IP Library Granted Patent US 8,431,042
Granted Patent B2
US 8,431,042 · App. 13/401,210 · Granted Apr 30, 2013

Solid state scintillator material, solid state scintillator, radiation detector, and radiation inspection apparatus

Inventors: Yukihiro Fukuta (Yokohama, JP); Takao Sawa (Yokohama, JP); Makoto Hayashi (Yokohama, JP)
Assignees: Kabushiki Kaisha Toshiba; Toshiba Materials Co., Ltd.
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Quick Facts
Patent No.
US 8,431,042
App. No.
13/401,210
Granted
Apr 30, 2013
Kind
B2
Abstract

In an embodiment, a solid state scintillator material includes a composition represented by a general formula: (Gd 1-α-β-γ TB α Lu β Ce γ ) 3 (Al 1-x Ga x ) a O b , where α and β are numbers satisfying 0<α≦0.5, 0<β≦0.5, and α+β≦0.85, γ is a number satisfying 0.0001≦γ≦0.1, x is a number satisfying 0<x<1, a is a number satisfying 4.8≦a≦5.2 and b is a number satisfying 11.6≦b≦12.4 (atomic ratio), and a garnet structure.

Claims (35)

1. A solid state scintillator material, comprising:

a composition represented by a general formula:

(Gd 1-α-β-γ Tb α Lu β Ce γ ) 3 (Al 1-x Ga x ) a O b

where, α and β are numbers satisfying 0<α≦0.5, 0<β≦0.5, and α+β≦0.85 (atomic ratio),

γ is a number satisfying 0.0001≦γ≦0.1 (atomic ratio),

x is a number satisfying 0<x<1 (atomic ratio),

a is a number satisfying 4.8≦a≦5.2 (atomic ratio),

b is a number satisfying 11.6≦b≦12.4 (atomic ratio); and

a garnet structure,

wherein the material contains Ba in a range of 10 to 200 mass ppm, and

wherein a ratio (I p /I G ) of a maximum peak intensity I p of a perovskite phase with respect to a maximum peak intensity I G of a garnet phase by X-ray diffraction is 0.01 or less (including zero).

2. The material according to claim 1 , wherein the α is 0.1≦α≦0.48, the β is 0.001≦β≦0.49, and the x is 0.01≦x≦0.8.

3. The material according to claim 1 , wherein an F content of the material is 300 mass ppm or less (including zero).

4. The material according to claim 1 , wherein an emission spectrum obtained by exciting the material with X-rays has a maximum emission peak in a range of 530 to 560 nm, and includes a sharp spectrum and a broad spectrum.

5. A solid state scintillator comprising a polycrystalline body of an oxide,

wherein the oxide polycrystalline body comprises:

a composition represented by a general formula:

(Gd 1-α-β-γ Tb α Lu β Ce γ ) 3 (Al 1-x Ga x ) a O b

where, α and β are numbers satisfying 0<α≦0.5, 0<β≦0.5, and α+β≦0.85 (atomic ratio),

γ is a number satisfying 0.0001≦γ≦0.1 (atomic ratio),

x is a number satisfying 0<x<1 (atomic ratio),

a is a number satisfying 4.8≦a≦5.2 (atomic ratio),

b is a number satisfying 11.6≦b≦2.4 (atomic ratio); and

a garnet structure,

wherein the oxide polycrystalline body contains Ba in a range of 10 to 200 mass ppm, and

wherein a ratio (I p /I G ) of a maximum peak intensity I p of a perovskite phase with respect to a maximum peak intensity I G of a garnet phase by X-ray diffraction of the oxide polycrystalline body is 0.01 or less (including zero).

6. The scintillator according to claim 5 , wherein the α is 0.1≦α≦0.48, the β is 0.001≦β≦0.49, and the x is 0.01≦x≦0.8.

7. The scintillator according to claim 5 , wherein an F content of the oxide polycrystalline body is 300 mass ppm or less (including zero).

8. The scintillator according to claim 5 , wherein an emission spectrum obtained by exciting the oxide polycrystalline body with X-rays has a maximum emission peak in a range of 530 to 560 nm, and includes a sharp spectrum and a broad spectrum.

9. The scintillator according to claim 5 , wherein the oxide polycrystalline body has an average crystal grain diameter in a range of 2 to 50 μm.

10. The scintillator according to claim 5 , wherein diffuse transmittance at a wavelength of 680 nm is 50% or more.

11. The scintillator according to claim 5 , wherein a decay time in which afterglow becomes 5% is 4 ms or less.

12. The scintillator according to claim 5 , wherein the oxide polycrystalline body has a relative density of 99.5% or more.

13. A radiation detector comprising the solid state scintillator according to claim 5 .

14. A radiation inspection apparatus comprising the radiation detector according to claim 13 .

Assignments (4)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2012
From: FUKUTA, YUKIHIRO; SAWA, TAKAO; HAYASHI, MAKOTO
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
Reel/Frame 027741/0657 →
Continuity (1)
Related Publication 20120145962A1 · Jun 14, 2012