IP Library Granted Patent US 8,943,682
Granted Patent B2
US 8,943,682 · App. 13/406,665 · Granted Feb 3, 2015

Making micro-wires with different heights

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Quick Facts
Patent No.
US 8,943,682
App. No.
13/406,665
Granted
Feb 3, 2015
Kind
B2
Abstract

A method of making a transparent touch-responsive capacitor apparatus includes providing a transparent conductor precursor structure including a transparent substrate, a first precursor material layer formed over the transparent substrate and a second precursor material layer formed on the first precursor material layer; forming a electrically connected first micro-wires in the first and second precursor material layers; forming electrically connected second micro-wires in a precursor material layer electrically connected to the first micro-wires; and wherein the height of at least a portion of the first micro-wires is greater than the height of at least a portion of the second micro-wires, and wherein the total area occupied by the first micro-wires is less than 15% of the first transparent conductor area and the total area occupied by the second micro-wires is less than 15% of the second transparent conductor area.

Claims (55)

1. A method of making a transparent conductor structure, comprising:

providing a transparent conductor precursor structure including a transparent substrate, a first precursor material layer formed over the transparent substrate and a second precursor material layer formed on the first precursor material layer;

forming within a first transparent conductor area a plurality of electrically connected first micro-wires in the first and second precursor material layers;

forming within a second transparent conductor area a plurality of electrically connected second micro-wires in either the first precursor material layer or the second precursor material layer, the second micro-wires electrically connected to the first micro-wires;

wherein the first and second transparent conductor areas are non-overlapping areas over the transparent substrate; and

wherein the height of at least a portion of the first micro-wires is greater than the height of at least a portion of the second micro-wires, and wherein the total area occupied by the first micro-wires is less than 15% of the first transparent conductor area and the total area occupied by the second micro-wires is less than 15% of the second transparent conductor area.

2. The method according to claim 1 , further including:

forming the first and second precursor material layers by forming first and second photo-sensitive layers of spectrally photo-sensitive precursor material on the transparent substrate, the first photo-sensitive layer sensitive to a first spectrum and the second photo-sensitive layer sensitive to a second spectrum different from the first spectrum.

3. The method according to claim 2 , wherein the first photo-sensitive layer includes a first spectrally-sensitive radiation-absorbing material and the second photo-sensitive layer includes a second spectrally-sensitive radiation-absorbing material different from the first spectrally-sensitive radiation-absorbing material.

4. The method according to claim 1 wherein the first precursor material layer is photosensitive to a first-spectrum light and the second precursor material layer is photosensitive to a second-spectrum light different from the first spectrum.

5. The method according to claim 4 wherein the first precursor material layer is also photosensitive to the second-spectrum light and the second precursor material layer is substantially insensitive to first-spectrum light.

6. The method according to claim 4 further comprising:

pattern-wise exposing the transparent precursor material structure in the first transparent conductor area to second-spectrum light, and optionally to first-spectrum light, defining the plurality of electrically connected first micro-wires;

pattern-wise exposing the transparent conductive precursor structure in the second transparent conductor area to first-spectrum light defining the plurality of electrically connected second micro-wires; and

processing the exposed transparent conductive precursor structure thereby forming the plurality first and second micro-wires.

7. The method according to claim 6 wherein the first and second precursor material layers each include a photosensitive precursor material provided in a binder material.

8. The method according to claim 7 wherein the photosensitive precursor material includes silver halide and the binder material is gelatin.

9. The method according to claim 6 wherein the first and second precursor material layers each include a metallic particulate material or a metallic precursor material, and a photosensitive binder material.

10. The method according to claim 6 , further including curing the exposed portions of the first and second photo-sensitive layers and removing the uncured portions to form the first or second micro-wires.

11. The method according to claim 6 , further including curing the unexposed portions of the first and second photo-sensitive layers and removing the uncured portions to form the first or second micro-wires.

12. The method according to claim 2 , wherein the first and second photo-sensitive layers include conductive ink, conductive particles, or metal ink.

13. The method according to claim 1 wherein the transparent conductive structure includes a plurality of first and second transparent conductor areas.

14. The method according to claim 1 , further including forming the first micro-wires in a first step and forming the second micro-wires in a second step different from the first step.

15. The method according to claim 1 , further including forming the one or more first micro-wires and a portion of each of the one or more second micro-wires in a first step and forming the remainder of the one or more first micro-wires in a second step after the first step.

