Semiconductor memory device
According to one embodiment, a semiconductor memory device includes units each including memory cells, a data bus connected to each of the units and having data lines, holding circuits configured to hold fail information supplied from the unit through the data bus as a verify result after writing data, and provided in association with the data lines, respectively, daisy chain circuits configured to shift a flag includes a logical sum of the fail information held in the holding circuits, and provided in association with the data lines, respectively, and a search circuit configured to search for fail bits in the units based on the flag.
1. A semiconductor memory device comprising:
units each including memory cells;
a data bus connected to each of the units and having data lines;
holding circuits configured to hold fail information supplied from the unit through the data bus as a verify result after writing data, and provided in association with the data lines, respectively;
daisy chain circuits configured to shift a flag comprising a logical sum of the fail information held in the holding circuits, and provided in association with the data lines, respectively; and
a search circuit configured to search for fail bits in the units based on the flag.
2. The device of claim 1 , further comprising a determination circuit configured to count the number of fail bits in the units based on a search result of the search circuit.
3. The device of claim 1 , wherein the search circuit generates a reset signal for resetting a holding circuit which has been through the search in holding circuits which hold the fail information.
4. The device of claim 3 , further comprising:
a determination circuit configured to count the number of times of the reset signal,
wherein a count value of the determination circuit corresponds to the number of fail bits in the units.
5. The device of claim 1 , wherein a first daisy chain circuit activates the flag when a holding circuit associated with the first daisy chain circuit holds the fail information or when a second daisy chain circuit preceding the first daisy chain circuit holds the fail information.
6. The device of claim 1 , wherein the search circuit terminates the search when the fail information is no longer present in the units or when the number of fail bits in the units exceeds an allowable bit number.
7. The device of claim 1 , further comprising:
a bypass connected in parallel to each of the units,
wherein the flag bypasses the daisy chain circuits when the unit has no fail bit.
8. The device of claim 1 , wherein
the units are divided into first units and second units to be managed, and
the search circuit searches for fail bits in the first units and fail bits in the second units.
9. The device of claim 8 , further comprising: a determination circuit configured to count the number of fail bits in the first and second units based on a search result of the search circuit.
10. The device of claim 8 , wherein the search circuit generates a reset signal for resetting a holding circuit which has been through the search in holding circuits holding the fail information.
11. The device of claim 10 , wherein the search circuit interleaves a first reset signal of the first units and a second reset signal of the second units.
12. The device of claim 1 , wherein
the unit comprises sense amplifiers, and
the sense amplifiers are connected to the data lines, respectively and verify written data after writing the data.
13. The device of claim 12 , wherein each of the sense amplifiers detects whether a memory cell is a fail bit.
14. The device of claim 1 , wherein the unit is a NAND flash memory.