Point-line converter
An X-ray optical configuration for irradiation of a sample ( 1 ) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source ( 2 ) and a beam-conditioning X-ray optics, is characterized in that the X-ray source ( 2 ) comprises a brilliant point source ( 4 ) and the X-ray optics comprises an X-ray optical element ( 3 ) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.
1. An X-ray optical configuration for irradiation of a sample, the configuration generating an X-ray beam having a line-shaped cross-section, the configuration comprising:
a brilliant X-ray point source; and
a beam-conditioning X-ray optics, said X-ray optics comprising an X-ray optical element for conditioning X-ray radiation emitted by said point source in such a fashion that the X-ray beam is rendered parallel in a direction perpendicular to a beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction.
2. The configuration of claim 1 , wherein an aspect ratio A Q of said point source is 1≦A Q ≦1.5 and an aspect ratio A S of a beam cross-section in an area of the sample is A S ≧2.
3. The configuration of claim 1 , wherein said X-ray optical element comprises a Kirkpatrick-Baez mirror system.
4. The configuration of claim 1 , wherein said X-ray optical element comprises a Montel mirror system.
5. The configuration of claim 1 , wherein said X-ray optical element is structured to rotate about an axis of said beam propagation direction.
6. The configuration of claim 5 , wherein said X-ray optical element can be rotated about the axis of said beam through 90°.
7. The configuration of claim 1 , wherein said brilliant point source comprises a rotating anode and a microfocus source or a liquid metal configuration.
8. The configuration of claim 1 , further comprising a collimator disposed in an area of the sample for collimating-down the X-ray beam, having a line-shaped cross-sectional profile, to a beam profile with point-shaped beam cross-section.
9. The configuration of claim 1 , wherein focussing X-ray optics consists essentially of said X-ray optical element.
10. The configuration of claim 1 , further comprising a monochromator disposed between said X-ray optical element and the sample.
11. An X-ray optical element structured for use in the X-ray optical configuration of claim 1 , wherein the X-ray optical element is structured to image a point on a line focus.
12. An X-ray analysis device comprising the X-ray optical configuration of claim 1 .