16. The method according to claim 15 , further including:

forming the first precursor material layer by pattern-wise depositing first precursor material in the first transparent conductor area and in the transparent conductor second area; and

forming the second precursor material layer by pattern-wise depositing second precursor material in the first area.

17. The method according to claim 1 , further including the pattern-wise transfer of precursor material from a source to the transparent substrate.

18. The method according to claim 1 , further including blanket-coating the transparent substrate with a material and pattern-wise exposing the blanket-coated material.

19. The method according to claim 1 , further including pattern-wise depositing material with an inkjet device or by transferring the material from a printing plate.

20. The method according to claim 1 , wherein the first or second materials are precursor materials and further including processing the precursor materials to become conductive materials.

21. The method according to claim 1 , further including providing the transparent substrate, forming the first precursor material layer over the transparent substrate and forming the second precursor material layer over the first precursor material layer.

22. A method of making a transparent conductor structure, comprising:

providing a transparent conductor precursor structure including a transparent substrate, a first precursor material layer formed over the transparent substrate and a second precursor material layer formed on the first precursor material layer;

forming within a first transparent conductor area a plurality of electrically connected first micro-wires in the first and second precursor material layers;

forming within a second transparent conductor area a plurality of electrically connected second micro-wires in either the first precursor material layer or the second precursor material layer, the second micro-wires electrically connected to the first micro-wires; and

wherein the height of at least a portion of the first micro-wires is greater than the height of at least a portion of the second micro-wires, and wherein the total area occupied by the first micro-wires is less than 15% of the first transparent conductor area and the total area occupied by the second micro-wires is less than 15% of the second transparent conductor area; and

further including:

forming the one or more first micro-wires and a portion of each of the one or more second micro-wires in a first step and forming the remainder of the one or more first micro-wires in a second step after the first step;

forming the first precursor material layer by depositing first precursor material in the first transparent conductor area and in the second transparent conductor area;

pattern-wise processing the first precursor material;

forming the second precursor material layer by depositing second precursor material in the first transparent conductor area; and

pattern-wise processing the second precursor material.

23. The method according to claim 22 , wherein the deposition includes blanket-coating the transparent substrate and further including pattern-wise exposing the blanket coating.

24. The method according to claim 23 , further including curing the pattern-wise exposed blanket coating.

25. A method of making a transparent conductor structure, comprising:

providing a transparent conductor precursor structure including a transparent substrate, a first precursor material layer formed over the transparent substrate and a second precursor material layer formed on the first precursor material layer;

forming within a first transparent conductor area a plurality of electrically connected first micro-wires in the first and second precursor material layers;

forming within a second transparent conductor area a plurality of electrically connected second micro-wires in either the first precursor material layer or the second precursor material layer, the second micro-wires electrically connected to the first micro-wires; and

wherein the height of at least a portion of the first micro-wires is greater than the height of at least a portion of the second micro-wires, wherein the total area occupied by the first micro-wires is less than 15% of the first transparent conductor area and the total area occupied by the second micro-wires is less than 15% of the second transparent conductor area, and wherein the first precursor material layer is photosensitive to a first-spectrum light and the second precursor material layer is photosensitive to a second-spectrum light different from the first spectrum; and

further comprising:

pattern-wise exposing the transparent precursor material structure in the first transparent conductor area to first-spectrum light and second-spectrum light, defining the plurality of electrically connected first micro-wires;

pattern-wise exposing the transparent conductive precursor structure in the second transparent conductor area to first- or second-spectrum light defining the plurality of electrically connected second micro-wires; and

processing the exposed transparent conductive precursor structure thereby forming the plurality first and second micro-wires.

26. The method according to claim 25 wherein the first and second precursor material layers each include a photosensitive precursor material provided in a binder material.

