wherein the penetrating radiation is x-ray radiation.
6. A system for characterizing regions within an inspected object, the system comprising:
a. a source of penetrating radiation for generating a beam of penetrating radiation;
b. a scanner for scanning the penetrating radiation across the inspected object;
c. an energy discriminating means for distinguishing scattered penetrating radiation detected under a first set of conditions with respect to an energy distribution of scattered penetrating radiation and under a second set of conditions with respect to an energy distribution of scattered penetrating radiation;
d. an image generator for generating a first image based on a function of the radiation detected under only one of the first and second set of conditions with respect to the energy distribution; and
e. a difference image generator for generating a differential image based on a function of the radiation detected under the first set of conditions and the radiation detected under the second set of conditions with respect to the energy distribution.
7. A system in accordance with claim 6 , wherein the energy discriminating means comprises
a. a first detector characterized by a first response distribution as a function of detected energy and
b. a second detector characterized by a second response distribution as a function of detected energy.
8. A system in accordance with claim 6 , wherein the source of penetrating radiation is an x-ray tube.
9. A system in accordance with claim 7 , wherein the first and second detectors are disposed on respective sides of the source of penetrating radiation.
10. A system in accordance with claim 7 , wherein the first and second detectors are disposed on each side of the source of penetrating radiation.