Gyroscope and devices with structural components comprising HfO2-TiO2 material
View Patent ↗Disclosed are devices, materials, systems, and methods, including a device that includes one or more structural components, at least one of the one or more structural components comprising substantially HfO 2 —TiO 2 material. Also disclosed is a hemispherical resonator that includes a hemisphere including one or more structural components with at least one of the one or more structural components comprising substantially HfO 2 —TiO 2 material, a forcer electrode configured to apply an electrical force on the hemisphere to cause the hemisphere to oscillate, and one or more sensor electrodes disposed in proximity to the hemisphere and configured to sense an orientation of a vibration pattern of the hemispherical resonator gyroscope.
1. A device comprising:
one or more structural components, at least one of the one or more structural components comprising substantially HfO 2 —TiO 2 material, the at least one of the one or more structural components comprising a hemispherical shell of a hemispherical resonator gyroscope.
2. The device of claim 1 , wherein the at least one of the one or more structural components includes a portion comprising entirely HfO 2 —TiO 2 material such that the portion independently provides structural integrity to the at least one of the one or more structural components.
3. The device of claim 1 , wherein the at least one of the one or more structural components includes at least one structural component comprising substantially the HfO 2 —TiO 2 material with one of: an amorphous glass-based structure, and a polycrystalline-based structure.
4. The device of claim 1 , wherein the at least one of the one or more structural components comprising substantially the HfO 2 —TiO 2 material includes at least one structural component comprising substantially a HfO 2 —TiO 2 material with near-zero thermal expansion.
5. The device of claim 1 , wherein the HfO 2 —TiO 2 material comprises 63HfO 2 -37TiO 2 material.
6. The device of claim 1 , wherein the hemispherical resonator gyroscope has a ring down time, representative of amplitude decay when the hemispherical resonator gyroscope is allowed to freely oscillate, of at least 100 seconds.
7. The device of claim 1 , wherein the at least one of the one or more structural components comprising substantially the HfO 2 —TiO 2 material further comprises: a conductive electrode placed within the at least one of the one or more structural components so that opposite surfaces of the electrode each contact respective at least one layer of the HfO 2 —TiO 2 material.
8. A hemispherical resonator gyroscope comprising:
a hemisphere comprising one or more structural components with at least one of the one or more structural components comprising substantially HfO 2 —TiO 2 material;
a forcer electrode configured to apply an electrical force on the hemisphere to cause the hemisphere to oscillate;
and one or more sensor electrodes disposed in proximity to the hemisphere and configured to sense an orientation of a vibration pattern of the hemispherical resonator gyroscope.
9. The hemispherical resonator gyroscope of claim 8 , wherein the at least one of the one or more structural components of the hemisphere comprising substantially the HfO 2 —TiO 2 material includes a portion comprising entirely HfO 2 —TiO 2 material such that the portion independently provides structural integrity to the at least one of the one or more structural components.
10. The hemispherical resonator gyroscope of claim 8 , wherein the at least one of the one or more components comprising substantially HfO 2 —TiO 2 material includes a hemispherical shell comprising substantially HfO 2 —TiO 2 material.
11. The hemispherical resonator gyroscope of claim 8 , wherein the at least one of the one or more structural components of the hemisphere comprises substantially 63HfO 2 -37TiO 2 material.
12. The hemispherical resonator gyroscope of claim 8 , wherein the hemisphere comprising the at least one of the one or more structural components comprising substantially the HfO 2 —TiO 2 material results, at least in part, in a ring down time for the hemispherical resonator gyroscope, representative of amplitude decay when the hemispherical resonator gyroscope is allowed to freely oscillate without application of electrical force from the forcer electrode, of at least 100 seconds.
13. The hemispherical resonator gyroscope of claim 8 , wherein the at least one of the one or more components of the hemisphere comprises substantially HfO 2 —TiO 2 material with near-zero thermal expansion.
14. The hemispherical resonator gyroscope of claim 8 , wherein the at least one of the one or more structural components comprising substantially the HfO 2 —TiO 2 material further comprises:
a conductive electrode layer placed within the at least one of the one or more structural components so that opposite surfaces of the electrode layer each contact respective at least one layer of the HfO 2 —TiO 2 material.
15. The hemispherical resonator gyroscope of claim 8 , wherein the one or more structural components further comprise: a plurality of masses positioned around a rim of the hemisphere.
16. The hemispherical resonator gyroscope of claim 15 , wherein each of the plurality of masses has a substantially identical weight.
17. The hemispherical resonator gyroscope of claim 15 , wherein:
the plurality of masses have different weights;
heavier masses are positioned at points of maximum deflection of the hemispherical resonator gyroscope;
and lighter masses are positioned between the points of maximum deflection.