Assignments (13)
NOTICE OF SECURITY INTERESTS Recorded Mar 4, 2021
From: EASTMAN KODAK COMPANY
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 056984/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Mar 4, 2021
From: EASTMAN KODAK COMPANY
To: ALTER DOMUS (US) LLC
Reel/Frame 056734/0233 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Mar 4, 2021
From: EASTMAN KODAK COMPANY
To: ALTER DOMUS (US) LLC
Reel/Frame 056734/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Mar 4, 2021
From: EASTMAN KODAK COMPANY
To: ALTER DOMUS (US) LLC
Reel/Frame 056733/0681 →
RELEASE OF SECURITY INTEREST Recorded Jan 24, 2020
From: BARCLAYS BANK PLC
To: EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; FPC INC.; KODAK (NEAR EAST) INC.; KODAK AMERICAS LTD.; KODAK REALTY INC.; LASER PACIFIC MEDIA CORPORATION; QUALEX INC.; KODAK PHILIPPINES LTD.; NPEC INC.
Reel/Frame 052773/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 30, 2019
From: JP MORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; PFC, INC.; KODAK (NEAR EAST), INC.; KODAK AMERICAS, LTD.; KODAK IMAGING NETWORK, INC.; KODAK PORTUGUESA LIMITED; KODAK REALTY, INC.; LASER PACIFIC MEDIA CORPORATION; PAKON, INC.; QUALEX, INC.; KODAK PHILIPPINES, LTD.; NPEC, INC.; CREO MANUFACTURING AMERICA LLC; KODAK AVIATION LEASING LLC
Reel/Frame 049901/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 22, 2019
From: JP MORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: QUALEX, INC.; EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; FPC, INC.; KODAK (NEAR EAST), INC.; KODAK AMERICAS, LTD.; KODAK IMAGING NETWORK, INC.; KODAK PORTUGUESA LIMITED; KODAK REALTY, INC.; LASER PACIFIC MEDIA CORPORATION; PAKON, INC.; KODAK PHILIPPINES, LTD.; NPEC, INC.; CREO MANUFACTURING AMERICA LLC; KODAK AVIATION LEASING LLC
Reel/Frame 050239/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT (ABL) Recorded Sep 5, 2013
From: EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; FPC INC.; KODAK (NEAR EAST), INC.; KODAK AMERICAS, LTD.; KODAK IMAGING NETWORK, INC.; KODAK PORTUGUESA LIMITED; KODAK REALTY, INC.; LASER-PACIFIC MEDIA CORPORATION; PAKON, INC.; QUALEX INC.; KODAK PHILIPPINES, LTD.; NPEC INC.; CREO MANUFACTURING AMERICA LLC; KODAK AVIATION LEASING LLC
To: BANK OF AMERICA N.A., AS AGENT
Reel/Frame 031162/0117 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT (SECOND LIEN) Recorded Sep 5, 2013
From: EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; FPC INC.; KODAK (NEAR EAST), INC.; KODAK AMERICAS, LTD.; KODAK IMAGING NETWORK, INC.; KODAK PORTUGUESA LIMITED; KODAK REALTY, INC.; LASER-PACIFIC MEDIA CORPORATION; PAKON, INC.; QUALEX INC.; KODAK PHILIPPINES, LTD.; NPEC INC.; CREO MANUFACTURING AMERICA LLC; KODAK AVIATION LEASING LLC
To: BARCLAYS BANK PLC, AS ADMINISTRATIVE AGENT
Reel/Frame 031159/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT (FIRST LIEN) Recorded Sep 5, 2013
From: EASTMAN KODAK COMPANY; FAR EAST DEVELOPMENT LTD.; FPC INC.; KODAK (NEAR EAST), INC.; KODAK IMAGING NETWORK, INC.; KODAK PORTUGUESA LIMITED; KODAK REALTY, INC.; LASER-PACIFIC MEDIA CORPORATION; PAKON, INC.; QUALEX INC.; KODAK PHILIPPINES, LTD.; NPEC INC.; CREO MANUFACTURING AMERICA LLC; KODAK AVIATION LEASING LLC; KODAK AMERICAS, LTD.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE
Reel/Frame 031158/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Sep 5, 2013
From: CITICORP NORTH AMERICA, INC., AS SENIOR DIP AGENT; WILMINGTON TRUST, NATIONAL ASSOCIATION, AS JUNIOR DIP AGENT
To: EASTMAN KODAK COMPANY; PAKON, INC.
Reel/Frame 031157/0451 →
PATENT SECURITY AGREEMENT Recorded Apr 1, 2013
From: EASTMAN KODAK COMPANY; PAKON, INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION, AS AGENT
Reel/Frame 030122/0235 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2012
From: COK, RONALD STEVEN; O'TOOLE, TERRENCE ROBERT
To: EASTMAN KODAK COMPANY
Reel/Frame 027772/0526 →