LIGHT-EMITTING DEVICE INSPECTING APPARATUS AND METHOD

1 . A light-emitting device inspecting apparatus for inspecting a characteristic of a light-emitting device comprising one or more light-emission cells that emit light, the light-emitting device inspecting apparatus comprising:

a probing unit comprising a table on which the light-emitting device is mounted and probes that supply a current to the light-emitting device;

an image obtaining unit for obtaining an image of the light-emitting device; and

a determination unit for determining open/short defects of the light-emitting device by detecting light-emission of the one or more light-emission cells from brightness information of the image.

2 . The light-emitting device inspecting apparatus of claim 1 , further comprising a measuring unit comprising an integrating sphere that is positioned above the table and collects light emitted from the light-emitting device, and a detector that detects an optical characteristic of the light-emitting device,

wherein the measuring unit determines a defect of the optical characteristic of the light-emitting device based on the detected optical characteristic.

3 . The light-emitting device inspecting apparatus of claim 2 , wherein the determination unit divides the light-emitting device into a plurality of groups based on a result of the determination on the open/short defects, and the detected optical characteristic.

4 . The light-emitting device inspecting apparatus of claim 2 , wherein a light window is arranged at the integrating sphere, and

wherein the image obtaining unit obtains the image of the light-emitting device via the light window.

5 . The light-emitting device inspecting apparatus of claim 4 , wherein the determination unit comprises an image processing unit for generating an inspection image for an outward appearance inspection from the image, and

wherein the determination unit determines a defect of an outward appearance of the light-emitting device by comparing the inspection image with a pre-set reference image.

6 . The light-emitting device inspecting apparatus of claim 4 , wherein the image obtaining unit comprises:

an imaging device; and

a lens for focusing light on the imaging device after the light has passed through the light window.

7 . The light-emitting device inspecting apparatus of claim 6 , wherein the image obtaining unit comprises a light amount adjuster that is positioned ahead of the lens and adjusts the amount of light that has passed through the light window.

8 . The light-emitting device inspecting apparatus of claim 1 , wherein the light-emitting device comprises a multi-light emission chip in which a plurality of light-emission cells are arrayed.

9 . The light-emitting device inspecting apparatus of claim 1 , wherein the light-emitting device comprises a light-emitting diode (LED) package formed by packaging a plurality of LED chips.

10 . The light-emitting device inspecting apparatus of claim 1 , wherein the light-emitting device comprises a LED package formed by packaging one or more multi-light emission chips in which a plurality of light-emission cells are arrayed.

11 . A method of inspecting a characteristic of a light-emitting device comprising one or more light-emission cells that emit light, the method comprising:

supplying a current to the light-emitting device;

obtaining an image of the light-emitting device; and

determining open/short defects of the light-emitting device by detecting light-emission of the one or more light-emission cells from brightness information of the image.

12 . The method of claim 11 , further comprising:

collecting light emitted from the light-emitting device by using an integrating sphere, and detecting an optical characteristic of the light-emitting device from the collected light; and

determining a defect of the optical characteristic of the light-emitting device based on the detected optical characteristic.

13 . The method of claim 12 , further comprising dividing the light-emitting device into a plurality of groups based on a result of the determination on the open/short defects, and the detected optical characteristic.

14 . The method of claim 12 , wherein the obtaining of the image comprises obtaining the image of the light-emitting device via a light window arranged at the integrating sphere.

15 . The method of claim 14 , further comprising:

generating an inspection image for an outward appearance inspection from the image, and

determining a defect of an outward appearance of the light-emitting device by comparing the inspection image with a pre-set reference image.

16 . The method of claim 11 , wherein the light-emitting device comprises a multi-light emission chip in which a plurality of light-emission cells are arrayed.

17 . The method of claim 11 , wherein the light-emitting device comprises a light-emitting diode (LED) package formed by packaging a plurality of LED chips.

18 . The method of claim 11 , wherein the light-emitting device comprises a LED package formed by packaging one or more multi-light emission chips in which a plurality of light-emission cells are arrayed.