Integrated circuit allowing to test a power management unit based on or more conditions and configuring the plurality of pins to operate in normal and test mode

1. An integrated circuit that is included in a host electronic device, comprising:

a processor portion that includes:

a test mode input module configured to receive a test mode instruction signal from off-chip; and

an I/O module having a plurality of pins, configured to communicate with off-chip components; and

a power management portion configured to manage a power of the electronic device, the power management portion including:

a test module configured to set a test mode within the power management portion based on the test mode instruction signal received by the test mode input module,

wherein the test module is configured to output test result signals via the I/O module, and

wherein the plurality of pins provide a communication channel between the processor portion and the off-chip components during a normal mode of operation, and provide a communication channel between the power management portion and the off-chip components after the test mode has been set by the test module.

2. The integrated circuit of claim 1 , wherein the test mode instruction signal is a Joint Test Action Group (JTAG) signal.

3. The integrated circuit of claim 1 , wherein the plurality of pins of the I/O module are General Purpose Input/Output (GPIO) pins.

4. The integrated circuit of claim 3 , wherein the power management portion configures the plurality of GPIO pins based on the set test mode.

5. An integrated circuit that is included in a host electronic device, comprising:

a power management portion configured to manage a power of the electronic device;

a processor portion; and

an isolation control module configured to control an electrical isolation between the power management portion and the processor portion by restricting whether signals can be received by the power management module from the processor portion based on one or more conditions,

wherein the one or more conditions include whether a power start-up sequence is complete and whether the processor portion is receiving sufficient power.

6. The integrated circuit of claim 5 , wherein the processor portion is a Baseband Processor.

7. The integrated circuit of claim 5 , wherein the isolation control module includes a plurality of isolation gates that open or close based on the one or more conditions.

8. The integrated circuit of claim 5 , wherein the power management portion includes a voltage detector module configured to detect a supply voltage supplied to the processor portion.

9. The integrated circuit of claim 8 , wherein the isolation control module controls the electrical isolation of the power management portion from the processor portion based on the supply voltage detected by the voltage detector module.

10. The integrated circuit of claim 8 , wherein the isolation control module isolates the power management portion from the processor portion when the supply voltage detected by the voltage detector module is below a predetermined threshold, and

wherein the isolation control module permits communication between the power management portion and the processor portion when the supply voltage detected by the voltage detector module is above the predetermined threshold.

11. The integrated circuit of claim 8 , wherein the processor portion includes a test mode input module configured to receive a test mode signal for input to the integrated circuit.

12. The integrated circuit of claim 11 , wherein the test mode signal is a Joint Test Action Group (JTAG) signal.

13. The integrated circuit of claim 11 , wherein the isolation control module isolates the power management module from the test mode signal based on whether a power start-up sequence is complete, whether the supply voltage detected by the voltage detection module exceeds a predetermined threshold, and whether the test mode input module is receiving the test mode signal.

14. The integrated circuit of claim 11 , wherein the power management portion includes a test module configured to receive the test mode signal from the test mode input module and to set a test mode based on the received test mode signal.

15. The integrated circuit of claim 11 , wherein the processor portion includes an I/O module, and wherein the power management portion outputs test result signals via the I/O module.

16. The integrated circuit of claim 15 , wherein the I/O module includes a plurality of General Purposes Input/Ouput (GPIO) pins.

17. The integrated circuit of claim 16 , wherein the power management portion configures the plurality of GPIO pins based on the received test mode signal.

18. The integrated circuit of claim 11 , wherein the isolation control module isolates the power management module from the test mode signal based on whether the supply voltage detected by the voltage detection module exceeds a predetermined threshold and whether the test mode input module is receiving the test mode signal, and regardless of whether a power start-up sequence is complete.

19. The integrated circuit of claim 1 , further comprising an isolation control module that defines an electrical boundary between the processor portion and the power management portion, the isolation control module configured to restrict access to the I/O module by the power management portion during the normal mode of operation, and to permit access to the I/O module by the power management portion after the test mode has been set provided that at least one condition has been met.

20. The integrated circuit of claim 19 , wherein the isolation control module is further configured to prevent the test mode instruction signal received by the test mode input module to be received by the test module until the at least one condition has been met.